UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 79

Sortiert nach

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Physical review letters, 2016-08, Vol.117 (7), p.076101-076101, Article 076101

2016

Link zum Volltext

Verfügbarkeit prüfen

Thermal magnetic field noise: Electron optics and decoherence

Ultramicroscopy, 2015-04, Vol.151, p.199-210

2015

Link zum Volltext

Verfügbarkeit prüfen

Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2644-2647

2022

Link zum Volltext

Verfügbarkeit prüfen

Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope

Microscopy and microanalysis, 2023-07, Vol.29 (Supplement_1), p.416-417

2023

Link zum Volltext

Verfügbarkeit prüfen

On the Benefit of Aberration Correction in Cryo Electron Microscopy

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.2156-2157

2020

Link zum Volltext

Verfügbarkeit prüfen

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.926-927

2014

Link zum Volltext

Verfügbarkeit prüfen

Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.934-935

2014

Link zum Volltext

Verfügbarkeit prüfen

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.378-379

2014

Link zum Volltext

Verfügbarkeit prüfen

A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook

Ultramicroscopy, 2015-04, Vol.151, p.31-36

2015

Link zum Volltext

Verfügbarkeit prüfen

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.878-879

2016

Link zum Volltext

Verfügbarkeit prüfen

Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.894-895

2016

Link zum Volltext

Verfügbarkeit prüfen

A spherical-aberration-corrected 200 kV transmission electron microscope

Ultramicroscopy, 1998-10, Vol.75 (1), p.53-60

1998

Link zum Volltext

Verfügbarkeit prüfen

Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.930-931

Haider, Max

2003

Link zum Volltext

Verfügbarkeit prüfen

Current and Future Developments in order to Approach a Point Resolution of d pr ~ 0.5 Å with a TEM

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.930-931

Haider, Max

2003

Link zum Volltext

Verfügbarkeit prüfen

Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.584-585

2002

Link zum Volltext

Verfügbarkeit prüfen

Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens

Microscopy and microanalysis, 2004-08, Vol.10 (S03), p.2-3

2004

Link zum Volltext

Verfügbarkeit prüfen

A spherical-aberration-corrected 200kV transmission electron microscope

Ultramicroscopy, 1998-10, Vol.75 (1), p.53-60

1998

Link zum Volltext

Verfügbarkeit prüfen

Electron Holography with Cs-corrected TEM

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.112-113

2004

Link zum Volltext

Verfügbarkeit prüfen

State of the first aberration-corrected, monochromized 200kV FEG-TEM

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.938-939

2003

Link zum Volltext

Verfügbarkeit prüfen

Electron Holography with Cs-corrected TEM

Microscopy and microanalysis, 2004-08, Vol.10 (S03), p.40-41

2004

Link zum Volltext

Verfügbarkeit prüfen

A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope

Journal of electron microscopy, 1999, Vol.48 (6), p.821-826

1999

Link zum Volltext

Verfügbarkeit prüfen

First application of a spherical‐aberration corrected transmission electron microscope in materials science

Journal of electron microscopy, 2002-03, Vol.51 (suppl-1), p.S51-S58

2002

Link zum Volltext

Verfügbarkeit prüfen

State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM

Microscopy and microanalysis, 2003-09, Vol.9 (S03), p.38-39

2003

Link zum Volltext

Verfügbarkeit prüfen

Applications of a Cs Corrected HRTEM in Materials Science

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.10-11

2002

Link zum Volltext

Verfügbarkeit prüfen

Cs Corrector for Illumination

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1004-1005

2004

Link zum Volltext

Verfügbarkeit prüfen

1 – 25 von 79

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(71)
Mit Volltextzugriff
(72)

Publikationsform

Sprache

Englisch
(78)
Japanisch
(8)

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Thermal magnetic field noise: Electron optics and decoherence

Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy

Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope

On the Benefit of Aberration Correction in Cryo Electron Microscopy

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations

A spherical-aberration-corrected 200 kV transmission electron microscope

Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM

Current and Future Developments in order to Approach a Point Resolution of d pr ~ 0.5 Å with a TEM

Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM

Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens

A spherical-aberration-corrected 200kV transmission electron microscope

Electron Holography with Cs-corrected TEM

State of the first aberration-corrected, monochromized 200kV FEG-TEM

Electron Holography with Cs-corrected TEM

A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope

First application of a spherical‐aberration corrected transmission electron microscope in materials science

State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM

Applications of a Cs Corrected HRTEM in Materials Science

Cs Corrector for Illumination

Suchergebnisse filtern