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IEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.893-899
2012
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2013 IEEE International Conference on Microelectronic Systems Education (MSE), 2013, p.25-27
2013
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2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 2023, p.48-59
2023
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2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 2021, p.67-73
2021
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IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.855-861
2011
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2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 2022, p.50-60
2022
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Journal of instrumentation, 2012-05, Vol.7 (5), p.1-11
2012
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Microelectronic engineering, 2004-04, Vol.72 (1), p.140-148
2004
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2012 18th IEEE-NPSS Real Time Conference, 2012, p.1-6
2012
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IEEE transactions on nanotechnology, 2017-05, Vol.16 (3), p.417-430
2017
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Journal of electronic testing, 2018-04, Vol.34 (2), p.123-134
2018
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Journal of electronic testing, 2003-08, Vol.19 (4), p.377-386
2003
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Constructive Side-Channel Analysis and Secure Design, p.117-132
Link zum Volltext
Journal of electronic testing, 2017-08, Vol.33 (4), p.515-527
2017
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Journal of electronic testing, 2019-02, Vol.35 (1), p.59-75
2019
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IEEE transactions on nuclear science, 2013-10, Vol.60 (5), p.3603-3608
2013
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IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2386-2391
2013
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2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, p.274-280
2011
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2011 IEEE International Conference on Microelectronic Systems Education, 2011, p.41-42
2011
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Proceedings International Test Conference 2001 (Cat. No.01CH37260), 2001, p.1039-1048
2001
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23rd IEEE VLSI Test Symposium (VTS'05), 2005, p.343-348
2005
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2009 IEEE International Conference on Microelectronic Systems Education, 2009, p.37-40
2009
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2009 3rd International Workshop on Advances in sensors and Interfaces, 2009, p.64-69
2009
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2021 XXXVI Conference on Design of Circuits and Integrated Systems (DCIS), 2021, p.1-5
2021
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