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Journal of physics. Conference series, 2023-07, Vol.2548 (1), p.12003
2023
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Journal of applied physics, 2008-12, Vol.104 (12), p.123521-123521-6
2008
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2012 Symposium on VLSI Technology (VLSIT), 2012, p.133-134
- Planes, N.
- Weber, O.
- Barral, V.
- Haendler, S.
- Noblet, D.
- Croain, D.
- Bocat, M.
- Sassoulas, P.
- Federspiel, X.
- Cros, A.
- Bajolet, A.
- Richard, E.
- Dumont, B.
- Perreau, P.
- Petit, D.
- Golanski, D.
- Fenouillet-Beranger, C.
- Guillot, N.
- Rafik, M.
- Huard, V.
- Puget, S.
- Montagner, X.
- Jaud, M.
- Rozeau, O.
- Saxod, O.
- Wacquant, F.
- Monsieur, F.
- Barge, D.
- Pinzelli, L.
- Mellier, M.
- Boeuf, F.
- Arnaud, F.
- Haond, M.
2012
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Microelectronics and reliability, 2012-11, Vol.52 (11), p.2513-2520
2012
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Microelectronic engineering, 2013-09, Vol.109, p.90-93
2013
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2015 IEEE International Integrated Reliability Workshop (IIRW), 2015, p.87-90
2015
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Microelectronics and reliability, 2023-11, Vol.150, p.115111, Article 115111
2023
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2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.441-446
2015
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2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.XT.1.1-XT.1.5
2013
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Microelectronic engineering, 2011-07, Vol.88 (7), p.1376-1379
2011
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Microelectronics and reliability, 2021-11, Vol.126, p.114342, Article 114342
2021
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2015 IEEE International Integrated Reliability Workshop (IIRW), 2015, p.134-137
2015
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Microelectronic engineering, 2006-11, Vol.83 (11), p.2402-2406
2006
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Microelectronics and reliability, 2019-07, Vol.98, p.119-123
2019
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Microelectronics and reliability, 2006-09, Vol.46 (9), p.1530-1535
2006
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Microelectronics and reliability, 2018-08, Vol.87, p.106-112
2018
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2023 IEEE International Integrated Reliability Workshop (IIRW), 2023, p.1-8
2023
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2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.623-624
2004
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Microelectronic engineering, 2005-12, Vol.82 (3), p.254-260
2005
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Microelectronics and reliability, 2018-01, Vol.80, p.100-108
2018
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Microelectronics and reliability, 2019-01, Vol.92, p.168-171
2019
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Microelectronics and reliability, 2016-09, Vol.64 (SI), p.158-162
2016
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Microelectronics and reliability, 2007-02, Vol.47 (2), p.295-301
2007
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Microelectronics and reliability, 2019-09, Vol.100-101, p.113422, Article 113422
2019
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2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.3A.5.1-3A.5.6
2012
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