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Octahedral conversion of a-SiO2 host matrix by pulsed ion implantation

physica status solidi (b), 2015-10, Vol.252 (10), p.2185-2190

2015

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Time-dependent start-up and decay of secondary electron emission in dielectrics

Journal of applied physics, 2010-08, Vol.108 (3)

2010

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Relationships between dielectric breakdown resistance and charge transport in alumina materials—Effects of the microstructure

Journal of the European Ceramic Society, 2007, Vol.27 (2), p.1193-1197

2007

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Secondary electron emission and self-consistent charge transport in semi-insulating samples

Journal of applied physics, 2011-08, Vol.110 (4), p.044111-044111-10

2011

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Alumina based ceramics for high-voltage insulation

Journal of the European Ceramic Society, 2010-03, Vol.30 (4), p.805-817

2010

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Imaging mechanism of carbon nanotubes on insulating and conductive substrates using a scanning electron microscope

Journal of materials science, 2011-12, Vol.46 (23), p.7626-7632

2011

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Electron beam charging of insulators: A self-consistent flight-drift model

Journal of applied physics, 2006-06, Vol.99 (11), p.114110-114110-14

2006

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Photoluminescence of Se-related oxygen deficient center in ion-implanted silica films

Journal of luminescence, 2013-11, Vol.143, p.498-502

2013

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Photoluminescence of Zn2SiO4:Mn nanoparticles in ion-implanted silica films

AIP conference proceedings, 2017, Vol.1886 (1)

2017

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XPS analysis and valence band structure of a low-dimensional SiO2/Si system after Si+ ion implantation

Physica status solidi. A, Applications and materials science, 2011-07, Vol.208 (7), p.1658-1661

2011

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Electron beam charging of insulators with surface layer and leakage currents

Journal of applied physics, 2008-03, Vol.103 (6), p.064110-064110-13

2008

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Defects and localized states in silica layers implanted with lead ions

Journal of luminescence, 2014-10, Vol.154, p.425-429

2014

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Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathodoluminescence

Physica status solidi. A, Applications and materials science, 2012-06, Vol.209 (6), p.1101-1108

2012

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Silicon nanocluster aggregation in SiO2:Si layers

Physica status solidi. A, Applications and materials science, 2010-01, Vol.207 (1), p.117-123

2010

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Luminescent properties of GaN films grown on porous silicon substrate

Journal of luminescence, 2010-03, Vol.130 (3), p.399-403

2010

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Cathodoluminescence of Ge+, Si+, and O+ implanted SiO2 layers and the role of mobile oxygen in defect transformations

Journal of non-crystalline solids, 2002-05, Vol.303 (2), p.218-231

2002

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Cathodoluminescence of SiO x under‐stoichiometric silica layers

Physica status solidi. A, Applications and materials science, 2006-06, Vol.203 (8), p.2049-2057

2006

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Cathodoluminescence of non-stoichiometric silica: The role of oxygen

Journal of non-crystalline solids, 2007-04, Vol.353 (5), p.546-549

2007

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Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina

Journal of applied physics, 2003-10, Vol.94 (8), p.5384-5392

2003

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Cathodoluminescence of SiOx under-stoichiometric silica layers

Physica status solidi. A, Applications and materials science, 2006-06, Vol.203 (8), p.2049-2057

2006

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Ion implantation, luminescence, and cluster growth in silica layers

Journal of non-crystalline solids, 2009-07, Vol.355 (18), p.1107-1110

2009

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Soft X-ray emission spectroscopy of low-dimensional SiO2/Si interfaces after Si+ ion implantation and ion beam mixing

Physica status solidi. A, Applications and materials science, 2010-03, Vol.207 (3), p.743-747

2010

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Thermal decomposition and new luminescence bands in wet, dry, and additional oxygen implanted silica layers

Journal of non-crystalline solids, 2008-03, Vol.354 (15-16), p.1697-1702

2008

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Monte Carlo simulation of secondary electron emission from the insulator SiO2

Journal of electron spectroscopy and related phenomena, 2002-06, Vol.124 (1), p.25-37

2002

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Electronic and vibrational states of oxygen and sulfur molecular ions inside implanted SiO2 films

Journal of non-crystalline solids, 2011-04, Vol.357 (8-9), p.1977-1980

2011

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Octahedral conversion of a-SiO2 host matrix by pulsed ion implantation

Time-dependent start-up and decay of secondary electron emission in dielectrics

Relationships between dielectric breakdown resistance and charge transport in alumina materials—Effects of the microstructure

Secondary electron emission and self-consistent charge transport in semi-insulating samples

Alumina based ceramics for high-voltage insulation

Imaging mechanism of carbon nanotubes on insulating and conductive substrates using a scanning electron microscope

Electron beam charging of insulators: A self-consistent flight-drift model

Photoluminescence of Se-related oxygen deficient center in ion-implanted silica films

Photoluminescence of Zn2SiO4:Mn nanoparticles in ion-implanted silica films

XPS analysis and valence band structure of a low-dimensional SiO2/Si system after Si+ ion implantation

Electron beam charging of insulators with surface layer and leakage currents

Defects and localized states in silica layers implanted with lead ions

Electron microscopic imaging of an ion beam mixed SiO2/Si interface correlated with photo- and cathodoluminescence

Silicon nanocluster aggregation in SiO2:Si layers

Luminescent properties of GaN films grown on porous silicon substrate

Cathodoluminescence of Ge+, Si+, and O+ implanted SiO2 layers and the role of mobile oxygen in defect transformations

Cathodoluminescence of SiO x under‐stoichiometric silica layers

Cathodoluminescence of non-stoichiometric silica: The role of oxygen

Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina

Cathodoluminescence of SiOx under-stoichiometric silica layers

Ion implantation, luminescence, and cluster growth in silica layers

Soft X-ray emission spectroscopy of low-dimensional SiO2/Si interfaces after Si+ ion implantation and ion beam mixing

Thermal decomposition and new luminescence bands in wet, dry, and additional oxygen implanted silica layers

Monte Carlo simulation of secondary electron emission from the insulator SiO2

Electronic and vibrational states of oxygen and sulfur molecular ions inside implanted SiO2 films

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