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The extraction of sodium and potassium picrates with poly[(benzo-15-crown-5)maleimide], poly[(benzo-15-crown-5) maleimide-alt-α-methylstyrene] and benzo-15-crown-5

Polymer bulletin (Berlin, Germany), 1994-09, Vol.33 (4), p.425-430

1994

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ChemInform Abstract: Synthesis of New Heteropolycyclic Bis-carboxamid: 3,5-Dichloro-N,N′(p- chlorophenyl)dithieno(3,2-b:2′,3′-d)furan-2,6-carboxamide

ChemInform, 1993-06, Vol.24 (26), p.no-no

1993

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Imaging Musculoskeletal Manifestations of Pediatric Hematologic Malignancies

American journal of roentgenology (1976), 2020-02, Vol.214 (2), p.455-464

2020

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Heat has larger impacts on labor in poorer areas

Environmental Research Communications, 2021-09, Vol.3 (9), p.95001

2021

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Heat has larger impacts on labor in poorer areas One Sentence Summary: Wealth moderates the negative income effects of heat

Environmental Research Communications, 2021-09, Vol.3 (9)

2021

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50-NM SELF-ALIGNED HIGH ELECTRON-MOBILITY TRANSISTORS ON GaAs SUBSTRATES WITH EXTREMELY HIGH EXTRINSIC TRANSCONDUCTANCE AND HIGH GAIN

International journal of high speed electronics, 2011-09, Vol.20 (3), p.393-398

2011

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Contrast enhanced Gd-DTPA magnetic resonance imaging in the evaluation of rheumatoid arthritis during a clinical trial with DMARDs. A prospective two-year follow-up study on hand joints in 31 patients

Clinical and experimental rheumatology, 1997-03, Vol.15 (2), p.151

1997

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Precontrast and postcontrast (Gd-DTPA) magnetic resonance imaging of hand joints in patients with rheumatoid arthritis

Clinical radiology, 1993-09, Vol.48 (3), p.176-181

1993

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Comparison of Ar-, O-, and Cl-ion implant-damage gettering of gold from silicon using metal oxide silicon techniques

Journal of applied physics, 1982-09, Vol.53 (9), p.6168-6173

1982

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The platinum doped MOST: A memory storage element

IEEE transactions on electron devices, 1981-09, Vol.28 (9), p.1014-1017

1981

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C-V hysteresis in metal-oxide-semiconductor structures resulting from Pt doping of the gate oxide

Journal of applied physics, 1984-01, Vol.56 (10), p.3014-3017

1984

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Prognostic Value of Contrast Enhanced Gd-DTPA MRI for Development of Bone Erosive Changes in Rheumatoid Arthritis

Rheumatology (Oxford, England), 1996-01, Vol.35 (suppl-3), p.26-30

1996

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Lifetime in ion implant damage gettered silicon by MOS voltage ramping

IEEE transactions on electron devices, 1979-03, Vol.26 (3), p.245-246

1979

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Annealing of SiSiO2 interface states using Ar-ion-implant-damage-gettering

Solid-state electronics, 1980-01, Vol.23 (12), p.1249-1254

1980

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Prognostic value of contrast enhanced Gd-DTPA MRI for development of bone erosive changes in rheumatoid arthritis

British journal of rheumatology, 1996-12, Vol.35, p.26-30

1996

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Investigation of Ar ion implant gettering of gold in silicon by m.o.s. and Rutherford backscattering techniques

IEE proceedings. Part I, Solid-state and electron devices, 1980, Vol.127 (1), p.29

1980

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A coplanar-to-microstrip transition for W-band circuit fabrication with 100- mu m-thick GaAs wafers

IEEE microwave and guided wave letters, 1993-02, Vol.3 (2), p.29-31, Article 1272

1993

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Implant gettering and ion beam detection of generation impurities in silicon

Microelectronics, 1982-11, Vol.13 (6), p.23-28

1982

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Ar ion implant damage gettering of generation impurities in silicon employing voltage ramping and nitrogen backscattering

IEE journal on solid-state and electron devices, 1979, Vol.3 (5), p.127

1979

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Ion implant gettering of generation impurities in silicon investigated using PIXE and Rutherford backscattering spectrometry

Nuclear instruments and methods in physics research, 1981-12, Vol.191 (1), p.63-69

1981

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Proton-induced X-ray emission studies of generation impurities in silicon

IEE proceedings. Part I, Solid-state and electron devices, 1981, Vol.128 (2), p.68

1981

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MM-wave MIMIC receiver components

IEEE 1991 Microwave and Millimeter-Wave Monolithic Circuits Symposium. Digest of Papers, 1991, p.51-54

1991

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The extraction of sodium and potassium picrates with poly[(benzo-15-crown-5)maleimide], poly[(benzo-15-crown-5) maleimide-alt-α-methylstyrene] and benzo-15-crown-5

ChemInform Abstract: Synthesis of New Heteropolycyclic Bis-carboxamid: 3,5-Dichloro-N,N′(p- chlorophenyl)dithieno(3,2-b:2′,3′-d)furan-2,6-carboxamide

Imaging Musculoskeletal Manifestations of Pediatric Hematologic Malignancies

Heat has larger impacts on labor in poorer areas

Heat has larger impacts on labor in poorer areas One Sentence Summary: Wealth moderates the negative income effects of heat

50-NM SELF-ALIGNED HIGH ELECTRON-MOBILITY TRANSISTORS ON GaAs SUBSTRATES WITH EXTREMELY HIGH EXTRINSIC TRANSCONDUCTANCE AND HIGH GAIN

Contrast enhanced Gd-DTPA magnetic resonance imaging in the evaluation of rheumatoid arthritis during a clinical trial with DMARDs. A prospective two-year follow-up study on hand joints in 31 patients

Precontrast and postcontrast (Gd-DTPA) magnetic resonance imaging of hand joints in patients with rheumatoid arthritis

Comparison of Ar-, O-, and Cl-ion implant-damage gettering of gold from silicon using metal oxide silicon techniques

The platinum doped MOST: A memory storage element

C-V hysteresis in metal-oxide-semiconductor structures resulting from Pt doping of the gate oxide

Prognostic Value of Contrast Enhanced Gd-DTPA MRI for Development of Bone Erosive Changes in Rheumatoid Arthritis

Lifetime in ion implant damage gettered silicon by MOS voltage ramping

Annealing of SiSiO2 interface states using Ar-ion-implant-damage-gettering

Prognostic value of contrast enhanced Gd-DTPA MRI for development of bone erosive changes in rheumatoid arthritis

Investigation of Ar ion implant gettering of gold in silicon by m.o.s. and Rutherford backscattering techniques

A coplanar-to-microstrip transition for W-band circuit fabrication with 100- mu m-thick GaAs wafers

Implant gettering and ion beam detection of generation impurities in silicon

Ar ion implant damage gettering of generation impurities in silicon employing voltage ramping and nitrogen backscattering

Ion implant gettering of generation impurities in silicon investigated using PIXE and Rutherford backscattering spectrometry

Proton-induced X-ray emission studies of generation impurities in silicon

MM-wave MIMIC receiver components

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