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Test Sample for the Spatially Resolved Quantification of Illicit Drugs on Fingerprints Using Imaging Mass Spectrometry

Analytical chemistry (Washington), 2015-05, Vol.87 (10), p.5444-5450

2015

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Biomimetic Sniffing Improves the Detection Performance of a 3D Printed Nose of a Dog and a Commercial Trace Vapor Detector

Scientific reports, 2016-12, Vol.6 (1), p.36876, Article 36876

2016

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Rapid Analysis of Trace Drugs and Metabolites Using a Thermal Desorption DART-MS Configuration

Analytical methods, 2016-01, Vol.8 (35), p.6494-6499

2016

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Bandlike Transport in Strongly Coupled and Doped Quantum Dot Solids: A Route to High-Performance Thin-Film Electronics

Nano letters, 2012-05, Vol.12 (5), p.2631-2638

2012

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Nanoporous Silicon Combustion: Observation of Shock Wave and Flame Synthesis of Nanoparticle Silica

ACS applied materials & interfaces, 2015-11, Vol.7 (45), p.25539-25545

2015

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Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors

Sensors (Basel, Switzerland), 2015-11, Vol.15 (11), p.29618-29634

2015

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Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

Analytical chemistry (Washington), 2004-06, Vol.76 (11), p.3199-3207

2004

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Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

Rapid communications in mass spectrometry, 1998-10, Vol.12 (19), p.1303-1312

1998

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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

Analytical chemistry (Washington), 2007-02, Vol.79 (3), p.828-836

2007

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Secondary ion mass spectrometry using cluster primary ion beams

Applied surface science, 2003-01, Vol.203, p.209-213

2003

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Aerosol Collection Efficiency of a Graded Metal-Fiber Filter at High Airflow Velocity (10 m s-1)

Aerosol science and technology, 2011-03, Vol.45 (3), p.336-342

2011

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Depth profiling using C60+ SIMS : Deposition and topography development during bombardment of silicon

Applied surface science, 2006-07, Vol.252 (19), p.6521-6525

2006

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Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Applied surface science, 2006-07, Vol.252 (19), p.6502-6505

2006

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Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt–Co alloy multilayer by SIMS using a Buckminsterfullerene (C 60) source

Applied surface science, 2007-05, Vol.253 (14), p.6000-6005

2007

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Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects

Analytical chemistry (Washington), 2007-02, Vol.79 (3), p.837-845

2007

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Visualizing shed skin cells in fingerprint residue using dark‐field microscopy

Journal of forensic sciences, 2021-07, Vol.66 (4), p.1257-1266

2021

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Trace detection and chemical analysis of homemade fuel-oxidizer mixture explosives: Emerging challenges and perspectives

TrAC, Trends in analytical chemistry (Regular ed.), 2020-10, Vol.131, p.116023, Article 116023

2020

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Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles

The journal of physical chemistry. B, 2001-05, Vol.105 (18), p.3950-3956

2001

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High-speed thermo-microscope for imaging thermal desorption phenomena

Review of scientific instruments, 2012-07, Vol.83 (7), p.075113-075113

2012

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UV photopatterning of alkanethiolate monolayers self-assembled on gold and silver

Journal of the American Chemical Society, 1993-06, Vol.115 (12), p.5305-5306

1993

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DART-MS Spectral Similarity of Infrared Thermally Desorbed Solid Particulate and Solution Cast Propellant Samples

Journal of the American Society for Mass Spectrometry, 2021-04, Vol.32 (4), p.1033-1040

2021

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Incorporation of Cesium Borocaptate onto Silicon Nanowires as a Delivery Vehicle for Boron Neutron Capture Therapy

Chemistry of materials, 2010-01, Vol.22 (2), p.279-281

2010

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Chemical discrimination of multilayered paint cross sections for potential forensic applications using time‐of‐flight secondary ion mass spectrometry

Surface and interface analysis, 2018-09, Vol.50 (9), p.889-896

2018

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Nanocalorimetry of explosives prepared by inkjet printing

Thermochimica acta, 2020-03, Vol.685, p.178510, Article 178510

2020

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Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.920-921

2014

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Test Sample for the Spatially Resolved Quantification of Illicit Drugs on Fingerprints Using Imaging Mass Spectrometry

Biomimetic Sniffing Improves the Detection Performance of a 3D Printed Nose of a Dog and a Commercial Trace Vapor Detector

Rapid Analysis of Trace Drugs and Metabolites Using a Thermal Desorption DART-MS Configuration

Bandlike Transport in Strongly Coupled and Doped Quantum Dot Solids: A Route to High-Performance Thin-Film Electronics

Nanoporous Silicon Combustion: Observation of Shock Wave and Flame Synthesis of Nanoparticle Silica

Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors

Depth Profiling of 4-Acetamindophenol-Doped Poly(lactic acid) Films Using Cluster Secondary Ion Mass Spectrometry

Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 1. Investigation of Depth Profile Characteristics

Secondary ion mass spectrometry using cluster primary ion beams

Aerosol Collection Efficiency of a Graded Metal-Fiber Filter at High Airflow Velocity (10 m s-1)

Depth profiling using C60+ SIMS : Deposition and topography development during bombardment of silicon

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt–Co alloy multilayer by SIMS using a Buckminsterfullerene (C 60) source

Temperature-Controlled Depth Profiling of Poly(methyl methacrylate) Using Cluster Secondary Ion Mass Spectrometry. 2. Investigation of Sputter-Induced Topography, Chemical Damage, and Depolymerization Effects

Visualizing shed skin cells in fingerprint residue using dark‐field microscopy

Trace detection and chemical analysis of homemade fuel-oxidizer mixture explosives: Emerging challenges and perspectives

Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles

High-speed thermo-microscope for imaging thermal desorption phenomena

UV photopatterning of alkanethiolate monolayers self-assembled on gold and silver

DART-MS Spectral Similarity of Infrared Thermally Desorbed Solid Particulate and Solution Cast Propellant Samples

Incorporation of Cesium Borocaptate onto Silicon Nanowires as a Delivery Vehicle for Boron Neutron Capture Therapy

Chemical discrimination of multilayered paint cross sections for potential forensic applications using time‐of‐flight secondary ion mass spectrometry

Nanocalorimetry of explosives prepared by inkjet printing

Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

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