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Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model

Thin solid films, 2017-06, Vol.631, p.12-22

2017

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Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions

Journal of applied physics, 2020-06, Vol.127 (22)

Franta, Daniel

2020

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Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces

Optics communications, 2005-04, Vol.248 (4-6), p.459-467

2005

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Constitutive equations describing optical activity in theory of dispersion

Journal of the Optical Society of America. B, Optical physics, 2021-02, Vol.38 (2), p.553

2021

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Dispersion model of two-phonon absorption: application to c-Si

Optical materials express, 2014-08, Vol.4 (8), p.1641-1656

2014

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Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems

Journal of the Optical Society of America. B, Optical physics, 2023-11, Vol.40 (11), p.2928

2023

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Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model

Optical materials, 2024-11, Vol.157, p.116133, Article 116133

2024

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Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia

Applied Optics, 2015-11, Vol.54 (31), p.9108

2015

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Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

Advanced optical materials, 2016-11, Vol.4 (11), p.1780-1786

2016

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Dispersion models exhibiting natural optical activity: application to tartaric acid solutions

Journal of the Optical Society of America. B, Optical physics, 2023-12, Vol.40 (12), p.3209

2023

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Optical properties of NiO thin films prepared by pulsed laser deposition technique

Applied surface science, 2005-05, Vol.244 (1), p.426-430

2005

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Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness

Applied surface science, 2017-11, Vol.421, p.687-696

2017

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Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers

Optics express, 2020-01, Vol.28 (1), p.160-174

2020

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Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2019-11, Vol.37 (6)

2019

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Temperature-dependent dispersion model of float zone crystalline silicon

Applied surface science, 2017-11, Vol.421, p.405-419

2017

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Optical characterization of ultrananocrystalline diamond films

Diamond and related materials, 2008-07, Vol.17 (7), p.1278-1282

2008

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Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

Applied surface science, 2017-10, Vol.419, p.942-956

2017

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Modeling of optical constants of diamond-like carbon

Diamond and related materials, 2008-04, Vol.17 (4), p.705-708

2008

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Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

Applied surface science, 2017-11, Vol.421, p.424-429

2017

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Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region

Journal of applied physics, 2018-05, Vol.123 (18)

2018

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Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models

Thin solid films, 2013-05, Vol.534, p.432-441

2013

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Improved combination of scalar diffraction theory and Rayleigh–Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

Thin solid films, 2014-11, Vol.571, p.695-700

2014

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Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films

Diamond and related materials, 2007-04, Vol.16 (4), p.1331-1335

2007

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Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry

Applied surface science, 2017-11, Vol.421, p.420-423

2017

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Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

Thin solid films, 2004-05, Vol.455-456, p.393-398

2004

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Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model

Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions

Comparison of effective medium approximation and Rayleigh–Rice theory concerning ellipsometric characterization of rough surfaces

Constitutive equations describing optical activity in theory of dispersion

Dispersion model of two-phonon absorption: application to c-Si

Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems

Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model

Universal dispersion model for characterization of optical thin films over a wide spectral range: application to hafnia

Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range

Dispersion models exhibiting natural optical activity: application to tartaric acid solutions

Optical properties of NiO thin films prepared by pulsed laser deposition technique

Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness

Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers

Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions

Temperature-dependent dispersion model of float zone crystalline silicon

Optical characterization of ultrananocrystalline diamond films

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

Modeling of optical constants of diamond-like carbon

Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride

Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region

Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models

Improved combination of scalar diffraction theory and Rayleigh–Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films

Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry

Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry

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