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Particle isolation for analysis of uranium minor isotopes in individual particles by secondary ion mass spectrometry

Talanta (Oxford), 2007-02, Vol.71 (3), p.1011-1015

2007

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Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometry

Analytical methods, 2017-01, Vol.9 (44), p.6261-6266

2017

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Comparison of ICP-MS and SIMS techniques for determining uranium isotope ratios in individual particles

Talanta (Oxford), 2009-04, Vol.78 (1), p.290-294

2009

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Isotopic analysis of single uranium and plutonium particles by chemical treatment and mass spectrometry

Spectrochimica acta. Part B: Atomic spectroscopy, 2008-11, Vol.63 (11), p.1324-1328

2008

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X-ray photoelectron and X-ray absorption spectroscopic study on β-FeSi2 thin films fabricated by ion beam sputter deposition

Applied surface science, 2010-03, Vol.256 (10), p.3155-3159

2010

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Spectroscopic characterization of β-FeSi2 single crystals and homoepitaxial β-FeSi2 films by XPS and XAS

Applied surface science, 2011-01, Vol.257 (7), p.2950-2954

2011

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Development in fission track-thermal ionization mass spectrometry for particle analysis of safeguards environmental samples

Journal of radioanalytical and nuclear chemistry, 2007-05, Vol.272 (2), p.299-302

2007

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Study on the etching conditions of polycarbonate detectors for particle analysis of safeguards environmental samples

Radiation measurements, 2005-11, Vol.40 (2), p.363-366

2005

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Non-destructive depth profile analysis for surface and buried interface of Ge thin film on Si substrate by high-energy synchrotron radiation x-ray photoelectron spectroscopy

Journal of physics. Conference series, 2008-03, Vol.100 (1), p.012044

2008

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Neutron scattering of iron-based superconductors

Physica. C, Superconductivity, 2011-11, Vol.471 (21-22), p.639-642

2011

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Feasibility study of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry for the determination of particulate uranium in swipe samples from nuclear facilities

Analytica chimica acta, 2004-07, Vol.517 (1), p.215-220

2004

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Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometryElectronic supplementary information (ESI) available. See DOI: 10.1039/c7ay01815k

2017-11

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The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry

Spectrochimica acta. Part B: Atomic spectroscopy, 2003-12, Vol.58 (12), p.2145-2155

2003

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Influence of uranium enrichment on the etching rate of polycarbonate fission track detector containing uranium particles

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2006-04, Vol.245 (2), p.440-444

2006

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Application of sputter etching treatment to the formation of semiconducting silicide film on Si substrate

Transactions of the Materials Research Society of Japan, 2012/06/01, Vol.37(2), pp.245-250

2012

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Plutonium isotopes derived from Nagasaki atomic bomb in the sediment of Nishiyama reservoir at Nagasaki, Japan

Applied radiation and isotopes, 2007-04, Vol.65 (4), p.465-468

2007

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SCREENING OF URANIUM PARTICLES BY TOTAL-REFLECTION X-RAY FLUORESCENCE SPECTROMETRY FOR SAFEGUARDS ENVIRONMENTAL SAMPLE ANALYSIS

Journal of trace and microprobe techniques, 2001-01, Vol.19 (4), p.487-496

2001

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Depth profiling of surface oxidized TiAlN film by synchrotron radiation excited X-ray photoelectron spectroscopy

Surface science, 1997-04, Vol.377, p.197-200

1997

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Development of analytical techniques for ultra trace amounts of nuclear materials in environmental samples using ICP-MS for safeguards

Applied radiation and isotopes, 2000-07, Vol.53 (1-2), p.87-90

2000

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X-ray absorption and X-ray photoelectron spectroscopic studies of air-oxidized chromium nitride thin films

Thin solid films, 1996-08, Vol.281, p.314-317

1996

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X-ray photoelectron and X-ray absorption spectroscopic study on β-FeSi 2 thin films fabricated by ion beam sputter deposition

Applied surface science, 2010-03, Vol.256 (10), p.3155-3159

2010

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Efficient Isotope Ratio Analysis of Uranium Particles in Swipe Samples by Total-Reflection X-ray Fluorescence Spectrometry and Secondary Ion Mass Spectrometry

Journal of nuclear science and technology, 2004-11, Vol.41 (11), p.1027

2004

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High-resolution XAS spectrum of interstitial nitrogen molecules in the surface oxide matrix of TiAlN film

Journal of electron spectroscopy and related phenomena, 1998-03, Vol.88, p.817-820

1998

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Composition dependence of the initial oxidation behaviour of Ti1−xAlxN (x = 0.20, 0.45, 0.65) films studied by XAS and XPS

Surface and interface analysis, 1999-12, Vol.27 (12), p.1098-1106

1999

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Application of Fission Track Technique for the Analysis of Individual Particles Containing Uranium in Safeguard Swipe Samples

Japanese Journal of Applied Physics, 2004-07, Vol.43 (7A), p.L915

2004

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Particle isolation for analysis of uranium minor isotopes in individual particles by secondary ion mass spectrometry

Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometry

Comparison of ICP-MS and SIMS techniques for determining uranium isotope ratios in individual particles

Isotopic analysis of single uranium and plutonium particles by chemical treatment and mass spectrometry

X-ray photoelectron and X-ray absorption spectroscopic study on β-FeSi2 thin films fabricated by ion beam sputter deposition

Spectroscopic characterization of β-FeSi2 single crystals and homoepitaxial β-FeSi2 films by XPS and XAS

Development in fission track-thermal ionization mass spectrometry for particle analysis of safeguards environmental samples

Study on the etching conditions of polycarbonate detectors for particle analysis of safeguards environmental samples

Non-destructive depth profile analysis for surface and buried interface of Ge thin film on Si substrate by high-energy synchrotron radiation x-ray photoelectron spectroscopy

Neutron scattering of iron-based superconductors

Feasibility study of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry for the determination of particulate uranium in swipe samples from nuclear facilities

Chemical state and isotope ratio analysis of individual uranium particles by a combination of micro-Raman spectroscopy and secondary ion mass spectrometryElectronic supplementary information (ESI) available. See DOI: 10.1039/c7ay01815k

The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry

Influence of uranium enrichment on the etching rate of polycarbonate fission track detector containing uranium particles

Application of sputter etching treatment to the formation of semiconducting silicide film on Si substrate

Plutonium isotopes derived from Nagasaki atomic bomb in the sediment of Nishiyama reservoir at Nagasaki, Japan

SCREENING OF URANIUM PARTICLES BY TOTAL-REFLECTION X-RAY FLUORESCENCE SPECTROMETRY FOR SAFEGUARDS ENVIRONMENTAL SAMPLE ANALYSIS

Depth profiling of surface oxidized TiAlN film by synchrotron radiation excited X-ray photoelectron spectroscopy

Development of analytical techniques for ultra trace amounts of nuclear materials in environmental samples using ICP-MS for safeguards

X-ray absorption and X-ray photoelectron spectroscopic studies of air-oxidized chromium nitride thin films

X-ray photoelectron and X-ray absorption spectroscopic study on β-FeSi 2 thin films fabricated by ion beam sputter deposition

Efficient Isotope Ratio Analysis of Uranium Particles in Swipe Samples by Total-Reflection X-ray Fluorescence Spectrometry and Secondary Ion Mass Spectrometry

High-resolution XAS spectrum of interstitial nitrogen molecules in the surface oxide matrix of TiAlN film

Composition dependence of the initial oxidation behaviour of Ti1−xAlxN (x = 0.20, 0.45, 0.65) films studied by XAS and XPS

Application of Fission Track Technique for the Analysis of Individual Particles Containing Uranium in Safeguard Swipe Samples

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