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The Journal of biological chemistry, 2003-09, Vol.278 (38), p.37569-37573
2003
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IEEE transactions on semiconductor manufacturing, 2001-02, Vol.14 (1), p.11-19
2001
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Materials letters, 2006-01, Vol.60 (2), p.261-265
2006
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Journal of materials science, 2005-03, Vol.40 (5), p.1317-1319
2005
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Journal of pediatric surgery, 1999-10, Vol.34 (10), p.1463-1468
1999
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Information & management, 2005, Vol.42 (2), p.329-348
2005
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Ceramics international, 2003, Vol.29 (8), p.883-886
2003
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Materials letters, 2002-11, Vol.56 (6), p.1014-1018
2002
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Journal of physics. G, Nuclear and particle physics, 2006-03, Vol.32 (3), p.269-281
2006
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Journal of physics. G, Nuclear and particle physics, 2005-08, Vol.31 (8), p.909-919
2005
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2000-12, Vol.455 (2), p.324-328
2000
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Journal of physics. G, Nuclear and particle physics, 2000-12, Vol.26 (12), p.1775-1786
2000
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Virchows Archiv : an international journal of pathology, 1997, Vol.430 (1), p.53-61
1997
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2004 International Conference on Image Processing, 2004. ICIP '04, 2004, Vol.5, p.3319-3322 Vol. 5
2004
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IEEE transactions on semiconductor manufacturing, 2000-08, Vol.13 (3), p.344-358
2000
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IEEE transactions on semiconductor manufacturing, 1991-05, Vol.4 (2), p.134-144
1991
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ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005, 2005, p.361-364
2005
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IEEE transactions on semiconductor manufacturing, 1993-02, Vol.6 (1), p.41-57
1993
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Physical review letters, 1995-06, Vol.74 (26), p.5198-5201
- Adams, MR
- Aïd, S
- Anthony, PL
- Averill, DA
- Baker, MD
- Baller, BR
- Banerjee, A
- Bhatti, AA
- Bratzler, U
- Braun, HM
- Breidung, H
- Busza, W
- Carroll, TJ
- Clark, HL
- Conrad, JM
- Davisson, R
- Derado, I, I
- Dhawan, SK
- Dietrich, FS
- Dougherty, W
- Dreyer, T
- Eckardt, V, V
- Ecker, U
- Erdmann, M
- Fang, GY
- Figiel, J
- Finlay, RW
- Gebauer, HJ
- Geesaman, DF
- Griffioen, KA
- Guo, RS
- Haas, J
- Halliwell, C
- Hantke, D
- Hicks, KH
- Hughes, VW
- Jackson, HE
- Jaffe, DE
- Jancso, G
- Jansen, DM
- Jin, Z
- Kaufman, S
- Kennedy, RD
- Kinney, ER
- Kirk, T
- Kobrak, HG
- Kotwal, AV
- Kunori, S
- Lord, JJ
- Lubatti, HJ
- McLeod, D
- Madden, P
- Magill, S
- Manz, A
- Melanson, H
- Michael, DG
- Montgomery, HE
- Morfin, JG
- Nickerson, RB
- O'Day, S
- Olkiewicz, K
- Osborne, L
- Otten, R
- Papavassiliou, V, V
1995
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Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130), 2000, p.375-378
2000
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2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203), 2001, p.171-174
2001
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1996-11, Vol.382 (3), p.441-446
1996
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1996-12, Vol.383 (1), p.13-20
- Antos, J.
- Chao, H-Y.
- Chang, P.
- Cheng, M-T.
- Chu, M-L.
- Guo, R-S.
- Ho, C-L.
- Teng, P-K.
- Wang, M-J.
- Wu, S-C.
- Yeh, G-P
- Yeh, P.
- Andressen, J.
- Barsotti, E.
- Bowden, M.
- Cihangir, S.
- Gonzalez, H.
- Grimm, C.
- Haynes, B.
- Hrycyk, M.
- Howell, J.
- Husby, D.
- Knopf, W.
- Lindenmeyer, M.
- Ratzmann, P.
- Sarge, J.
- Spalding, J.
- Spiegel, L.
- Tkaczyk, S.
- Woodbury, K.
- Yarema, R.
- Zimmerman, S.
- Zimmerman, T.
- Gay, C.
- Huth, J.
- Oliver, J.
- Spiropulu, M.
- Stroehmer, R.
- Iwata, Y.
- Ohmoto, T.
- Ohsugi, T.
- Barnett, B.
- Skarha, J.
- Snider, R.
- Takashima, R.
- Ely, R.
- Garcia-Sciveres, M.
- Haber, C.
- Milgrome, O.
- Lu, L.
- Bailey, M.
- Bruner, N.
- Gold, M.
- Hoeferkamp, M.
- Matthews, J.
- Moore, E.
- Seidel, S.
- Thomas, T.
- Worm, S.
- Yu, L.
- Kohriki, T.
- Unno, Y.
- Tamura, N.
- Bacchetta, N.
- Bisello, D.
- Bolla, G.
- Boudreau, J.
- Engels, E.
- Huffman, B.T.
- Shepard, P.F.
- Rosatti, R.
- Bedeschi, F.
- Menzione, A.
- Punzi, G.
- Ristori, L.
- Zetti, F.
- Bortoletto, D.
- Garfinkel, A.
- Hardmann, A.
- Hoffman, K.
- Keaffaber, T.
- Shaw, N.M.
- Cassada, J.
- Tipton, P.
- Conway, J.
- Done, J.
- Kamon, T.
- Tannenbaum, B.
- Wolinski, J.
- Benjamin, D.
- Frautschi, M.
- Sill, A.
- Hou, J-F.
1996
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Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130), 2000, p.446-449
2000
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