Sortiert nach
Microelectronics and reliability, 2023-11, Vol.150, p.115102, Article 115102
2023
Volltextzugriff (PDF)
IEEE transactions on electron devices, 2019-06, Vol.66 (6), p.2699-2703
2019
Volltextzugriff (PDF)
IEEE transactions on components, packaging, and manufacturing technology (2011), 2022-11, Vol.12 (11), p.1740-1747
2022
Volltextzugriff (PDF)
IEEE electron device letters, 2021-05, Vol.42 (5), p.731-734
2021
Volltextzugriff (PDF)
Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2278-2282
2012
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-09, Vol.148, p.115194, Article 115194
2023
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-11, Vol.150, p.115189, Article 115189
2023
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-11, Vol.150, p.115079, Article 115079
2023
Volltextzugriff (PDF)
Microelectronics and reliability, 2009-09, Vol.49 (9), p.958-962
2009
Volltextzugriff (PDF)
Source Separation Using Sensor's Frequency Response: Theory and Practice on Carbon Nanotubes Sensors
2019
Volltextzugriff (PDF)
Journal of electronic materials, 2024-08, Vol.53 (8), p.4421-4431
2024
Volltextzugriff (PDF)
Microelectronics and reliability, 2014-09, Vol.54 (9-10), p.2013-2016
2014
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-11, Vol.150, p.115088, Article 115088
2023
Volltextzugriff (PDF)
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC), 2023, p.396-403
2023
Volltextzugriff (PDF)
Microelectronics and reliability, 2021-11, Vol.126, p.114217, Article 114217
2021
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-04, Vol.143, p.114934, Article 114934
2023
Volltextzugriff (PDF)
Microelectronics and reliability, 2023-11, Vol.150, p.115087, Article 115087
2023
Volltextzugriff (PDF)
2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.4C.3-1-4C.3-6
2022
Volltextzugriff (PDF)
Microelectronics and reliability, 2017-09, Vol.76-77, p.1-5
2017
Volltextzugriff (PDF)
In-situ characterization of thermomechanical behavior of copper nano-interconnect for 3D integration
2022
Volltextzugriff (PDF)
Thin solid films, 2020-03, Vol.698, p.137874, Article 137874
2020
Volltextzugriff (PDF)
2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE), 2021, p.1-5
2021
Volltextzugriff (PDF)
2019 IEEE International Integrated Reliability Workshop (IIRW), 2019, p.1-5
2019
Volltextzugriff (PDF)
Microelectronics and reliability, 2017-09, Vol.76-77, p.362-367
2017
Volltextzugriff (PDF)
Microelectronics and reliability, 2009-09, Vol.49 (9), p.1273-1277
2009
Volltextzugriff (PDF)
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Engineering Sciences
- Technology
- Engineering
- Engineering, Electrical & Electronic
- Microelectronics
- Micro And Nanotechnologies
- Physical Sciences
- Physics
- Physics, Applied
- Nanoscience & Nanotechnology
- Science & Technology - Other Topics
- Electronics
- Applied Sciences
- Exact Sciences And Technology
- Integrated Circuits
- Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
- Design. Technologies. Operation Analysis. Testing
- Reliability
- Packaging
Kollektion
- IngentaConnect Journals
- Elsevier ScienceDirect Journals Complete
- IEL
- EZB Electronic Journals Library
- Wiley Online Library - AutoHoldings Journals
- MEDLINE
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- Journals@Ovid
- IngentaConnect Journals
- Wiley Online Library Full Collection 2018
- SpringerLink Journals - AutoHoldings
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- JSTOR
- Nexis Uni
- BMJ Journals
- NUS Single-Journal Subscriptions
Zeitschrift / Serie
- Microelectronics And Reliability
- Special Issue Of 34th European Symposium On Reliability Of Electron Devices, Failure Physics And Analysis, Esref 2023
- Clinical Microbiology And Infection
- Microelectronics Reliability/microelectronics And Reliability
- Microelectronic Engineering
- Dalton Transactions : An International Journal Of Inorganic Chemistry
- Ieee Transactions On Device And Materials Reliability
- Journal Sur L'enseignement Des Sciences Et Technologies De L'information Et Des Systèmes
- Microelectronics Reliability
- Thin Solid Films
Neu hinzugefügt