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Synthesis of Graphitic Mesoporous Carbon from Metal Impregnated Silica Template for Proton Exchange Membrane Fuel Cell Application

Fuel cells (Weinheim an der Bergstrasse, Germany), 2019-02, Vol.19 (1), p.27-34

2019

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Infrared spectroscopy of the stretching modes of SeH − and TeH − in KCl and KBr

The Journal of physics and chemistry of solids, 1995-05, Vol.56 (5), p.735-743

1995

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Power and empowerment in transdisciplinary research: a negotiated approach for peri-urban groundwater problems in the Ganges Delta

Hydrology and earth system sciences, 2022-04, Vol.26 (8), p.2201-2219

2022

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Applications of neutron activation to microelectronic materials research at the Cornell triga reactor

Journal of radioanalytical and nuclear chemistry, 1995-04, Vol.192 (1), p.65-72

1995

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The measurement of boron at silicon wafer surfaces by neutron depth profiling

Journal of applied physics, 1990-04, Vol.67 (8), p.3652-3654

1990

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Investigation of critical charge and sensitive volume of the Neutron Intercepting Silicon Chip (NISC)

2013 3rd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA), 2013, p.1-6

2013

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Impurity study of alumina and aluminum nitride ceramics: Microelectronics packaging applications

Applied radiation and isotopes, 1997, Vol.48 (1), p.5-9

1997

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Adsorption at the air/water interface from an aqueous solution of poly(vinylpyrrolidone) and sodium dodecyl sulfate

Journal of physical chemistry (1952), 1991-04, Vol.95 (8), p.3302-3305

1991

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Impurity Characterization of Si1−xGex Circuit Structures with the Use of Neutron Activation Analysis

Nuclear science and engineering, 1994-06, Vol.117 (2), p.134-139

1994

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Neutron activation analysis of aluminum in Mg2SiO4

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1994-12, Vol.353 (1-3), p.606-609

1994

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Archaeometry using the Cornell TRIGA reactor

Journal of radioanalytical and nuclear chemistry, 1995-10, Vol.196 (2), p.235-244

1995

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Multielement matrix analysis using reactor spectrum neutrons

Applied radiation and isotopes, 1995-06, Vol.46 (6), p.555-556

1995

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Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass

Journal of the Electrochemical Society, 1990-12, Vol.137 (12), p.3917-3922

1990

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Applications of AMS to electronic and silver halide imaging research

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-12, Vol.52 (3), p.502-506

1990

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Determination of boron by the neutron depth profile (NDP) technique for VLSI processing application

Journal of radioanalytical and nuclear chemistry, 1987-07, Vol.113 (2), p.379-382

1987

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1266-keV gamma branch in Si 31 decay

Physical review. C, Nuclear physics, 1993-09, Vol.48 (3), p.1434-1437

1993

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Effect of rapid thermal annealing temperature on the formation of CoSi studied by x-ray photoelectron spectroscopy and micro-Raman spectroscopy

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2000-07, Vol.18 (4), p.1690-1693

2000

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Impurity Characterization of Si 1− x Ge x Circuit Structures with the Use of Neutron Activation Analysis

Nuclear science and engineering, 1994-06, Vol.117 (2), p.134-139

1994

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MEASUREMENT OF THE 36Ar（n, p）36Cl CROSS SECTION

中国科学通报：英文版, 1990 (4), p.346-347

蒋崧生 T. K. HEMMICK P. W. KUBIK D. ELMORE H. E. GOVE S. TULLUI T. Z. HOSSAIN

1990

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Defect analysis of Cl 2 / HBr/He/O 2 etching process by imaging time-of-flight secondary ion mass spectrometry

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2000-01, Vol.18 (1), p.207-212

2000

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Neutron Depth Profiling by Coincidence Spectrometry

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1989-06, Vol.B45 (1-4), p.70-74

1989

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Depth Profiles of Nitrogen and Chlorine in Pure Materials Through AMS of the Neutron Activation Products 14C and 36Cl

Radiocarbon, 1989, Vol.31 (3), p.292-297

1989

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The endoscopy corner. Introduction of a pneumatic dilator with the help of a gastroscope in achalasia--a new, nontraumatic technic

The American journal of gastroenterology, 1977-05, Vol.67 (5), p.494-496

1977

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Neutron depth profiling by coincidence spectrometry

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-01, Vol.45 (1), p.70-74

1990

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ChemInform Abstract: Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass

ChemInform, 1991-02, Vol.22 (8), p.no-no

1991

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Synthesis of Graphitic Mesoporous Carbon from Metal Impregnated Silica Template for Proton Exchange Membrane Fuel Cell Application

Infrared spectroscopy of the stretching modes of SeH − and TeH − in KCl and KBr

Power and empowerment in transdisciplinary research: a negotiated approach for peri-urban groundwater problems in the Ganges Delta

Applications of neutron activation to microelectronic materials research at the Cornell triga reactor

The measurement of boron at silicon wafer surfaces by neutron depth profiling

Investigation of critical charge and sensitive volume of the Neutron Intercepting Silicon Chip (NISC)

Impurity study of alumina and aluminum nitride ceramics: Microelectronics packaging applications

Adsorption at the air/water interface from an aqueous solution of poly(vinylpyrrolidone) and sodium dodecyl sulfate

Impurity Characterization of Si1−xGex Circuit Structures with the Use of Neutron Activation Analysis

Neutron activation analysis of aluminum in Mg2SiO4

Archaeometry using the Cornell TRIGA reactor

Multielement matrix analysis using reactor spectrum neutrons

Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass

Applications of AMS to electronic and silver halide imaging research

Determination of boron by the neutron depth profile (NDP) technique for VLSI processing application

1266-keV gamma branch in Si 31 decay

Effect of rapid thermal annealing temperature on the formation of CoSi studied by x-ray photoelectron spectroscopy and micro-Raman spectroscopy

Impurity Characterization of Si 1− x Ge x Circuit Structures with the Use of Neutron Activation Analysis

MEASUREMENT OF THE 36Ar（n, p）36Cl CROSS SECTION

Defect analysis of Cl 2 / HBr/He/O 2 etching process by imaging time-of-flight secondary ion mass spectrometry

Neutron Depth Profiling by Coincidence Spectrometry

Depth Profiles of Nitrogen and Chlorine in Pure Materials Through AMS of the Neutron Activation Products 14C and 36Cl

The endoscopy corner. Introduction of a pneumatic dilator with the help of a gastroscope in achalasia--a new, nontraumatic technic

Neutron depth profiling by coincidence spectrometry

ChemInform Abstract: Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass

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