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Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.3176-3178

2022

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Site-specific Sample Preparation by Concentrated Ar Ion Milling for Post-mortem Atomic Resolution Imaging of Rapidly Solidified Al-Cu Thin Films After Pulsed Laser Melting

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.124-125

2022

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Raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.52-53

2022

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SEM and TEM characterization of plastic deformation structures in Aluminum by EBSD, TKD, and PED-based orientation imaging techniques

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.2182-2183

2018

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Investigation of the Effects of Low-Energy Plasma Treatment on Amorphous Carbon and Graphene Support Films for Cryo-Electron Microscopy

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.996-997

2019

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Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination

Ultramicroscopy, 2007-06, Vol.107 (6), p.431-444

2007

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Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.2108-2109

2014

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Characterization of Shales by Mass Spectrometry during Ion Milling

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1724-1725

2014

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Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.762-763

2014

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Wave-induced dynamic pressure under rubble mound breakwaters with submerged berm: an experimental and numerical study

Coastal engineering (Amsterdam), 2021-12, Vol.170, p.104014, Article 104014

2021

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Delayering of Microelectronic Devices Using an Adjustable Broad-Beam Ion Source

Journal of physics. Conference series, 2013-01, Vol.471 (1), p.12046-4

2013

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Turbulent bulk viscosity

European journal of mechanics, B, Fluids, 2020-11, Vol.84, p.446-454

2020

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Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.862-863

2018

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Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.2554-2555

2019

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Controlled Environments from Sample Preparation to Electron Microscopy Characterization

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.698-699

2019

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Sample Preparation for Aberration Corrected Microscopy

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.998-999

2008

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Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.150-151

2018

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Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.854-855

2018

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Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1118-1119

2018

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Automated Sample Preparation of Nanoscale Devices for FESEM

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.1076-1077

2009

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Nanomilling for Aberration – Corrected TEM and HAADF STEM

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.348-349

2009

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Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

Microscopy and microanalysis, 2011-07, Vol.17 (S2), p.632-633

2011

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Recent Developments in Automated Sample Preparation for FESEM

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.804-805

2003

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In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.522-523

2004

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Aberration correction: Some Advantages and Alternatives

Microscopy and microanalysis, 2004-08, Vol.10 (S03), p.22-23

2004

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Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments

Site-specific Sample Preparation by Concentrated Ar Ion Milling for Post-mortem Atomic Resolution Imaging of Rapidly Solidified Al-Cu Thin Films After Pulsed Laser Melting

Raman Spectroscopy and Electron Microscopy Studies of Ga FIB and Post-FIB Ar Ion Milling's Impact on Si TEM Specimens

SEM and TEM characterization of plastic deformation structures in Aluminum by EBSD, TKD, and PED-based orientation imaging techniques

Investigation of the Effects of Low-Energy Plasma Treatment on Amorphous Carbon and Graphene Support Films for Cryo-Electron Microscopy

Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination

Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams

Characterization of Shales by Mass Spectrometry during Ion Milling

Towards Quantitative 3D Chemical Analysis in TEM Using Quadrant XEDS Detector Geometry

Wave-induced dynamic pressure under rubble mound breakwaters with submerged berm: an experimental and numerical study

Delayering of Microelectronic Devices Using an Adjustable Broad-Beam Ion Source

Turbulent bulk viscosity

Low-Energy Argon Broad Ion Beam and Narrow Ion Beam Milling of In Situ Lift-Out FIB Specimens

Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy

Controlled Environments from Sample Preparation to Electron Microscopy Characterization

Sample Preparation for Aberration Corrected Microscopy

Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits

Automatic End-point Detection for Ar+ Milling of FIB in situ and ex situ Lift-out Specimens from Semiconductor Devices

Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling

Automated Sample Preparation of Nanoscale Devices for FESEM

Nanomilling for Aberration – Corrected TEM and HAADF STEM

Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review

Recent Developments in Automated Sample Preparation for FESEM

In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM

Aberration correction: Some Advantages and Alternatives

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