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Studies in conflict and terrorism, 2008-04, Vol.31 (4), p.350-370
2008
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Proceedings of the IEEE, 2003-05, Vol.91 (5), p.703-714
2003
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IEEE transactions on magnetics, 2005-01, Vol.41 (1), p.132-136
2005
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IEEE transactions on magnetics, 2006-08, Vol.42 (8), p.1935-1939
2006
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IEEE journal of solid-state circuits, 2003-05, Vol.38 (5), p.769-773
2003
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MRS bulletin, 2004-11, Vol.29 (11), p.818-821
2004
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Air & space power journal, 2007-12, Vol.21 (4), p.86-97
2007
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Joint force quarterly, 2018-04 (89), p.6-7
2018
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2007 IEEE International Conference on Integrated Circuit Design and Technology, 2007, p.1-4
2007
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Joint Force Quarterly : JFQ, 2020-07 (98), p.4-9
2020
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Proceedings of 1st International Symposium on Plasma Process-Induced Damage, 1996, p.109-112
1996
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Inorganic chemistry, 1973-11, Vol.12 (11), p.2522-2525
1973
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Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005, 2005, p.186-187
- Durlam, M.
- Andre, T.
- Brown, P.
- Calder, J.
- Chan, J.
- Cuppens, R.
- Dave, R.W.
- Ditewig, T.
- DeHerrera, M.
- Engel, B.N.
- Feil, B.
- Frey, C.
- Galpin, D.
- Garni, B.
- Grynkewich, G.
- Janesky, J.
- Kerszykowski, G.
- Lien, M.
- Martin, J.
- Nahas, J.
- Nagel, K.
- Smith, K.
- Subramanian, C.
- Sun, J.J.
- Tamim, J.
- Williams, R.
- Wise, L.
- Zoll, S.
- List, F.
- Fournel, R.
- Martino, B.
- Tehrani, S.
2005
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MRS proceedings, 1995, Vol.402, Article 71
1995
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Air & space power journal, 1997-07, Vol.11 (2), p.58
1997
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Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124), 2000, p.110-113
2000
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1990-01, Vol.8 (1), p.5-9
1990
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2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2007, p.1-2
2007
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Inorganic chemistry, 1976-06, Vol.15 (6), p.1302-1307
1976
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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866), 2004, p.27-30
- Durlam, M.
- Addie, D.
- Akerman, J.
- Butcher, B.
- Brown, P.
- Chan, J.
- DeHerrera, M.
- Engel, B.N.
- Feil, B.
- Grynkewich, G.
- Janesky, J.
- Johnson, M.
- Kyler, K.
- Molla, J.
- Martin, J.
- Nagel, K.
- Nahas, J.
- Ren, J.
- Rizzo, N.D.
- Rodriguez, T.
- Savtchenko, L.
- Salter, J.
- Slaughter, J.M.
- Smith, K.
- Sun, J.J.
- Lien, M.
- Papworth, K.
- Shah, P.
- Qin, W.
- Williams, R.
- Wise, L.
- Tehrani, S.
2004
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2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302), 2002, p.158-161
2002
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Journal of the American Chemical Society, 1977-10, Vol.99 (22), p.7154-7162
1977
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IEEE International Electron Devices Meeting 2003, 2003, p.34.6.1-34.6.3
- Durlam, M.
- Addie, D.
- Akerman, J.
- Butcher, B.
- Brown, P.
- Chan, J.
- DeHerrera, M.
- Engel, B.N.
- Feil, B.
- Grynkewich, G.
- Janesky, J.
- Johnson, M.
- Kyler, K.
- Molla, J.
- Martin, J.
- Nagel, K.
- Ren, J.
- Rizzo, N.D.
- Rodriguez, T.
- Savtchenko, L.
- Salter, J.
- Slaughter, J.M.
- Smith, K.
- Sun, J.J.
- Lien, M.
- Papworth, K.
- Shah, P.
- Qin, W.
- Williams, R.
- Wise, L.
- Tehrani, S.
2003
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Inorganic chemistry, 1976-06, Vol.15 (6), p.1307-1314
1976
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