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Comparison of the gas sensing performance of SnO2 thin film and SnO2 nanowire sensors

Sensors and actuators. B, Chemical, 2012-04, Vol.165 (1), p.110-118

2012

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Gas sensing properties of novel CuO nanowire devices

Sensors and actuators. B, Chemical, 2013-10, Vol.187, p.50-57

2013

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Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy

Physical review letters, 2014-02, Vol.112 (8), Article 085501

2014

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Low-frequency noise characterization of single CuO nanowire gas sensor devices

Applied physics letters, 2015-09, Vol.107 (12)

2015

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Fundamentals of electron energy-loss spectroscopy

IOP conference series. Materials Science and Engineering, 2016-02, Vol.109 (1), p.12007-12015

2016

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Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution

Ultramicroscopy, 2003-09, Vol.96 (3), p.469-480

2003

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Čerenkov losses: A limit for bandgap determination and Kramers–Kronig analysis

Micron (Oxford, England : 1993), 2006-07, Vol.37 (5), p.396-402

2006

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Channel length variation in self-aligned, nanoimprint lithography structured OTFTs

Organic electronics, 2014-11, Vol.15 (11), p.3274-3281

2014

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Residue-free room temperature UV-nanoimprinting of submicron organic thin film transistors

Organic electronics, 2009-12, Vol.10 (8), p.1466-1472

2009

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Note: On the deconvolution of Kelvin probe force microscopy data

Review of scientific instruments, 2010-05, Vol.81 (5), p.056107-056107-3

2010

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Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range

Micron (Oxford, England : 1993), 2009-02, Vol.40 (2), p.269-273

2009

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Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging

Ultramicroscopy, 1995-07, Vol.59 (1), p.15-31

1995

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Structure–property–performance relations of high-rate reactive arc-evaporated Ti–B–N nanocomposite coatings

Surface & coatings technology, 2006-12, Vol.201 (6), p.2553-2559

2006

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Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.570-571

2014

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Crystal structure of La0.4Sr0.6CoO2.71 investigated by TEM and XRD

Journal of solid state chemistry, 2008-11, Vol.181 (11), p.2976-2982

2008

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Morphology and crystallographic properties of rubrene thin films grown on muscovite(0 0 1)

Physica. E, Low-dimensional systems & nanostructures, 2009-09, Vol.41 (9), p.1718-1722

2009

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Microstructural characterization of nitrided Timetal 834

Journal of microscopy (Oxford), 2006-09, Vol.223 (3), p.195-199

2006

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AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Analytical and bioanalytical chemistry, 2008-03, Vol.390 (6), p.1455-1461

2008

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Investigation of Yb substitution in the clathrate phase Eu8Ga16Ge30

Journal of crystal growth, 2008-04, Vol.310 (7-9), p.1853-1858

2008

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Synthesis and optical properties of organic semiconductor: zirconia nanocomposites

Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology, 2010-09, Vol.12 (7), p.2541-2551

2010

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High-resolution cross-sectional analysis of the interface between SiC and SiO2 in a MOSFET device via atomic resolution STEM

Microelectronics and reliability, 2019-09, Vol.100-101, p.113366, Article 113366

2019

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Single crystalline nature of para-sexiphenyl crystallites grown on KCl(100)

Journal of nanoscience and nanotechnology, 2006-03, Vol.6 (3), p.698

2006

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Microstructure and ionic conductivity of strontium-substituted lanthanum cobaltites

Solid state ionics, 2002-12, Vol.152, p.417-421

2002

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Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.70-71

2008

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Low-loss EELS Measurements with Monochromated Electrons

Microscopy and microanalysis, 2007-09, Vol.13 (S03), p.46-47

2007

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Comparison of the gas sensing performance of SnO2 thin film and SnO2 nanowire sensors

Gas sensing properties of novel CuO nanowire devices

Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy

Low-frequency noise characterization of single CuO nanowire gas sensor devices

Fundamentals of electron energy-loss spectroscopy

Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution

Čerenkov losses: A limit for bandgap determination and Kramers–Kronig analysis

Channel length variation in self-aligned, nanoimprint lithography structured OTFTs

Residue-free room temperature UV-nanoimprinting of submicron organic thin film transistors

Note: On the deconvolution of Kelvin probe force microscopy data

Monochromated, spatially resolved electron energy-loss spectroscopic measurements of gold nanoparticles in the plasmon range

Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging

Structure–property–performance relations of high-rate reactive arc-evaporated Ti–B–N nanocomposite coatings

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Crystal structure of La0.4Sr0.6CoO2.71 investigated by TEM and XRD

Morphology and crystallographic properties of rubrene thin films grown on muscovite(0 0 1)

Microstructural characterization of nitrided Timetal 834

AFM, ellipsometry, XPS and TEM on ultra-thin oxide/polymer nanocomposite layers in organic thin film transistors

Investigation of Yb substitution in the clathrate phase Eu8Ga16Ge30

Synthesis and optical properties of organic semiconductor: zirconia nanocomposites

High-resolution cross-sectional analysis of the interface between SiC and SiO2 in a MOSFET device via atomic resolution STEM

Single crystalline nature of para-sexiphenyl crystallites grown on KCl(100)

Microstructure and ionic conductivity of strontium-substituted lanthanum cobaltites

Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display

Low-loss EELS Measurements with Monochromated Electrons

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