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Alignment of electron optical beam shaping elements using a convolutional neural network

Ultramicroscopy, 2021-09, Vol.228, p.113338-113338, Article 113338

2021

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Increasing the Resolution of Transmission Electron Microscopy by Computational Ghost Imaging

Physical review letters, 2024-09, Vol.133 (12), p.123801, Article 123801

2024

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Alloy multilayers and ternary nanostructures by direct-write approach

Nanotechnology, 2017-10, Vol.28 (41), p.415302

2017

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Structure and stability of nickel/nickel oxide core–shell nanoparticles

Journal of physics. Condensed matter, 2011-05, Vol.23 (17), p.175003-7

2011

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Paradoxical Enhancement of the Power Factor of Polycrystalline Silicon as a Result of the Formation of Nanovoids

Journal of electronic materials, 2014-10, Vol.43 (10), p.3812-3816

2014

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Efficient molecule discrimination in electron microscopy through an optimized orbital angular momentum sorter

Physical review. A, 2020-10, Vol.102 (4), Article 043510

2020

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Suspended nanostructures grown by electron beam-induced deposition of Pt and TEOS precursors

Nanotechnology, 2007-11, Vol.18 (44), p.445709-445709 (7)

2007

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Controlled growth of Ni/NiO core–shell nanoparticles: Structure, morphology and tuning of magnetic properties

Applied surface science, 2014-07, Vol.306, p.2-6

2014

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Fabrication by electron beam induced deposition and transmission electron microscopic characterization of sub-10-nm freestanding Pt nanowires

Applied physics letters, 2006-05, Vol.88 (21)

2006

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Electron-Beam Shaping in the Transmission Electron Microscope: Control of Electron-Beam Propagation Along Atomic Columns

Physical review applied, 2019-04, Vol.11 (4), Article 044072

2019

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Controlled co-deposition of FePt nanoparticles embedded in MgO: a detailed investigation of structure and electronic and magnetic properties

Nanotechnology, 2013-12, Vol.24 (49), p.495703-495703

2013

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Young’s double-slit interference experiment with electrons

American journal of physics, 2007-11, Vol.75 (11), p.1053-1055

2007

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Electrical characterization and Auger depth profiling of nanogap electrodes fabricated by I2-assisted focused ion beam

Applied physics letters, 2006-10, Vol.89 (17)

2006

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Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires

Journal of electronic materials, 2015-01, Vol.44 (1), p.371-376

2015

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TEM study of annealed Pt nanostructures grown by electron beam-induced deposition

Physica. E, Low-dimensional systems & nanostructures, 2007-03, Vol.37 (1), p.265-269

2007

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Four slits interference and diffraction experiments

Ultramicroscopy, 2010-04, Vol.110 (5), p.483-487

2010

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Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures

Microelectronic engineering, 2011-08, Vol.88 (8), p.1955-1958

2011

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Using evidence from nanocavities to assess the vibrational properties of external surfaces

Journal of physics. Condensed matter, 2012-03, Vol.24 (10), p.104005-19

2012

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Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles

Journal of microscopy (Oxford), 2007-05, Vol.226 (2), p.140-155

2007

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Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures

Applied physics letters, 2012-09, Vol.101 (11)

2012

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A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2013-01, Vol.699, p.47-50

2013

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Hydrogen and helium bubbles in silicon

Materials science & engineering. R, Reports : a review journal, 2000-04, Vol.27 (1), p.1-52

2000

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Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices

Applied physics letters, 2003-03, Vol.82 (13), p.2172-2174

2003

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Simultaneous increase in electrical conductivity and Seebeck coefficient in highly boron-doped nanocrystalline Si

Nanotechnology, 2013-05, Vol.24 (20), p.205402-205402

2013

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Evidence for H2 at high pressure in the silicon nanocavities after dipping in HF solution

Surface science, 2009-07, Vol.603 (14), p.2188-2192

2009

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Alignment of electron optical beam shaping elements using a convolutional neural network

Increasing the Resolution of Transmission Electron Microscopy by Computational Ghost Imaging

Alloy multilayers and ternary nanostructures by direct-write approach

Structure and stability of nickel/nickel oxide core–shell nanoparticles

Paradoxical Enhancement of the Power Factor of Polycrystalline Silicon as a Result of the Formation of Nanovoids

Efficient molecule discrimination in electron microscopy through an optimized orbital angular momentum sorter

Suspended nanostructures grown by electron beam-induced deposition of Pt and TEOS precursors

Controlled growth of Ni/NiO core–shell nanoparticles: Structure, morphology and tuning of magnetic properties

Fabrication by electron beam induced deposition and transmission electron microscopic characterization of sub-10-nm freestanding Pt nanowires

Electron-Beam Shaping in the Transmission Electron Microscope: Control of Electron-Beam Propagation Along Atomic Columns

Controlled co-deposition of FePt nanoparticles embedded in MgO: a detailed investigation of structure and electronic and magnetic properties

Young’s double-slit interference experiment with electrons

Electrical characterization and Auger depth profiling of nanogap electrodes fabricated by I2-assisted focused ion beam

Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires

TEM study of annealed Pt nanostructures grown by electron beam-induced deposition

Four slits interference and diffraction experiments

Characterization of a new cobalt precursor for focused beam deposition of magnetic nanostructures

Using evidence from nanocavities to assess the vibrational properties of external surfaces

Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles

Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1−xNx intercalated GaAs/GaAs1−xNx:H heterostructures

A 4096-pixel MAPS detector used to investigate the single-electron distribution in a Young–Feynman two-slit interference experiment

Hydrogen and helium bubbles in silicon

Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices

Simultaneous increase in electrical conductivity and Seebeck coefficient in highly boron-doped nanocrystalline Si

Evidence for H2 at high pressure in the silicon nanocavities after dipping in HF solution

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