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Interface induced diffusion

Scientific reports, 2021-04, Vol.11 (1), p.9308-9308, Article 9308

2021

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Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces

Scientific reports, 2018-02, Vol.8 (1), p.1-7, Article 2124

2018

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Wafer-scale SiC rich nano-coating layer by Ar+ and Xe+ ion mixing

Surface & coatings technology, 2016-09, Vol.302, p.320-326

2016

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Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films

Journal of the European Ceramic Society, 2013-10, Vol.33 (12), p.2217-2221

2013

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The chemical resistance of nano-sized SiC rich composite coating

Surface & coatings technology, 2015-01, Vol.261, p.195-200

2015

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Phase formation in the Ni/n–InP contacts for heterogeneous III/V-silicon photonic integration

Microelectronic engineering, 2016-04, Vol.156 (SI), p.86-90

2016

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Texture change of TiN films due to anisotropic incorporation of oxygen

Vacuum, 2014-05, Vol.103, p.78-86

2014

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Polarity dependent carbon enrichment on 6H–SiC{ [formula omitted]} due to low energy ion bombardment

Surface science, 2003-02, Vol.526 (1), p.L133-L136

2003

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Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling

Applied surface science, 2014-10, Vol.316, p.301-307

2014

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Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300K

International journal of refractory metals & hard materials, 2006-07, Vol.24 (4), p.343-349

2006

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Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300 K

International journal of refractory metals & hard materials, 2006-01, Vol.24 (4), p.343-349

2006

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Monte Carlo backscattering yield (BY) calculations applying continuous slowing down approximation (CSDA) and experimental data

Vacuum, 2007-10, Vol.82 (2), p.201-204

2007

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Electron irradiation induced amorphous SiO 2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces

Scientific reports, 2018-02, Vol.8 (1), p.2124

2018

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Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies

Surface and interface analysis, 2011-11, Vol.43 (11), p.1365-1370

2011

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The inelastic mean free path of electrons. Past and present research

Vacuum, 2009-08, Vol.84 (1), p.134-136

2009

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Experimental measurements of the surface excitation parameters of Cu, Au, Ni, Ag, Ge and Pd based on Si and other reference standard materials

Surface and interface analysis, 2004-08, Vol.36 (8), p.1098-1101

2004

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Experimental determination of the inelastic mean free path (IMFP) of electrons in selected oxide films applying surface excitation correction

Surface and interface analysis, 2006-04, Vol.38 (4), p.624-627

2006

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Ion mixing at 20 keV: a comparison of the effects of Ga+, Ar+ and CF4+ ion irradiation

Ultramicroscopy, 2008-12, Vol.109 (1), p.129-132

2008

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Behavioral sleep medicine training in australia: audit of the aps practice certificate in sleep psychology

Sleep medicine, 2019-12, Vol.64, p.S251-S251

2019

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Surface excitation effects in electron spectroscopy

Solid state ionics, 2001-05, Vol.141-142, p.47-51

2001

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Experimental estimation of surface excitation parameter for surface analysis

Surface and interface analysis, 2002-05, Vol.33 (5), p.410-413

2002

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Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

Surface and interface analysis, 2002-08, Vol.34 (1), p.206-210

2002

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Makyoh Topography Study of the Curvature and Surface Morphology of Mismatched InGaAs/GaAs Heterostructures

Physica status solidi. A, Applied research, 2000-01, Vol.177 (1), p.231-236

2000

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Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III–V semiconductors

Vacuum, 2003-05, Vol.71 (1), p.147-152

2003

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Solid state reaction of Ni thin film on n-InP susbtrate for III-V laser contact technology

2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015, p.269-272

2015

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Interface induced diffusion

Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces

Wafer-scale SiC rich nano-coating layer by Ar+ and Xe+ ion mixing

Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films

The chemical resistance of nano-sized SiC rich composite coating

Phase formation in the Ni/n–InP contacts for heterogeneous III/V-silicon photonic integration

Texture change of TiN films due to anisotropic incorporation of oxygen

Polarity dependent carbon enrichment on 6H–SiC{ [formula omitted]} due to low energy ion bombardment

Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling

Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300K

Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300 K

Monte Carlo backscattering yield (BY) calculations applying continuous slowing down approximation (CSDA) and experimental data

Electron irradiation induced amorphous SiO 2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces

Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies

The inelastic mean free path of electrons. Past and present research

Experimental measurements of the surface excitation parameters of Cu, Au, Ni, Ag, Ge and Pd based on Si and other reference standard materials

Experimental determination of the inelastic mean free path (IMFP) of electrons in selected oxide films applying surface excitation correction

Ion mixing at 20 keV: a comparison of the effects of Ga+, Ar+ and CF4+ ion irradiation

Behavioral sleep medicine training in australia: audit of the aps practice certificate in sleep psychology

Surface excitation effects in electron spectroscopy

Experimental estimation of surface excitation parameter for surface analysis

Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter

Makyoh Topography Study of the Curvature and Surface Morphology of Mismatched InGaAs/GaAs Heterostructures

Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III–V semiconductors

Solid state reaction of Ni thin film on n-InP susbtrate for III-V laser contact technology

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