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European psychiatry, 2023-03, Vol.66 (S1), p.S746-S746
2023
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European psychiatry, 2022-06, Vol.65 (S1), p.S419-S419
2022
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European psychiatry, 2021-04, Vol.64 (S1), p.S217-S218
2021
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European psychiatry, 2021-04, Vol.64 (S1), p.S86-S87
2021
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IEEE access, 2020, Vol.8, p.137263-137274
2020
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Journal of electronic testing, 2021-08, Vol.37 (4), p.427-437
2021
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Neuropsychiatrie de l'enfance et de l'adolescence, 2022-09, Vol.70 (5), p.244-255
2022
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IEEE transactions on computers, 2006-12, Vol.55 (12), p.1630-1639
2006
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IEEE transactions on very large scale integration (VLSI) systems, 2008-06, Vol.16 (6), p.725-732
2008
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IEEE transactions on computer-aided design of integrated circuits and systems, 2005-06, Vol.24 (6), p.892-904
2005
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IEEE transactions on computer-aided design of integrated circuits and systems, 2004-05, Vol.23 (5), p.737-757
2004
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IEEE transactions on emerging topics in computing, 2019-07, Vol.7 (3), p.493-506
2019
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Proceedings - Asian Test Symposium, 2000, p.131-138
2000
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2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, Vol.126, p.1877-1880
2021
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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002), 2002, p.95-100
2002
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International journal of circuit theory and applications, 2018-01, Vol.46 (1), p.4-28
2018
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2022 IEEE European Test Symposium (ETS), 2022, p.1-2
2022
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2022 IEEE 23rd Latin American Test Symposium (LATS), 2022, p.1-6
2022
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113385, Article 113385
2019
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IEEE transactions on computers, 2002-05, Vol.51 (5), p.460-473
2002
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2021 IEEE 22nd Latin American Test Symposium (LATS), 2021, p.1-6
2021
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Microelectronics and reliability, 2018-09, Vol.88-90, p.355-359
2018
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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2002, p.395-400
2002
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Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004, 2004, p.54-59
2004
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2023 IEEE International Test Conference (ITC), 2023, p.236-245
2023
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