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Finite temperature effects on the structural stability of Si-doped HfO2 using first-principles calculations

Applied physics letters, 2023-06, Vol.122 (26)

2023

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Reduction of cycle-to-cycle variability in ReRAM by filamentary refresh

2017 Symposium on VLSI Technology, 2017, p.T90-T91

2017

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Degradation of Atomic Surface Flatness of SiO[sub 2] Thermally Grown on a Si Terrace

Journal of the Electrochemical Society, 2009, Vol.156 (12), p.G201

2009

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Roughness increase on surface and interface of SiO2 grown on atomically flat Si (111) terrace

Journal of physics. Conference series, 2009-11, Vol.191 (1), p.012031

2009

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Reliability control of silicon dioxide films by radical and thermal oxidation

Journal of physics. Conference series, 2009-11, Vol.191 (1), p.012032

2009

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Observation of leakage sites in a hafnium silicon oxynitride gate dielectric of a metal-oxide-semiconductor field-effect transistor device by electron-beam-induced current

Applied physics letters, 2006-11, Vol.89 (22)

2006

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Evaluation of two-dimensional distribution of dielectric degradation in stressed SiO2 film by etch-rate difference

Journal of physics. Conference series, 2008, Vol.106 (1), p.012017

2008

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Suppression of inflammatory responses after onset of collagen-induced arthritis in mice by oral administration of the Citrus flavanone naringin

Immunopharmacology and immunotoxicology, 2011-12, Vol.33 (4), p.723-729

2011

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Conducting-AFM spectroscopy on ultrathin SiO2 films

Applied physics. A, Materials science & processing, 2001-04, Vol.72 (S2), p.S223-S226

2001

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A Citrus Flavonoid Hesperidin Suppresses Infection-Induced Endotoxin Shock in Mice

Biological and Pharmaceutical Bulletin, 2004, Vol.27(5), pp.679-683

2004

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Electric properties of nanoscale contacts on Si(111) surfaces

Applied surface science, 1998-06, Vol.130, p.84-89

1998

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Two-Dimensional Roughness Growth at Surface and Interface of SiO2 Films during Thermal Oxidation of 4H-SiC(0001)

Materials science forum, 2012-05, Vol.717-720, p.785-788

2012

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Layer-by-layer atomic manipulation on Si(111)-7×7 surface

Applied physics letters, 1996-06, Vol.68 (24), p.3482-3484

1996

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Indentation effects on atom manipulation on Si(111) surfaces investigated by STM

Applied physics. A, Materials science & processing, 1998-03, Vol.66 (7), p.S689-S693

1998

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Continuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz

2012 Symposium on VLSI Technology (VLSIT), 2012, p.143-144

2012

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Suppression of infection-induced endotoxin shock in mice by a Citrus flavanone naringin

Planta medica, 2004, Vol.70 (1), p.17-22

2004

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Development of a novel system for characterizing MOSFET noise in higher frequency regimes

2012 IEEE International Conference on Microelectronic Test Structures, 2012, p.169-172

2012

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2-D Roughening of SiO2 Thermally Grown on Atomically Flat Si Surface

ECS transactions, 2009, Vol.19 (2), p.427-442

2009

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Difference in clearance of exogenously administered smooth-form LPS following host responses among normal, sensitized and LPS-tolerant mice

Journal of endotoxin research, 1997-12, Vol.4 (6), p.415-423

1997

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Selective Growth of Ag Nanowires on Si(111) Surfaces by Electroless Deposition

The journal of physical chemistry. B, 2005-07, Vol.109 (26), p.12655-12657

2005

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(Invited) Degradation in HfSiON Film Induced by Electrical Stress Application

ECS transactions, 2010, Vol.28 (2), p.263-272

2010

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Current transport through a single Si atom junction on Si(111)-7×7 surfaces

Surface science, 1999-08, Vol.433, p.17-21

1999

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(Invited) An Electron-Beam-Induced Current Investigation of Electrical Defects in High-k Gate Stacks

ECS transactions, 2010, Vol.28 (2), p.299-313

2010

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Limitation of Polymyxin B on Suppression of Endotoxin Shock Induced by Salmonella Infection in Mice

Biological and Pharmaceutical Bulletin, 2004, Vol.27(11), pp.1840-1843

2004

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Mycobacterial cord factor, but not sulfolipid, causes depletion of NKT cells and upregulation of CD1d1 on murine macrophages

Microbes and infection, 2001-07, Vol.3 (8), p.611-619

2001

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Finite temperature effects on the structural stability of Si-doped HfO2 using first-principles calculations

Reduction of cycle-to-cycle variability in ReRAM by filamentary refresh

Degradation of Atomic Surface Flatness of SiO[sub 2] Thermally Grown on a Si Terrace

Roughness increase on surface and interface of SiO2 grown on atomically flat Si (111) terrace

Reliability control of silicon dioxide films by radical and thermal oxidation

Observation of leakage sites in a hafnium silicon oxynitride gate dielectric of a metal-oxide-semiconductor field-effect transistor device by electron-beam-induced current

Evaluation of two-dimensional distribution of dielectric degradation in stressed SiO2 film by etch-rate difference

Suppression of inflammatory responses after onset of collagen-induced arthritis in mice by oral administration of the Citrus flavanone naringin

Conducting-AFM spectroscopy on ultrathin SiO2 films

A Citrus Flavonoid Hesperidin Suppresses Infection-Induced Endotoxin Shock in Mice

Electric properties of nanoscale contacts on Si(111) surfaces

Two-Dimensional Roughness Growth at Surface and Interface of SiO2 Films during Thermal Oxidation of 4H-SiC(0001)

Layer-by-layer atomic manipulation on Si(111)-7×7 surface

Indentation effects on atom manipulation on Si(111) surfaces investigated by STM

Continuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz

Suppression of infection-induced endotoxin shock in mice by a Citrus flavanone naringin

Development of a novel system for characterizing MOSFET noise in higher frequency regimes

2-D Roughening of SiO2 Thermally Grown on Atomically Flat Si Surface

Difference in clearance of exogenously administered smooth-form LPS following host responses among normal, sensitized and LPS-tolerant mice

Selective Growth of Ag Nanowires on Si(111) Surfaces by Electroless Deposition

(Invited) Degradation in HfSiON Film Induced by Electrical Stress Application

Current transport through a single Si atom junction on Si(111)-7×7 surfaces

(Invited) An Electron-Beam-Induced Current Investigation of Electrical Defects in High-k Gate Stacks

Limitation of Polymyxin B on Suppression of Endotoxin Shock Induced by Salmonella Infection in Mice

Mycobacterial cord factor, but not sulfolipid, causes depletion of NKT cells and upregulation of CD1d1 on murine macrophages

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