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IEEE transactions on computers, 2019-05, Vol.68 (5), p.765-783
2019
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IEEE transactions on computers, 2005-04, Vol.54 (4), p.461-475
2005
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Online Periodic Self-Test Scheduling for Real-Time Processor-Based Systems Dependability Enhancement
2009
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IEEE transactions on computers, 2009-12, Vol.58 (12), p.1682-1694
2009
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IEEE transactions on very large scale integration (VLSI) systems, 2008-11, Vol.16 (11), p.1441-1453
2008
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Microprocessors and microsystems, 2015-11, Vol.39 (8), p.1204-1214
2015
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IEEE transactions on very large scale integration (VLSI) systems, 2005-09, Vol.13 (9), p.1079-1086
2005
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IEEE transactions on dependable and secure computing, 2009-04, Vol.6 (2), p.124-134
2009
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IEEE transactions on very large scale integration (VLSI) systems, 2007-08, Vol.15 (8), p.971-975
2007
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IEEE transactions on computer-aided design of integrated circuits and systems, 2005-03, Vol.24 (3), p.449-460, Article 449
2005
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2010 IEEE International Test Conference, 2010, p.1-10
2010
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IEEE transactions on reliability, 2005-03, Vol.54 (1), p.69-78
2005
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IEEE transactions on computers, 2006-11, Vol.55 (11), p.1449-1457
2006
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2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008, p.87-95
2008
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IEEE transactions on very large scale integration (VLSI) systems, 2013-04, Vol.21 (4), p.786-790
2013
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IEEE transactions on computers, 1999-09, Vol.48 (9), p.936-950
1999
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2010 IEEE International Conference on Computer Design, 2010, p.376-383
2010
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2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009, p.367-375
2009
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IEEE transactions on very large scale integration (VLSI) systems, 2012-12, Vol.20 (12), p.2278-2288
2012
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IEEE transactions on computers, 2000-10, Vol.49 (10), p.1083-1099
2000
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IEEE transactions on dependable and secure computing, 2011-03, Vol.8 (2), p.207-217
2011
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2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009, p.313-321
2009
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2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 2008, p.114-122
2008
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2013 IEEE 31st VLSI Test Symposium (VTS), 2013, p.1-6
2013
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IEEE transactions on dependable and secure computing, 2012-01, Vol.9 (1), p.86-100
2012
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