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Mechanical dissipation via image potential states on a topological insulator surface

Nature materials, 2019-11, Vol.18 (11), p.1201-1206

2019

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Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO3 Structural Phase Transition

Physical review letters, 2015-07, Vol.115 (4)

2015

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Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Applied physics letters, 2016-01, Vol.108 (4)

2016

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Dopant imaging of power semiconductor device cross sections

Microelectronic engineering, 2016-07, Vol.160, p.18-21

2016

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Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

Review of scientific instruments, 2011-02, Vol.82 (2), p.023705-023705-6

2011

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Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging

Microelectronic engineering, 2015-12, Vol.148, p.1-4

2015

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Combined SIMS-SPM Instrument for High Sensitivity and High Resolution Elemental 3D Analysis

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.668-669

2013

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Dynamics of damped cantilevers

Review of scientific instruments, 2000-07, Vol.71 (7), p.2772-2775

2000

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The noise of cantilevers

Nanotechnology, 2000-09, Vol.11 (3), p.169-172

2000

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Combined SIMS-SPM Instrument For High Sensitivity And High Resolution Elemental 3D Analysis

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.888-889

2012

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Force microscopy experiments with ultrasensitive cantilevers

Nanotechnology, 2006-04, Vol.17 (7), p.S189-S194

2006

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Temperature dependence of the force sensitivity of silicon cantilevers

Physical review. B, Condensed matter and materials physics, 2004-01, Vol.69 (4), Article 045403

2004

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Using higher flexural modes in non-contact force microscopy

Applied surface science, 2000-04, Vol.157 (4), p.337-342

2000

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Phase noise induced due to amplitude fluctuations in dynamic force microscopy

Physical review. B, Condensed matter and materials physics, 2009-02, Vol.79 (5), Article 054106

2009

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Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO 3 Structural Phase Transition

Physical review letters, 2015-07, Vol.115 (4), Article 046101

2015

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Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging

Materials Science Forum, 2016-05, Vol.858, p.497-500

2016

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Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers

Materials science forum, 2015-06, Vol.821-823, p.269-272

2015

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Fabrication of ultrafloppy single-crystal silicon cantilever for magnetic resonance imaging

IEEE Sensors, 2005, 2005, p.4 pp.

2005

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Development of power semiconductors by quantitative nanoscale dopant imaging

2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD), 2015, p.281-284

2015

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Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO_{3} Structural Phase Transition

Physical review letters, 2015-07, Vol.115 (4), p.046101-046101

2015

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Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants

Journal of micromechanics and microengineering, 2005-11, Vol.15 (11), p.2179-2183

2005

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Dissipation at large Separations

Fundamentals of Friction and Wear on the Nanoscale (Nanoscience and Technology Series), 2007, p.439-452

2007

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Dissipation at large Separations

Fundamentals of Friction and Wear, p.439-451

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Apramycin efficacy against carbapenem- and aminoglycoside-resistant Escherichia coli and Klebsiella pneumoniae in murine bloodstream infection models

International journal of antimicrobial agents, 2024-07, Vol.64 (1), p.107181, Article 107181

2024

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Malaria in Eritrean migrants newly arrived in seven European countries, 2011 to 2016

Euro surveillance : bulletin européen sur les maladies transmissibles, 2019-01, Vol.24 (5), p.36

2019

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Mechanical dissipation via image potential states on a topological insulator surface

Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO3 Structural Phase Transition

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Dopant imaging of power semiconductor device cross sections

Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry

Improving the Design of the Shield for the Electric Field in SiC-Based Schottky-Rectifiers and Ion-Implantation Cascades by SPM Dopant-Imaging

Combined SIMS-SPM Instrument for High Sensitivity and High Resolution Elemental 3D Analysis

Dynamics of damped cantilevers

The noise of cantilevers

Combined SIMS-SPM Instrument For High Sensitivity And High Resolution Elemental 3D Analysis

Force microscopy experiments with ultrasensitive cantilevers

Temperature dependence of the force sensitivity of silicon cantilevers

Using higher flexural modes in non-contact force microscopy

Phase noise induced due to amplitude fluctuations in dynamic force microscopy

Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO 3 Structural Phase Transition

Junction Barrier Schottky (JBS) Rectifier Interface Engineering Facilitated by Two-Dimensional (2D) Dopant Imaging

Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers

Fabrication of ultrafloppy single-crystal silicon cantilever for magnetic resonance imaging

Development of power semiconductors by quantitative nanoscale dopant imaging

Noncontact Atomic Force Microscope Dissipation Reveals a Central Peak of SrTiO_{3} Structural Phase Transition

Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants

Dissipation at large Separations

Dissipation at large Separations

Apramycin efficacy against carbapenem- and aminoglycoside-resistant Escherichia coli and Klebsiella pneumoniae in murine bloodstream infection models

Malaria in Eritrean migrants newly arrived in seven European countries, 2011 to 2016

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