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Optimization of tunnel-junction IBC solar cells based on a series resistance model

Solar energy materials and solar cells, 2019-09, Vol.200, p.110036, Article 110036

2019

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New Cell Metallization Patterns for Heterojunction Solar Cells Interconnected by the Smart Wire Connection Technology

Energy procedia, 2015-04, Vol.67, p.203-209

2015

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Influence of the manufacturing process on the electrical properties of thin (<4 nm) Hafnium based high- k stacks observed with CAFM

Microelectronics and reliability, 2007-09, Vol.47 (9), p.1424-1428

2007

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Recent developments of silicon thin film solar cells on glass substrates

Thin solid films, 1999-08, Vol.351 (1-2), p.241-246

1999

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Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

Microelectronics and reliability, 2006-09, Vol.46 (9), p.1736-1740

2006

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Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy

Applied surface science, 2006-01, Vol.252 (6), p.2375-2388

2006

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Alleviating performance and cost constraints in silicon heterojunction cells with HJT 2.0

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019, p.1471-1474

2019

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Shadow masking and tunnel contacts: A low cost process for high efficiency IBC solar cells

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 2019, p.2546-2549

2019

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The effect of the surface layer of tetrahedral amorphous carbon films on their tribological and electron emission properties investigated by atomic force microscopy

Applied physics letters, 2003-06, Vol.82 (22), p.3898-3900

2003

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Nanoscale electron field emissions from the bare, hydrogenated, and graphitelike-layer-covered tetrahedral amorphous carbon films

Journal of applied physics, 2006-02, Vol.99 (4)

2006

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Properties of high efficiency silicon heterojunction cells

Energy procedia, 2011, Vol.8, p.153-159

2011

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Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling

Microelectronics and reliability, 2005-09, Vol.45 (9), p.1568-1571

2005

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Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations

Materials science & engineering. B, Solid-state materials for advanced technology, 2005-01, Vol.116 (2), p.168-174

2005

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Large area deposition technique for PECVD of amorphous silicon [solar cells]

Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, 1997, p.647-650

1997

Volltextzugriff (PDF)

AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis

Microelectronics and reliability, 2004-09, Vol.44 (9), p.1615-1619

2004

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Defect characterization in amorphous silicon based solar cells by subband-gap spectroscopy with constant photocurrent measurements

Applied physics letters, 1991-06, Vol.58 (23), p.2660-2662

1991

Volltextzugriff (PDF)

Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy

Microelectronics and reliability, 2003-09, Vol.43 (9-11), p.1465-1470

2003

Volltextzugriff (PDF)

Sub-bandgap absorption in a-Si:H pin cells illuminated with infrared light

Journal of non-crystalline solids, 1991, Vol.137, p.1169-1172

1991

Volltextzugriff (PDF)

Conducting atomic force microscopy studies for reliability evaluation of ultrathin SiO/sub 2/ films

IEEE International Integrated Reliability Workshop Final Report, 2002, 2002, p.21-28

2002

Volltextzugriff (PDF)

Sub-bandgap absorption in a-Si:H pin cells illuminated with infrared light

Journal of non-crystalline solids, 1991, Vol.137-38, p.1169-1172

1991

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Optimization of tunnel-junction IBC solar cells based on a series resistance model

New Cell Metallization Patterns for Heterojunction Solar Cells Interconnected by the Smart Wire Connection Technology

Influence of the manufacturing process on the electrical properties of thin (<4 nm) Hafnium based high- k stacks observed with CAFM

Recent developments of silicon thin film solar cells on glass substrates

Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures

Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy

Alleviating performance and cost constraints in silicon heterojunction cells with HJT 2.0

Shadow masking and tunnel contacts: A low cost process for high efficiency IBC solar cells

The effect of the surface layer of tetrahedral amorphous carbon films on their tribological and electron emission properties investigated by atomic force microscopy

Nanoscale electron field emissions from the bare, hydrogenated, and graphitelike-layer-covered tetrahedral amorphous carbon films

Properties of high efficiency silicon heterojunction cells

Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling

Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations

Large area deposition technique for PECVD of amorphous silicon [solar cells]

AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis

Defect characterization in amorphous silicon based solar cells by subband-gap spectroscopy with constant photocurrent measurements

Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy

Sub-bandgap absorption in a-Si:H pin cells illuminated with infrared light

Conducting atomic force microscopy studies for reliability evaluation of ultrathin SiO/sub 2/ films

Sub-bandgap absorption in a-Si:H pin cells illuminated with infrared light

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