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Helium-ion microscopy, helium-ion irradiation and nanoindentation of Eurofer 97 and ODS Eurofer

Journal of nuclear materials, 2018-07, Vol.505, p.267-275

2018

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Ultralong‐Term High‐Density Data Storage with Atomic Defects in SiC

Advanced functional materials, 2024-07, Vol.34 (27), p.n/a

2024

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Time-of-flight secondary ion mass spectrometry in the helium ion microscope

Ultramicroscopy, 2019-03, Vol.198, p.10-17

2019

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Structural and chemical evolution of Au-silica core–shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation

Scientific reports, 2020-07, Vol.10 (1), Article 12058

2020

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Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

Ultramicroscopy, 2016-03, Vol.162, p.91-97

2016

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CMOS-compatible manufacturability of sub-15 nm Si/SiO2/Si nanopillars containing single Si nanodots for single electron transistor applications

Semiconductor science and technology, 2023-05, Vol.38 (5)

2023

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Backscattered helium spectroscopy in the helium ion microscope: Principles, resolution and applications

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-02, Vol.344, p.44-49

2015

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A high resolution ionoluminescence study of defect creation and interaction

Journal of physics. Condensed matter, 2014-04, Vol.26 (16), p.165401-165401

2014

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Influence of surface temperature and surface modifications on the initial layer growth of para-hexaphenyl on mica (0 0 1)

Surface science, 2007-05, Vol.601 (10), p.2152-2160

2007

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Oriented Sexiphenyl Single Crystal Nanoneedles on TiO2 (110)

Advanced materials (Weinheim), 2004-12, Vol.16 (23-24), p.2159-2162

2004

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Cobalt induced nanocrystals on Ge(001)

Surface science, 2012-06, Vol.606 (11-12), p.924-927

2012

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Modified energetics and growth kinetics on H-terminated GaAs (110)

The Journal of chemical physics, 2013-10, Vol.139 (16), p.164712-164712

2013

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Growth kinetics, structure, and morphology of para-quaterphenyl thin films on gold(111)

The Journal of chemical physics, 2004-08, Vol.121 (5), p.2272-2277

2004

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Coherent random lasing in the deep blue from self-assembled organic nanofibers

Journal of applied physics, 2006-02, Vol.99 (3), p.034305-034305-6

2006

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Morphology characterization and friction coefficient determination of sputtered V2O5 films

Thin solid films, 2010-12, Vol.519 (4), p.1416-1420

2010

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Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

Thin solid films, 2003-10, Vol.443 (1), p.108-114

2003

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Self-organization of Nanostructures in Inorganic and Organic Semiconductor Systems

Advanced engineering materials, 2006-11, Vol.8 (11), p.1057-1065

2006

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The influence of substrate temperature on the structure and morphology of sexiphenyl thin films on Au(111)

Applied physics. A, Materials science & processing, 2007-04, Vol.87 (1), p.103-111

2007

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Synthesis-structure relations for reactive magnetron sputtered V2O5 films

Surface & coatings technology, 2008-01, Vol.202 (8), p.1551-1555

2008

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Spontaneous rearrangement of para-sexiphenyl crystallites into nano-fibers

Applied physics. A, Materials science & processing, 2006-03, Vol.82 (4), p.665-669

2006

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Exploiting channeling in Helium Ion Microscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.806-807

2012

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Structure, Stresses and Stress Relaxation of TiN/Ag Nanocomposite Films

Journal of nanoscience and nanotechnology, 2009-06, Vol.9 (6), p.3606-3610

2009

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CMOS-compatible manufacturability of sub-15 nm Si/SiO 2 /Si nanopillars containing single Si nanodots for single electron transistor applications

Semiconductor science and technology, 2023-05, Vol.38 (5), p.55011

2023

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The epitaxial sexiphenyl (001) monolayer on TiO2(110) : A grazing incidence X-ray diffraction study

Surface science, 2006-10, Vol.600 (19), p.4645-4649

2006

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Characterization of Phospholipid Bilayers on Ti-6Al-4V and Ti-6Al-7Nb

Advanced engineering materials, 2008-10, Vol.10 (10), p.B47-B52

2008

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Helium-ion microscopy, helium-ion irradiation and nanoindentation of Eurofer 97 and ODS Eurofer

Ultralong‐Term High‐Density Data Storage with Atomic Defects in SiC

Time-of-flight secondary ion mass spectrometry in the helium ion microscope

Structural and chemical evolution of Au-silica core–shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation

Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry

CMOS-compatible manufacturability of sub-15 nm Si/SiO2/Si nanopillars containing single Si nanodots for single electron transistor applications

Backscattered helium spectroscopy in the helium ion microscope: Principles, resolution and applications

A high resolution ionoluminescence study of defect creation and interaction

Influence of surface temperature and surface modifications on the initial layer growth of para-hexaphenyl on mica (0 0 1)

Oriented Sexiphenyl Single Crystal Nanoneedles on TiO2 (110)

Cobalt induced nanocrystals on Ge(001)

Modified energetics and growth kinetics on H-terminated GaAs (110)

Growth kinetics, structure, and morphology of para-quaterphenyl thin films on gold(111)

Coherent random lasing in the deep blue from self-assembled organic nanofibers

Morphology characterization and friction coefficient determination of sputtered V2O5 films

Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

Self-organization of Nanostructures in Inorganic and Organic Semiconductor Systems

The influence of substrate temperature on the structure and morphology of sexiphenyl thin films on Au(111)

Synthesis-structure relations for reactive magnetron sputtered V2O5 films

Spontaneous rearrangement of para-sexiphenyl crystallites into nano-fibers

Exploiting channeling in Helium Ion Microscopy

Structure, Stresses and Stress Relaxation of TiN/Ag Nanocomposite Films

CMOS-compatible manufacturability of sub-15 nm Si/SiO 2 /Si nanopillars containing single Si nanodots for single electron transistor applications

The epitaxial sexiphenyl (001) monolayer on TiO2(110) : A grazing incidence X-ray diffraction study

Characterization of Phospholipid Bilayers on Ti-6Al-4V and Ti-6Al-7Nb

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