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Fast ADMM-based approach for high-resolution ISAR imaging

Electronics letters, 2020-09, Vol.56 (18), p.954-957

Hashempour, H.R

2020

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UAV PHOTOGRAMMETRY: A PRACTICAL SOLUTION FOR CHALLENGING MAPPING PROJECTS

International archives of the photogrammetry, remote sensing and spatial information sciences., 2015, Vol.XL-1/W5 (1), p.619-623

2015

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Recycling preparative high performance liquid chromatography for the separation of curcumin from curcuminoids in curcuma longa L

Acta chromatographica, 2015-06, Vol.27 (2), p.387-398

2015

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Application of arithmetic coding to compression of VLSI test data

IEEE transactions on computers, 2005-09, Vol.54 (9), p.1166-1177

2005

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Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets

IEEE transactions on instrumentation and measurement, 2008-09, Vol.57 (9), p.1998-2004

2008

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Multidimensional liquid chromatography for separation of cyclotides in Viola ignobilis

Acta chromatographica, 2011-12, Vol.23 (4), p.641-651

2011

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Defect-oriented cell-internal testing

2010 IEEE International Test Conference, 2010, p.1-10

2010

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Analysis and measurement of fault coverage in a combined ATE and BIST environment

IEEE transactions on instrumentation and measurement, 2004-04, Vol.53 (2), p.300-307

2004

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An Integrated Environment for Design Verification of ATE Systems

IEEE transactions on instrumentation and measurement, 2007-10, Vol.56 (5), p.1734-1743

2007

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Analysis and evaluation of multisite testing for VLSI

IEEE transactions on instrumentation and measurement, 2005-10, Vol.54 (5), p.1770-1778

2005

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Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data

IEEE transactions on instrumentation and measurement, 2005-10, Vol.54 (5), p.1761-1769

2005

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Compression of VLSI test data by arithmetic coding

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.150-157

2004

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Device Model for Ballistic CNFETs Using the First Conducting Band

IEEE design & test of computers, 2008-03, Vol.25 (2), p.178-186

2008

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ATE-amenable test data compression with no cyclic scan registers

Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, 2003, p.151-158

2003

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Diterpenoids from Astrodaucus orientalis (L.) Drude - Antiprotozoal activity

Planta Medica International Open, 2017, Vol.4 (S 01)

2017

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Evaluation of Error-Resilience for Reliable Compression of Test Data

Design, Automation and Test in Europe, 2005, p.1284-1289

2005

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Error-resilient test data compression using Tunstall codes

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings, 2004, p.316-323

2004

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A test-vector generation methodology for crosstalk noise faults

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings, 2002, p.40-47

2002

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Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs

2009 International Test Conference, 2009, p.1-10

2009

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Test time reduction in a manufacturing environment by combining BIST and ATE

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings, 2002, p.186-194

2002

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Defect Oriented Testing for analog/mixed-signal devices

2011 IEEE International Test Conference, 2011, p.1-10

2011

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Hybrid multisite testing at manufacturing

International Test Conference, 2003. Proceedings. ITC 2003, 2003, Vol.1, p.927-936

2003

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A Novel Methodology for Functional Test Data Compression

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006, p.128-135

2006

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A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011, p.139-145

2011

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Circuit-Level Modeling and Detection of Metallic Carbon Nanotube Defects in Carbon Nanotube FETs

2007 Design, Automation & Test in Europe Conference & Exhibition, 2007, p.1-6

2007

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Fast ADMM-based approach for high-resolution ISAR imaging

UAV PHOTOGRAMMETRY: A PRACTICAL SOLUTION FOR CHALLENGING MAPPING PROJECTS

Recycling preparative high performance liquid chromatography for the separation of curcumin from curcuminoids in curcuma longa L

Application of arithmetic coding to compression of VLSI test data

Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets

Multidimensional liquid chromatography for separation of cyclotides in Viola ignobilis

Defect-oriented cell-internal testing

Analysis and measurement of fault coverage in a combined ATE and BIST environment

An Integrated Environment for Design Verification of ATE Systems

Analysis and evaluation of multisite testing for VLSI

Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data

Compression of VLSI test data by arithmetic coding

Device Model for Ballistic CNFETs Using the First Conducting Band

ATE-amenable test data compression with no cyclic scan registers

Diterpenoids from Astrodaucus orientalis (L.) Drude - Antiprotozoal activity

Evaluation of Error-Resilience for Reliable Compression of Test Data

Error-resilient test data compression using Tunstall codes

A test-vector generation methodology for crosstalk noise faults

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs

Test time reduction in a manufacturing environment by combining BIST and ATE

Defect Oriented Testing for analog/mixed-signal devices

Hybrid multisite testing at manufacturing

A Novel Methodology for Functional Test Data Compression

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices

Circuit-Level Modeling and Detection of Metallic Carbon Nanotube Defects in Carbon Nanotube FETs

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