UB Paderborn / Katalog / Suche / in CDI

2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2014, p.1-8

2014

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Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Microelectronic engineering, 2015-04, Vol.137, p.117-123

2015

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Temperature dependency of the strain distribution induced by TSVs in silicon: A comparative study between micro-Laue and monochromatic nano-diffraction

Microelectronic engineering, 2016-04, Vol.156, p.59-64

2016

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Simultaneous optical measurement of Ge content and Boron doping in strained epitaxial films using a novel data-analysis technique

Materials science in semiconductor processing, 2005-02, Vol.8 (1), p.261-266

2005

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Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by high resolution X-ray diffraction

Materials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.129-132

2008

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Thermo-mechanical study of a 2.5D passive silicon interposer technology: Experimental, numerical and In-Situ stress sensors developments

2013 IEEE International 3D Systems Integration Conference (3DIC), 2013, p.1-7

2013

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IEEE_Xplore

Oxygen and hydrogen sorption in thermally activated yttrium-based getter thin films for MEMS vacuum packaging

2022 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2022, p.1-4

2022

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Accommodation of SiGe strain on a universally compliant porous silicon substrate

Structure and Charge Transport Anisotropy of Polythieno[3,4‐b]‐Thiophene‐co‐Benzodithiophene (PTB7) Oriented by High‐Temperature Rubbing

Time-resolved piezoelectric response in relaxor ferroelectric (Pb0.88La0.12)(Zr0.52Ti0.48)O3 thin films

In situ measurements of the structure and strain of a π-conjugated semiconducting polymer under mechanical load

New insights into thermomechanical behavior of GeTe thin films during crystallization

Thermo-mechanical characterization of passive stress sensors in Si interposer

In-situ characterization of thermomechanical behavior of copper nano-interconnect for 3D integration

Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation

Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Hydrogen sorption in yttrium-based getter thin films

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

Crystallographic Anisotropy Dependence of Interfacial Sliding Phenomenon in a Cu(16)/Nb(16) ARB (Accumulated Rolling Bonding) Nanolaminate

Erratum: “Electrical and ion beam analyses of yttrium and yttrium-titanium getter thin films oxidation” [J. Vac. Sci. Technol. B 39, 054202 (2021)]

β‐Disubstituted Pentacene Derivatives: Thin Film Structural Properties and Four‐Probe Field Effect Mobility

Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling

A Complex Interrelationship between Temperature-Dependent Polyquaterthiophene (PQT) Structural and Electrical Properties

Through-silicon via-induced strain distribution in silicon interposer

Thermo-mechanical characterization of passive stress sensors in Si interposer

Strain and tilt mapping in silicon around copper filled TSVs using advanced X-ray nano-diffraction

Temperature dependency of the strain distribution induced by TSVs in silicon: A comparative study between micro-Laue and monochromatic nano-diffraction

Simultaneous optical measurement of Ge content and Boron doping in strained epitaxial films using a novel data-analysis technique

Local strains induced in silicon channel by a periodic array of nitride capped poly lines investigated by high resolution X-ray diffraction

Thermo-mechanical study of a 2.5D passive silicon interposer technology: Experimental, numerical and In-Situ stress sensors developments

Oxygen and hydrogen sorption in thermally activated yttrium-based getter thin films for MEMS vacuum packaging

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