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Ion microsource integrated with scanning electron microscope for sample preparation

Micron (Oxford, England : 1993), 2023-04, Vol.167, p.103419-103419, Article 103419

2023

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Low-strain sensor based on the flexible boron-doped diamond-polymer structures

Carbon (New York), 2021-03, Vol.173, p.832-841

2021

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Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers

Nanotechnology, 2020-10, Vol.31 (42), p.425706

2020

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Study of the Efficiency of Microcantilevers: Cases of Electrothermal and Electromagnetic Actuation

Journal of microelectromechanical systems, 2022-10, Vol.31 (5), p.784-790

2022

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Application of piezoelectric tuning forks in liquid viscosity and density measurements

Sensors and actuators. B, Chemical, 2011-12, Vol.160 (1), p.517-523

2011

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Origin and anomalous behavior of dominant defects in 4H-SiC studied by conventional and Laplace deep level transient spectroscopy

Journal of applied physics, 2020-02, Vol.127 (6)

2020

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MEMS displacement generator for atomic force microscopy metrology

Measurement science & technology, 2021-06, Vol.32 (6), p.65903

2021

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Evaluation of mechanical properties of carbon coatings synthesised in radio frequency plasma on PDMS

Surface & coatings technology, 2018-01, Vol.333, p.220-228

2018

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Soft piezoresistive cantilevers for adhesion force measurements

Sensors and actuators. A. Physical., 2020-01, Vol.301, p.111747, Article 111747

2020

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Thermomechanically and electromagnetically actuated piezoresistive cantilevers for fast-scanning probe microscopy investigations

Sensors and actuators. A. Physical., 2018-06, Vol.276, p.237-245

2018

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Investigation of multi-junction solar cells using electrostatic force microscopy methods

Ultramicroscopy, 2014-06, Vol.141, p.1-8

2014

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Focused ion beam milling and deposition techniques in validation of mass change value and position determination method for micro and nanomechanical sensors

Journal of applied physics, 2012-12, Vol.112 (11)

2012

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Electromagnetic cantilever reference for the calibration of optical nanodisplacement systems

Sensors and actuators. A. Physical., 2018-10, Vol.282, p.149-156

2018

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Evaluation of Pseudomonas aeruginosa biofilm formation using piezoelectric tuning fork mass sensors

Sensors and actuators. B, Chemical, 2012-07, Vol.170, p.7-12

2012

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Fabrication and characterization of micromechanical bridges with strain sensors deposited using focused electron beam induced technology

Microelectronic engineering, 2017-05, Vol.176, p.111-115

2017

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Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

Ultramicroscopy, 2018-01, Vol.184 (Pt A), p.199-208

2018

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Regularization mechanism in blind tip reconstruction procedure

Ultramicroscopy, 2012-07, Vol.118, p.1-10

2012

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Technology of thermally driven and magnetomotively detected MEMS microbridges

Sensors and actuators. A. Physical., 2016-04, Vol.240, p.17-22

2016

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The spring constant calibration of the piezoresistive cantilever based biosensor

Sensors and actuators. B, Chemical, 2012-07, Vol.170, p.201-206

2012

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Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopy

Micron (Oxford, England : 1993), 2016-05, Vol.84, p.1-6

2016

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Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices

Microelectronic engineering, 2010-05, Vol.87 (5), p.1370-1374

2010

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Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantilevers

Review of scientific instruments, 2011-10, Vol.82 (10), p.105112-105112-6

2011

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Strain relaxation induced surface morphology of heterogeneous GaInNAs layers grown on GaAs substrate

Journal of crystal growth, 2017-07, Vol.470, p.108-112

2017

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Vertical devices of self-assembled hybrid organic/inorganic monolayers based on tungsten polyoxometalates

Microelectronic engineering, 2008-05, Vol.85 (5-6), p.1399-1402

2008

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Refractive index modulation in the polyurethane films containing diazo sulfonamide chromophores

Thin solid films, 2005-05, Vol.479 (1), p.288-296

2005

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Ion microsource integrated with scanning electron microscope for sample preparation

Low-strain sensor based on the flexible boron-doped diamond-polymer structures

Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers

Study of the Efficiency of Microcantilevers: Cases of Electrothermal and Electromagnetic Actuation

Application of piezoelectric tuning forks in liquid viscosity and density measurements

Origin and anomalous behavior of dominant defects in 4H-SiC studied by conventional and Laplace deep level transient spectroscopy

MEMS displacement generator for atomic force microscopy metrology

Evaluation of mechanical properties of carbon coatings synthesised in radio frequency plasma on PDMS

Soft piezoresistive cantilevers for adhesion force measurements

Thermomechanically and electromagnetically actuated piezoresistive cantilevers for fast-scanning probe microscopy investigations

Investigation of multi-junction solar cells using electrostatic force microscopy methods

Focused ion beam milling and deposition techniques in validation of mass change value and position determination method for micro and nanomechanical sensors

Electromagnetic cantilever reference for the calibration of optical nanodisplacement systems

Evaluation of Pseudomonas aeruginosa biofilm formation using piezoelectric tuning fork mass sensors

Fabrication and characterization of micromechanical bridges with strain sensors deposited using focused electron beam induced technology

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

Regularization mechanism in blind tip reconstruction procedure

Technology of thermally driven and magnetomotively detected MEMS microbridges

The spring constant calibration of the piezoresistive cantilever based biosensor

Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopy

Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices

Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantilevers

Strain relaxation induced surface morphology of heterogeneous GaInNAs layers grown on GaAs substrate

Vertical devices of self-assembled hybrid organic/inorganic monolayers based on tungsten polyoxometalates

Refractive index modulation in the polyurethane films containing diazo sulfonamide chromophores

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