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Microelectronics and reliability, 2023-11, Vol.150, p.115156, Article 115156
2023
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Journal of applied physics, 2021-09, Vol.130 (10)
2021
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Electronics letters, 2010, Vol.46 (4), p.299-301
2010
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Applied physics letters, 2017-04, Vol.110 (16)
2017
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Microelectronics and reliability, 2022-11, Vol.138, p.114693, Article 114693
2022
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Solid-state electronics, 2023-06, Vol.204, p.108654, Article 108654
2023
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Journal of applied physics, 2007-03, Vol.101 (5), p.054508-054508-6
2007
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Microelectronics Reliability, 2020-11, Vol.114 (ISSN 0026-2714), p.113806, Article 113806
2020
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Journal of electromagnetic waves and applications, 2021-10, Vol.35 (15), p.2051-2061
2021
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Monte Carlo study of the operation of GaN planar nanodiodes as sub-THz emitters in resonant circuits
2014
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Solid-state electronics, 2017-01, Vol.127, p.13-19
2017
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Journal of applied physics, 2009-09, Vol.106 (5), p.054511-1-7
2009
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Journal of physics. D, Applied physics, 2011-02, Vol.44 (7), p.075105
2011
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Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.1719-1723
2015
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Electronics letters, 2006, Vol.42 (13), p.779-780
2006
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Semiconductor science and technology, 2015-03, Vol.30 (3), p.35001
2015
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Applied physics letters, 2015-05, Vol.106 (19)
2015
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Applied physics letters, 2014-02, Vol.104 (7)
2014
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Applied physics letters, 2018-07, Vol.113 (4)
2018
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Journal of applied physics, 2012-06, Vol.111 (11), p.113705-113705-9
2012
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Electronics letters, 2012-12, Vol.48 (25), p.1627-1629
2012
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Electronics letters, 2008, Vol.44 (11), p.696-698
2008
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Solid-state electronics, 2010-11, Vol.54 (11), p.1434-1437
2010
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2159-2163
2012
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Electronics letters, 2007, Vol.43 (12), p.691-692
2007
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