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Micro and Nano Engineering, 2020-11, Vol.9, p.100070, Article 100070
2020
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Microelectronic engineering, 2020-07, p.111397, Article 111397
2020
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Microelectronic engineering, 2020-03, Vol.225, p.111253, Article 111253
2020
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Sensors and actuators. B, Chemical, 2007-10, Vol.127 (1), p.186-192
2007
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Sensors and actuators. B, Chemical, 2013-02, Vol.177, p.776-784
2013
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Applied surface science, 2006-07, Vol.252 (19), p.7144-7147
2006
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Microelectronic engineering, 2011-08, Vol.88 (8), p.2359-2363
2011
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2002-06, Vol.485 (1), p.166-171
2002
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Ultramicroscopy, 2007-09, Vol.107 (9), p.865-868
2007
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Microelectronic engineering, 2008, Vol.85 (1), p.93-99
2008
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Semiconductor science and technology, 2002-01, Vol.17 (1), p.65-76
2002
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-08, Vol.222 (3), p.622-626
2004
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2003-12, Vol.211 (4), p.556-561
2003
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Ultramicroscopy, 2004-07, Vol.100 (1-2), p.1-7
2004
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Journal of physics. D, Applied physics, 2002-09, Vol.35 (17), p.2236-2236
2002
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Journal of physics. D, Applied physics, 2000-03, Vol.33 (6), p.692-695
2000
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Microelectronic engineering, 2004-06, Vol.73, p.116-119
2004
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Ultramicroscopy, 2004, Vol.100 (1), p.1-7
2004
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004, Vol.222 (3), p.627-631
2004
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-08, Vol.222 (3-4), p.627-631
2004
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-04, Vol.217 (2), p.347-351
2004
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Microelectronic engineering, 2004-06, Vol.73, p.120-125
2004
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Semiconductor science and technology, 2002-01, Vol.17 (1), p.65-76
2002
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2002-12, Vol.197 (3), p.282-287
2002
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Journal of physics. D, Applied physics, 2002-09, Vol.35 (19), p.2236-2236
2002
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- Engineering, Electrical & Electronic
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- Atomic, Molecular And Charged-Particle Sources And Detectors
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- Condensed Matter: Electronic Structure, Electrical, Magnetic, And Optical Properties
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Kollektion
Zeitschrift / Serie
- Journal Of Physics. D, Applied Physics
- Microelectronic Engineering
- Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms
- Ultramicroscopy
- Semiconductor Science And Technology
- Sensors And Actuators. B, Chemical
- Applied Surface Science
- Journal Of Physics. Conference Series
- Journal Of Physics: Conference Series
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures