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IEEE journal of the Electron Devices Society, 2019, Vol.7, p.517-521
2019
Link zum Volltext
IEEE journal of the Electron Devices Society, 2022, Vol.10, p.563-568
- Redaelli, A.
- Gandolfo, A.
- Samanni, G.
- Gomiero, E.
- Petroni, E.
- Scotti, L.
- Lippiello, A.
- Mattavelli, P.
- Jasse, J.
- Codegoni, D.
- Serafini, A.
- Ranica, R.
- Boccaccio, C.
- Sandrini, J.
- Berthelon, R.
- Grenier, J.-C.
- Weber, O.
- Turgis, D.
- Valery, A.
- Medico, S. Del
- Caubet, V.
- Reynard, J.-P.
- Dutartre, D.
- Favennec, L.
- Conte, A.
- Disegni, F.
- De Tomasi, M.
- Ventre, A.
- Baldo, M.
- Ielmini, D.
- Maurelli, A.
- Ferreira, P.
- Arnaud, F.
- Piazza, F.
- Cappelletti, P.
- Annunziata, R.
- Gonella, R.
2022
Link zum Volltext
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC), 2021, p.231-234
- Redaelli, A.
- Gandolfo, A.
- Samanni, G.
- Gomiero, E.
- Petroni, E.
- Scotti, L.
- Lippiello, A.
- Mattavelli, P.
- Jasse, J.
- Codegoni, D.
- Serafini, A.
- Ranica, R.
- Boccaccio, C.
- Sandrini, J.
- Berthelon, R.
- Grenier, JC
- Weber, O.
- Turgis, D.
- Valery, A.
- Del Medico, S.
- Caubet, V.
- Reynard, JP
- Dutartre, D.
- Favennec, L.
- Conte, A.
- Disegni, F.
- De Tomasi, M.
- Ventre, A.
- Baldo, M.
- Ielmini, D.
- Maurelli, A.
- Ferreira, P.
- Arnaud, F.
- Piazza, F.
- Cappelletti, P.
- Annunziata, R.
- Gonella, R.
2021
Link zum Volltext
2022 IEEE International Memory Workshop (IMW), 2022, p.1-4
2022
Link zum Volltext
High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
- Arnaud, F.
- Ferreira, P.
- Piazza, F.
- Gandolfo, A.
- Zuliani, P.
- Mattavelli, P.
- Gomiero, E.
- Samanni, G.
- Jasse, J.
- Jahan, C.
- Reynard, J. P.
- Berthelon, R.
- Weber, O.
- Villaret, A.
- Dumont, B.
- Grenier, J. C.
- Ranica, R.
- Gallon, C.
- Boccaccio, C.
- Souhaite, A.
- Desvoivres, L.
- Ristoiu, D.
- Favennec, L.
- Caubet, V.
- Delmedico, S.
- Cherault, N.
- Beneyton, R.
- Chouteau, S.
- Sassoulas, P. O.
- Clement, L.
- Boivin, P.
- Turgis, D.
- Disegni, F.
- Ogier, J. L.
- Federspiel, X.
- Kermarrec, O.
- Molgg, M.
- Viscuso, A.
- Annunziata, R.
- Maurelli, A.
- Cappelletti, P.
- Ciantar, E.
2020
- Link zum Volltext
Microelectronics and reliability, 2000-04, Vol.40 (4-5), p.719-722
2000
Link zum Volltext
2021 IEEE International Electron Devices Meeting (IEDM), 2021, p.28.1.1-28.1.4
- Ranica, R.
- Berthelon, R.
- Gandolfo, A.
- Samanni, G.
- Gomiero, E.
- Jasse, J.
- Mattavelli, P.
- Sandrini, J.
- Querre, M.
- Le-Friec, Y.
- Poulet, J.
- Caubet, V.
- Favennec, L.
- Boccaccio, C.
- Ghezzi, G.
- Gallon, C.
- Grenier, JC
- Dumont, B.
- Weber, O.
- Villaret, A.
- Beneyton, R.
- Cherault, N.
- Ristoiu, D.
- Del Medico, S.
- Kermarrec, O.
- Reynard, JP
- Boivin, P.
- Souhaite, A.
- Desvoivres, L.
- Chouteau, S.
- Sassoulas, PO
- Clement, L.
- Valery, A.
- Petroni, E.
- Turgis, D.
- Lippiello, A.
- Scotti, L.
- Disegni, F.
- Ventre, A.
- Ornaghi, D.
- De Tomasi, M.
- Maurelli, A.
- Conte, A.
- Arnaud, F.
- Redaelli, A.
- Annunziata, R.
- Cappelletti, P.
- Piazza, F.
- Ferreira, P.
- Gonella, R.
- Ciantar, E.
2021
- Link zum Volltext
2021 Symposium on VLSI Technology, 2021, p.1-2
- Weber, O.
- Pigot, C.
- Berthelon, R.
- Gandolfo, A.
- Mattavelli, P.
- Jasse, J.
- Samanni, G.
- Gomiero, E.
- Richard, E.
- Grenier, J. C.
- Ranica, R.
- Chouteau, S.
- Beneyton, R.
- Duclaux, B.
- Beylier, C.
- Pelissier, D.
- Gallon, C.
- Toulouse, C.
- Jenny, C.
- Croisy, M.
- Borowiak, C.
- Haendler, S.
- Ogier, J.L.
- Batail, E.
- Gilibert, F.
- Boivin, P.
- Turgis, D.
- Conte, A.
- Disegni, F.
- Redaelli, A.
- Annunziata, R.
- Cappelletti, P.
- Piazza, F.
- Ferreira, P.
- Arnaud, F.
2021
Link zum Volltext
Microelectronics and reliability, 1998-02, Vol.38 (2), p.189-193
1998
Link zum Volltext
Solid-state electronics, 2001-08, Vol.45 (8), p.1279-1291
2001
Link zum Volltext
2018 IEEE International Electron Devices Meeting (IEDM), 2018, p.18.4.1-18.4.4
- Arnaud, F.
- Zuliani, P.
- Reynard, J.P.
- Gandolfo, A.
- Disegni, F.
- Mattavelli, P.
- Gomiero, E.
- Samanni, G.
- Jahan, C.
- Berthelon, R.
- Weber, O.
- Richard, E.
- Barral, V.
- Villaret, A.
- Kohler, S.
- Grenier, J.C.
- Ranica, R.
- Gallon, C.
- Souhaite, A.
- Ristoiu, D.
- Favennec, L.
- Caubet, V.
- Delmedico, S.
- Cherault, N.
- Beneyton, R.
- Chouteau, S.
- Sassoulas, P.O.
- Vernhet, A.
- Le Friec, Y.
- Domengie, F.
- Scotti, L.
- Pacelli, D.
- Ogier, J.L.
- Boucard, F.
- Lagrasta, S.
- Benoit, D.
- Clement, L.
- Boivin, P.
- Ferreira, P.
- Annunziata, R.
- Cappelletti, P.
2018
- Link zum Volltext
MRS proceedings, 2000, Vol.610, Article B3.10
2000
Link zum Volltext
ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095), 2000, p.217-222
2000
Link zum Volltext
2010 IEEE International Memory Workshop, 2010, p.1-3
2010
- Link zum Volltext
2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design, 2008, p.28-30
2008
- Link zum Volltext
BMC veterinary research, 2018-06, Vol.14 (1), p.202-202, Article 202
2018
Link zum Volltext
Significação (Ribeirão Preto), 2022-09, Vol.49 (58), p.188751
2022
Link zum Volltext
Journal of intellectual disability research, 2021-02, Vol.65 (2), p.162-172
2021
Link zum Volltext
Ecotoxicology and environmental safety, 2019-09, Vol.180, p.473-482
2019
Link zum Volltext
Literatura e sociedade, 2020-11, Vol.25 (31), p.154-175
2020
Link zum Volltext
Molecular and Cellular Biology, 2004-03, Vol.24 (6), p.2526-2535
2004
Link zum Volltext
Marine pollution bulletin, 2015-04, Vol.93 (1-2), p.228-244
2015
Link zum Volltext
Arctic science, 2023-06, Vol.9 (2), p.266-283
2023
Link zum Volltext
Journal of physics. Conference series, 2018-06, Vol.1037 (6), p.62023
2018
Link zum Volltext
Arctic science, 2023-03, Vol.9 (1), p.165-175
2023
Link zum Volltext
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