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Process chains for high-precision components with micro-scale features

CIRP annals, 2016, Vol.65 (2), p.549-572

2016

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Temperature-dependent optical material properties of polymer powders regarding in-situ measurement techniques in additive manufacturing

Polymer testing, 2018-10, Vol.71, p.378-383

2018

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Detecting surface roughness on SLS parts with various measuring techniques

Polymer testing, 2016-08, Vol.53, p.217-226

2016

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Measuring procedures for surface evaluation of additively manufactured powder bed-based polymer and metal parts

Measurement science & technology, 2020-09, Vol.31 (9), p.95202

2020

Volltextzugriff (PDF)

Nanopositioning and nanomeasuring machine NPMM-200-a new powerful tool for large-range micro- and nanotechnology

Surface topography metrology and properties, 2016-07, Vol.4 (3), p.34004

2016

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Joining suitability of cast aluminium for self-piercing riveting

IOP conference series. Materials Science and Engineering, 2021-06, Vol.1157 (1), p.12005

2021

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New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes

Measurement science & technology, 2007-02, Vol.18 (2), p.520-527

2007

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Interference signal demodulation for nanopositioning and nanomeasuring machines

Measurement science & technology, 2012-07, Vol.23 (7), p.74004-1-8

2012

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Advanced three-dimensional scan methods in the nanopositioning and nanomeasuring machine

Measurement science & technology, 2009-08, Vol.20 (8), p.084004

2009

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Qualification concept for optical multi-scale multi-sensor systems

Journal of sensors and sensor systems, 2016-01, Vol.5 (1), p.1-8

2016

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Novel control scheme for a high-speed metrological scanning probe microscope

Measurement science & technology, 2011-09, Vol.22 (9), p.94012-1-7

2011

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The Parallel Bayesian Toolbox for High-performance Bayesian Filtering in Metrology

Measurement science review, 2013-12, Vol.13 (6), p.315-321

2013

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Micro- and nanocoordinate measurements of micro-parts with 3-D tunnelling current probing

Journal of sensors and sensor systems, 2015-06, Vol.4 (1), p.199-208

2015

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Nanomeasuring and nanopositioning engineering

Measurement : journal of the International Measurement Confederation, 2010-11, Vol.43 (9), p.1099-1105

2010

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Measuring value correction and uncertainty analysis for homodyne interferometers

Measurement science & technology, 2011-09, Vol.22 (9), p.94028-1-6

2011

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A framework for using optical sensors in nanomeasuring machines over I++ DME

Measurement science & technology, 2012-07, Vol.23 (7), p.74013-1-8

2012

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Investigations and calculations into decreasing the uncertainty of a nanopositioning and nanomeasuring machine (NPM-Machine)

Measurement science & technology, 2007-02, Vol.18 (2), p.482-486

2007

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Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners

Journal of sensors and sensor systems, 2023-01, Vol.12 (1), p.1-8

2023

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Referencing of powder bed for in situ detection of lateral layer displacements in additive manufacturing

Journal of sensors and sensor systems, 2021-09, Vol.10 (2), p.247-259

2021

Volltextzugriff (PDF)

Bayes filter for dynamic coordinate measurements – Accuracy improvment, data fusion and measurement uncertainty evaluation

Measurement : journal of the International Measurement Confederation, 2013-11, Vol.46 (9), p.3737-3744

2013

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Methods and procedure of referenced in situ control of lateral contour displacements in additive manufacturing

Journal of sensors and sensor systems, 2021-08, Vol.10 (2), p.219-232

2021

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Determination of the single point precision associated with tactile gear measurements in scanning mode

Journal of sensors and sensor systems, 2020-02, Vol.9 (1), p.61-70

2020

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Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system

Journal of sensors and sensor systems, 2021-07, Vol.10 (2), p.171-177

2021

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Towards efficient application-dependent dimensional measurements with computed tomography: optimized reduction of measurement duration using continuous scan mode: experimental investigations

Journal of sensors and sensor systems, 2022-08, Vol.11 (2), p.219-223

2022

Volltextzugriff (PDF)

Nanometrology - Nanopositioning- and Nanomeasuring Machine with integrated Nanoprobes

Materials science forum, 2006-01, Vol.505-507, p.7-12

2006

Volltextzugriff (PDF)

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Process chains for high-precision components with micro-scale features

Temperature-dependent optical material properties of polymer powders regarding in-situ measurement techniques in additive manufacturing

Detecting surface roughness on SLS parts with various measuring techniques

Measuring procedures for surface evaluation of additively manufactured powder bed-based polymer and metal parts

Nanopositioning and nanomeasuring machine NPMM-200-a new powerful tool for large-range micro- and nanotechnology

Joining suitability of cast aluminium for self-piercing riveting

New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes

Interference signal demodulation for nanopositioning and nanomeasuring machines

Advanced three-dimensional scan methods in the nanopositioning and nanomeasuring machine

Qualification concept for optical multi-scale multi-sensor systems

Novel control scheme for a high-speed metrological scanning probe microscope

The Parallel Bayesian Toolbox for High-performance Bayesian Filtering in Metrology

Micro- and nanocoordinate measurements of micro-parts with 3-D tunnelling current probing

Nanomeasuring and nanopositioning engineering

Measuring value correction and uncertainty analysis for homodyne interferometers

A framework for using optical sensors in nanomeasuring machines over I++ DME

Investigations and calculations into decreasing the uncertainty of a nanopositioning and nanomeasuring machine (NPM-Machine)

Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners

Referencing of powder bed for in situ detection of lateral layer displacements in additive manufacturing

Bayes filter for dynamic coordinate measurements – Accuracy improvment, data fusion and measurement uncertainty evaluation

Methods and procedure of referenced in situ control of lateral contour displacements in additive manufacturing

Determination of the single point precision associated with tactile gear measurements in scanning mode

Investigation of a metrological atomic force microscope system with a combined cantilever position, bending and torsion detection system

Towards efficient application-dependent dimensional measurements with computed tomography: optimized reduction of measurement duration using continuous scan mode: experimental investigations

Nanometrology - Nanopositioning- and Nanomeasuring Machine with integrated Nanoprobes

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