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A robust expectation‐maximization method for the interpretation of small‐angle scattering data from dense nanoparticle samples

Journal of applied crystallography, 2019-10, Vol.52 (5), p.926-936

2019

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Adaptation of the charge pumping technique to gated p-i-n diodes fabricated on silicon on insulator

IEEE transactions on electron devices, 1991-06, Vol.38 (6), p.1432-1444

1991

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Low-frequency noise in depletion-mode SIMOX MOS transistors

IEEE transactions on electron devices, 1991-02, Vol.38 (2), p.323-327

1991

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Two-dimensional modeling of locally damaged short-channel MOSFET's operating in the linear region

IEEE transactions on electron devices, 1987-02, Vol.34 (2), p.378-385

1987

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Method for extracting deep submicrometre MOSFET parameters

Electronics letters, 1995-04, Vol.31 (9), p.762-764

1995

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Pulsed Drain Current : A Highly Sensitive Technique for Interface Characterization in VLSI MOSFET's

ESSDERC '93: 23rd European solid State Device Research Conference, 1993, p.425-428

Haddara, H.

1993

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Design of Si-based micromachined slot antenna

2003 46th Midwest Symposium on Circuits and Systems, 2003, Vol.2, p.893-896 Vol. 2

2003

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Static and dynamic transconductance model for depletion-mode transistors: a new characterization method for silicon-on-insulator materials

IEEE electron device letters, 1988-01, Vol.9 (1), p.35-37

1988

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Conductance technique in MOSFETs: Study of interface trap properties in the depletion and weak inversion regimes

Solid-state electronics, 1988-08, Vol.31 (8), p.1289-1298

1988

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Test results for RR-type micromechanical gyroscope

Gyroscopy and navigation (Online), 2010-10, Vol.1 (4), p.350-358

2010

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Profiling of stress induced interface states in short channel MOSFETs using a composite charge pumping technique

Solid-state electronics, 1986-08, Vol.29 (8), p.767-772

1986

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Lattice Boltzmann simulations of the capillary pressure bump phenomenon in heterogeneous porous media

Journal of petroleum science & engineering, 2017-08, Vol.157, p.558-569

2017

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Modeling of the 1/f noise overshoot in short-channel MOSFETs locally degraded by hot-carrier injection

IEEE electron device letters, 1989-10, Vol.10 (10), p.433-436

1989

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Analysis and simulation of the frequency response of MOSFETs with uniform and/or local oxide degradation

Solid State Electronics, 1993, Vol.36 (5), p.741-748

1993

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Foreground digital calibration of non-linear errors in pipelined A/D converters

2010 IEEE International Symposium on Circuits and Systems (ISCAS), 2010, p.569-572

2010

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New full-voltage-swing multi-drain/multi-collector complementary BiCMOS buffers (M 2 CBiCMOS)

Solid-state electronics, 1995, Vol.38 (1), p.211-216

1995

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Extraction of the series resistance and the effective mobility in enhancement MOSFETs from weak to strong inversion using a single transistor

Analog integrated circuits and signal processing, 1996-04, Vol.9 (3)

1996

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Parameter extraction method for inhomogeneous MOSFETs locally damaged by hot carrier injection

Solid-state electronics, 1988-11, Vol.31 (11), p.1573-1581

1988

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Validation of RF mosfet transistor layout-aware macromodel

International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04, 2004, p.524-527

2004

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TWO-DIMENSIONAL MODELING AND PARAMETER EXTRACTION OF AGED MOSFETs

Compel, 1987-02, Vol.6 (2), p.85-91

1987

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Experimental Damage Identification Using Modified Mode Shape Difference

Journal of marine science and application, 2011-06, Vol.10 (2), p.150-155

2011

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Investigation of space filling capacitors

Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442), 2003, p.287-290

2003

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CMOS APS ASIC testing and evaluation

International Conference on Electrical, Electronic and Computer Engineering, 2004. ICEEC '04, 2004, p.445-448

2004

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A test structure for characterization of CMOS APS

Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442), 2003, p.151-154

2003

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Identification and characterisation of noise sources in SIMOX MOSFETs

ESSDERC '90: 20th European Solid State Device Research Conference, 1990, p.441-444

1990

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A robust expectation‐maximization method for the interpretation of small‐angle scattering data from dense nanoparticle samples

Adaptation of the charge pumping technique to gated p-i-n diodes fabricated on silicon on insulator

Low-frequency noise in depletion-mode SIMOX MOS transistors

Two-dimensional modeling of locally damaged short-channel MOSFET's operating in the linear region

Method for extracting deep submicrometre MOSFET parameters

Pulsed Drain Current : A Highly Sensitive Technique for Interface Characterization in VLSI MOSFET's

Design of Si-based micromachined slot antenna

Static and dynamic transconductance model for depletion-mode transistors: a new characterization method for silicon-on-insulator materials

Conductance technique in MOSFETs: Study of interface trap properties in the depletion and weak inversion regimes

Test results for RR-type micromechanical gyroscope

Profiling of stress induced interface states in short channel MOSFETs using a composite charge pumping technique

Lattice Boltzmann simulations of the capillary pressure bump phenomenon in heterogeneous porous media

Modeling of the 1/f noise overshoot in short-channel MOSFETs locally degraded by hot-carrier injection

Analysis and simulation of the frequency response of MOSFETs with uniform and/or local oxide degradation

Foreground digital calibration of non-linear errors in pipelined A/D converters

New full-voltage-swing multi-drain/multi-collector complementary BiCMOS buffers (M 2 CBiCMOS)

Extraction of the series resistance and the effective mobility in enhancement MOSFETs from weak to strong inversion using a single transistor

Parameter extraction method for inhomogeneous MOSFETs locally damaged by hot carrier injection

Validation of RF mosfet transistor layout-aware macromodel

TWO-DIMENSIONAL MODELING AND PARAMETER EXTRACTION OF AGED MOSFETs

Experimental Damage Identification Using Modified Mode Shape Difference

Investigation of space filling capacitors

CMOS APS ASIC testing and evaluation

A test structure for characterization of CMOS APS

Identification and characterisation of noise sources in SIMOX MOSFETs

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