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SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety
IEEE transactions on circuits and systems. I, Regular papers, 2021-06, Vol.68 (6), p.2580-2593
2021
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Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure
2022 IEEE International Test Conference (ITC), 2022, p.539-543
2022
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Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs
2022 IEEE 40th VLSI Test Symposium (VTS), 2022, p.1-8
2022
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An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs
2018 IEEE International Test Conference (ITC), 2018, p.1-8
2018
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Symmetry-based A/M-S BIST (SymBIST): demonstration on a SAR ADC IP
Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.282-285
2020
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Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.282-285
2020
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A Hybrid Flow for Memory Failure Bitmap Classification
2012 IEEE 21st Asian Test Symposium, 2012, p.314-319
2012
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On Using Cell-Aware Methodology for SRAM Bit Cell Testing
2023 IEEE European Test Symposium (ETS), 2023, p.1-4
2023
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A memory volume diagnostics methodology to facilitate production yield learning with embedded memories
2012 SEMI Advanced Semiconductor Manufacturing Conference, 2012, p.388-393
2012
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Embedded memory fail analysis for production yield enhancement
2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 2011, p.1-5
2011
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Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2019, p.21-26
2019
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BIST-Assisted Analog Fault Diagnosis
2021 IEEE European Test Symposium (ETS), 2021, p.1-6
2021
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Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning
IEEE transactions on device and materials reliability, 2020-06, Vol.20 (2), p.329-340
2020
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