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SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

Journal of physical chemistry. C, 2016-11, Vol.120 (46), p.26328-26335

2016

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Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions

Journal of the American Society for Mass Spectrometry, 2019-02, Vol.30 (2), p.309-320

2019

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Sampling Depths, Depth Shifts, and Depth Resolutions for Bi n + Ion Analysis in Argon Gas Cluster Depth Profiles

The journal of physical chemistry. B, 2016-03, Vol.120 (9), p.2604-2611

2016

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SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Journal of the American Society for Mass Spectrometry, 2018-04, Vol.29 (4), p.774-785

2018

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Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions

The journal of physical chemistry. B, 2015-10, Vol.119 (42), p.13433-13439

2015

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Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Analyst (London), 2015-10, Vol.14 (19), p.658-6516

2015

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Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

The journal of physical chemistry. B, 2015-08, Vol.119 (33), p.10784-10797

2015

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Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Surface and interface analysis, 2014-11, Vol.46 (S1), p.54-57

2014

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Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing

Analytical chemistry (Washington), 2013-05, Vol.85 (10), p.5064-5070

2013

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G-SIMS analysis of organic solar cell materials

Surface and interface analysis, 2014-11, Vol.46 (S1), p.96-99

2014

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Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Analytical chemistry (Washington), 2016-04, Vol.88 (7), p.3592-3597

2016

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Inorganic material profiling using Arn+ cluster: Can we achieve high quality profiles?

Applied surface science, 2018-06, Vol.444, p.633-641

2018

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The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning

Nanotechnology, 2009-03, Vol.20 (12), p.125605

2009

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Fundamental aspects of Ar n + SIMS profiling of common organic semiconductors

Surface and interface analysis, 2014-11, Vol.46 (S1), p.54-57

2014

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Determination of the sputtering yield of cholesterol using Ar n + and C 60 +(+) cluster ions

Analyst (London), 2016, Vol.141 (16), p.4893-4901

2016

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SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Journal of the American Society for Mass Spectrometry, 2018-04, Vol.29 (4), p.774

2018

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Determination of the sputtering yield of cholesterol using Arn+ and C60+(+) cluster ions

Analyst (London), 2016-08, Vol.141 (16), p.4893-491

2016

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Fundamental aspects of Ar sub(n) super(+) SIMS profiling of common organic semiconductors

Surface and interface analysis, 2014-11, Vol.46 (S1), p.54-57

2014

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Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

The journal of physical chemistry. B, 2016-03, Vol.120 (9), p.2604-2611

2016

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Improving Secondary Ion Mass Spectrometry C 60 n + Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Analytical chemistry (Washington), 2013-05, Vol.85 (10), p.5064-5070

2013

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Improving Secondary Ion Mass Spectrometry C^sub 60^^sup n+^ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Analytical chemistry (Washington), 2013-05, Vol.85 (10), p.5064

2013

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Improving Secondary Ion Mass Spectrometry C60 n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Analytical chemistry (Washington), 2013-05, Vol.85 (10), p.5064-5070

2013

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NAMPT-dependent NAD + biosynthesis controls circadian metabolism in a tissue-specific manner

Proceedings of the National Academy of Sciences - PNAS, 2023-04, Vol.120 (14), p.e2220102120-e2220102120

2023

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Moving Fast with Software Verification

NASA Formal Methods, 2015, p.3-11

2015

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Improved monitoring of subglacial lake activity in Greenland

The cryosphere, 2024-02, Vol.18 (2), p.505-523

2024

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SIMS of Delta Layers in Organic Materials: Amount of Substance, Secondary Ion Species, Matrix Effects, and Anomalous Structures in Argon Gas Cluster Depth Profiles

Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi n + Ion Analysis in Argon Gas Cluster Depth Profiles

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing

G-SIMS analysis of organic solar cell materials

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources

Inorganic material profiling using Arn+ cluster: Can we achieve high quality profiles?

The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning

Fundamental aspects of Ar n + SIMS profiling of common organic semiconductors

Determination of the sputtering yield of cholesterol using Ar n + and C 60 +(+) cluster ions

SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Determination of the sputtering yield of cholesterol using Arn+ and C60+(+) cluster ions

Fundamental aspects of Ar sub(n) super(+) SIMS profiling of common organic semiconductors

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

Improving Secondary Ion Mass Spectrometry C 60 n + Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Improving Secondary Ion Mass Spectrometry C^sub 60^^sup n+^ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

Improving Secondary Ion Mass Spectrometry C60 n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing

NAMPT-dependent NAD + biosynthesis controls circadian metabolism in a tissue-specific manner

Moving Fast with Software Verification

Improved monitoring of subglacial lake activity in Greenland

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