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Microelectronic engineering, 2006-11, Vol.83 (11), p.2189-2194
2006
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Solid-state electronics, 2006-07, Vol.50 (7-8), p.1244-1251
2006
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Microelectronics and reliability, 2007-04, Vol.47 (4-5), p.700-703
2007
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Microelectronic engineering, 2010-03, Vol.87 (3), p.361-364
2010
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2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017, p.1-2
2017
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IEEE transactions on electron devices, 2007-04, Vol.54 (4), p.742-751
2007
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Microelectronics and reliability, 2007, Vol.47 (4), p.700-703
2007
Link zum Volltext
IEEE transactions on electron devices, 2007-01, Vol.54 (4)
2007
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2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.115-119
2007
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Solid-state electronics, 2006, Vol.50, p.1244-1251
2006
Link zum Volltext
2006 European Solid-State Device Research Conference, 2006, p.186-189
2006
- Link zum Volltext
2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2009, p.1-4
2009
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