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Characterization of space charge layer deep defects in n+-CdS/p-CdTe solar cells by temperature dependent capacitance spectroscopy

Journal of applied physics, 2013-04, Vol.113 (14)

2013

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Deep Level Defects in N+‐CdS/P‐CdTe Solar Cells

Materials Challenges in Alternative and Renewable Energy II, 2012, p.297-302

2012

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Thermal Stability Limits of Thin TiSi2 : Effect on Submicron Line Resistance and Shallow Junction Leakage

Journal of the Electrochemical Society, 1994-05, Vol.141 (5), p.1351-1356

1994

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Shallow junctions by out-diffusion from BF2 implanted polycrystalline silicon

Journal of applied physics, 1990-10, Vol.68 (7), p.3707-3713

1990

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Evaluation of Cu Back Contact Related Deep Defects in CdTe Solar Cells

ECS journal of solid state science and technology, 2012-01, Vol.1 (5), p.Q110-Q113

2012

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Characterization of Double‐Diffused Arsenic/Phosphorus Shallow n+p Junctions with TiSi2

Journal of the Electrochemical Society, 1992-12, Vol.139 (12), p.3648-3652

1992

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Characterization of Shallow p + ( BF 2 ) / n Junctions with TiSi2

Journal of the Electrochemical Society, 1992-12, Vol.139 (12), p.3644-3648

1992

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Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells

ECS transactions, 2011, Vol.41 (4), p.233-240

2011

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BF2 implanted polycrystalline silicon gates with and without CoSi2 : microstructure and work functions

Journal of applied physics, 1991-02, Vol.69 (3), p.1510-1517

1991

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Shallow junctions by out-diffusion from arsenic implanted polycrystalline silicon

Journal of applied physics, 1990-10, Vol.68 (7), p.3714-3722

1990

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CdS thin film grown by aerosol-assisted deposition method

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.000147-000150

2012

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Investigation of defects in N+-CDS/P-CdTe solar cells

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.001286-001290

2012

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Large area Cds thin film grown by chemical bath deposition

2011 37th IEEE Photovoltaic Specialists Conference, 2011, p.003750-003753

2011

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High-beta tokamak research

Nuclear fusion, 1985-09, Vol.25 (9), p.1109-1112

1985

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Thick Selective Electroless‐Plated Cobalt‐Nickel Alloy Contacts to CoSi2 : I . Material Properties

Journal of the Electrochemical Society, 1991-07, Vol.138 (7), p.2061-2069

1991

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Working quantum efficiency of cdte solar cell

2010 35th IEEE Photovoltaic Specialists Conference, 2010, p.001912-001914

2010

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Microstructural Changes in W-Polycide Gates Capped with A Thin Polysilicon Layer

MRS proceedings, 1998, Vol.523, Article 109

1998

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W-Polycide Gates with a Thin Polysilicon Layer: Microstructure and Resistivity

Solid state phenomena, 1999-01, Vol.67-68, p.583

1999

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Selective Electroless Plated Ni Contacts to CMOS Junctions with CoSi2

Journal of the Electrochemical Society, 1991-12, Vol.138 (12), p.3618-3624

1991

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The effect of the chemical vapor deposition of tungsten on shallow n + p and p + n junctions using titanium-tungsten as a barrier

Journal of applied physics, 1990-09, Vol.68 (6), p.2839-2844

1990

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RTA Processing of W-Polycide Dual-Gate Sub-Micron Structures for Low-Voltage CMOS Technology

MRS proceedings, 1996, Vol.429, Article 115

1996

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Study of turbulent heating effects in the high beta tokamak Torus II

The Physics of fluids (1958), 1980-10, Vol.23 (10), p.2085-2094

1980

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The effect of the chemical vapor deposition of tungsten on shallow n+p and p+n junction using titanium-tungsten as a barrier

Journal of applied physics, 1990, Vol.68 (6), p.2839-2844

1990

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The effect of the chemical vapor deposition of tungsten on shallow n super(+)p and p super(+)n junctions using titanium-tungsten as a barrier

Journal of applied physics, 1990-01, Vol.68 (6), p.2839-2844

1990

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Electrical degradation of Al/TiW/CoSi2 shallow junctions

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 1991-01, Vol.9 (1), p.69-73

1991

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Characterization of space charge layer deep defects in n+-CdS/p-CdTe solar cells by temperature dependent capacitance spectroscopy

Deep Level Defects in N+‐CdS/P‐CdTe Solar Cells

Thermal Stability Limits of Thin TiSi2 : Effect on Submicron Line Resistance and Shallow Junction Leakage

Shallow junctions by out-diffusion from BF2 implanted polycrystalline silicon

Evaluation of Cu Back Contact Related Deep Defects in CdTe Solar Cells

Characterization of Double‐Diffused Arsenic/Phosphorus Shallow n+p Junctions with TiSi2

Characterization of Shallow p + ( BF 2 ) / n Junctions with TiSi2

Investigation of Electrically Active Defects in n-CdS/p-CdTe Solar Cells

BF2 implanted polycrystalline silicon gates with and without CoSi2 : microstructure and work functions

Shallow junctions by out-diffusion from arsenic implanted polycrystalline silicon

CdS thin film grown by aerosol-assisted deposition method

Investigation of defects in N+-CDS/P-CdTe solar cells

Large area Cds thin film grown by chemical bath deposition

High-beta tokamak research

Thick Selective Electroless‐Plated Cobalt‐Nickel Alloy Contacts to CoSi2 : I . Material Properties

Working quantum efficiency of cdte solar cell

Microstructural Changes in W-Polycide Gates Capped with A Thin Polysilicon Layer

W-Polycide Gates with a Thin Polysilicon Layer: Microstructure and Resistivity

Selective Electroless Plated Ni Contacts to CMOS Junctions with CoSi2

The effect of the chemical vapor deposition of tungsten on shallow n + p and p + n junctions using titanium-tungsten as a barrier

RTA Processing of W-Polycide Dual-Gate Sub-Micron Structures for Low-Voltage CMOS Technology

Study of turbulent heating effects in the high beta tokamak Torus II

The effect of the chemical vapor deposition of tungsten on shallow n+p and p+n junction using titanium-tungsten as a barrier

The effect of the chemical vapor deposition of tungsten on shallow n super(+)p and p super(+)n junctions using titanium-tungsten as a barrier

Electrical degradation of Al/TiW/CoSi2 shallow junctions

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