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Method and mechanism of vapor phase treatment–total reflection X-ray fluorescence for trace element analysis on silicon wafer surface

Spectrochimica acta. Part B: Atomic spectroscopy, 2010-12, Vol.65 (12), p.1022-1028

2010

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Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface

Spectrochimica acta. Part B: Atomic spectroscopy, 2013-12, Vol.90, p.72-82

2013

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Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysis

Journal of crystal growth, 2000-03, Vol.210 (1), p.388-394

2000

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Preface to the 'spotlight on novel methods of X-ray generation'

X-ray spectrometry, 2012-07, Vol.41 (4), p.187-187

2012

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Applications of Synchrotron Radiation to Materials Analysis

1, 1996

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High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Spectrochimica acta. Part B: Atomic spectroscopy, 2000-09, Vol.55 (9), p.1385-1395

2000

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Construction of a Novel Chemical Model for the Nerve Transmission System Using Self-Oscillating Multi-Phases Liquid Membrane System

Chemistry letters, 1997-10, Vol.26 (10), p.1031-1032

1997

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Barrier height imaging investigation of liquid crystal molecules adsorbed on graphite

JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE, 1992, Vol.31 (10), p.3452-3454

1992

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Mixture of HIBA and glycolic acid as eluent for effective separation of yttrium and dysprosium by HPLC

Fresenius' journal of analytical chemistry, 1999-02, Vol.363 (4), p.424-426

1999

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X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU

Journal of synchrotron radiation, 1998-05, Vol.5 (3), p.1114-1116

1998

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Tunnel gap imaging investigation of voltage dependence of molecular images obtained by scanning tunneling microscope

Japanese Journal of Applied Physics, 1995, Vol.34 (7A), p.3642-3646

1995

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Correlation between Oscillation Modes and Penetration Rate of Protons in the Three-Phase-Liquid-Membrane Oscillation System

Journal of colloid and interface science, 1997-03, Vol.187 (2), p.544-546

1997

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Conversion electron yield X-ray absorption fine structure measurements under atmospheric conditions

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.235-239

1999

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Ultratrace analysis by synchrotron radiation

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1991-06, Vol.303 (3), p.544-551

Gohshi, Yohichi

1991

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A wavelength dispersive X–ray spectrometer for small area X–ray fluorescence spectroscopy at SPring–8 BL39XU

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.171-177

1999

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Examination of the Photochemical Curing and Degradation of Oil Paints by Laser Raman Spectroscopy

Applied spectroscopy, 1997-08, Vol.51 (8), p.1218-1223

1997

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A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle

Analytical Sciences, 1997/12/10, Vol.13(6), pp.997-1001

1997

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High-performance current-voltage measurement system for scanning tunneling spectroscopy of deposited molecules

Japanese Journal of Applied Physics, 1995, Vol.34 (4A), p.2055-2056

1995

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Surface chemical analysis: Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Surface and interface analysis, 2002, Vol.33 (4), p.369-370

GOHSHI, Yohichi

2002

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Chemical State Observation of Ni Adsorbed on Zeolite by the Conversion-Electron-Yield Method

Analytical Sciences, 1997/12/10, Vol.13(6), pp.1003-1005

1997

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Surface enhancement effect on the diffuse reflectance infrared Fourier transform spectra of compounds having a pyridine ring

Spectrochimica acta. Part B: Atomic spectroscopy, 1999-01, Vol.54 (1), p.205-214

1999

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Spectro-Diffractometry for Chemical-State Analysis Based on In-Advance Simulations

Bulletin of the Chemical Society of Japan, 1998-10, Vol.71 (10), p.2375-2380

1998

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Improvement in the detection limits of elastic recoil detection analysis (ERDA) using a time-of-flight detection

Japanese Journal of Applied Physics, 1997-07, Vol.36 (7B), p.L952-L954

1997

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Atomic-Resolution X-Ray Fluorescence Holography of Zn (0.02 wt%) in a GaAs Wafer

Analytical Sciences, 1998, Vol.14(5), pp.987-990

1998

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Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Surface and interface analysis, 2002-04, Vol.33 (4), p.369-370

Gohshi, Yohichi

2002

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Method and mechanism of vapor phase treatment–total reflection X-ray fluorescence for trace element analysis on silicon wafer surface

Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface

Analysis of trace Co in synthetic diamonds using synchrotron radiation excited X-ray fluorescence analysis

Preface to the 'spotlight on novel methods of X-ray generation'

Applications of Synchrotron Radiation to Materials Analysis

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Construction of a Novel Chemical Model for the Nerve Transmission System Using Self-Oscillating Multi-Phases Liquid Membrane System

Barrier height imaging investigation of liquid crystal molecules adsorbed on graphite

Mixture of HIBA and glycolic acid as eluent for effective separation of yttrium and dysprosium by HPLC

X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU

Tunnel gap imaging investigation of voltage dependence of molecular images obtained by scanning tunneling microscope

Correlation between Oscillation Modes and Penetration Rate of Protons in the Three-Phase-Liquid-Membrane Oscillation System

Conversion electron yield X-ray absorption fine structure measurements under atmospheric conditions

Ultratrace analysis by synchrotron radiation

A wavelength dispersive X–ray spectrometer for small area X–ray fluorescence spectroscopy at SPring–8 BL39XU

Examination of the Photochemical Curing and Degradation of Oil Paints by Laser Raman Spectroscopy

A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle

High-performance current-voltage measurement system for scanning tunneling spectroscopy of deposited molecules

Surface chemical analysis: Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

Chemical State Observation of Ni Adsorbed on Zeolite by the Conversion-Electron-Yield Method

Surface enhancement effect on the diffuse reflectance infrared Fourier transform spectra of compounds having a pyridine ring

Spectro-Diffractometry for Chemical-State Analysis Based on In-Advance Simulations

Improvement in the detection limits of elastic recoil detection analysis (ERDA) using a time-of-flight detection

Atomic-Resolution X-Ray Fluorescence Holography of Zn (0.02 wt%) in a GaAs Wafer

Summary of ISO/TC 201 Standard: VI ISO 14706:2000-Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total reflection x-ray fluorescence (TXRF) spectroscopy

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