UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 81

Sortiert nach

Thickness and refractive index measurement of a silicon wafer based on an optical comb

Optics express, 2010-08, Vol.18 (17), p.18339-18346

2010

Volltextzugriff (PDF)

Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

Optics express, 2010-04, Vol.18 (9), p.9429

2010

Volltextzugriff (PDF)

An optical absolute position measurement method using a phase-encoded single track binary code

Review of scientific instruments, 2012-11, Vol.83 (11), p.115115-115115

2012

Volltextzugriff (PDF)

Note: High precision angle generator using multiple ultrasonic motors and a self-calibratable encoder

Review of scientific instruments, 2011-11, Vol.82 (11), p.116108-116108-3

2011

Volltextzugriff (PDF)

Frequency scanning laser for high speed phase shifting interferometry

2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference, 2009, p.1-2

2009

Volltextzugriff (PDF)

Absolute angle measurement using a phase-encoded binary graduated disk

Measurement : journal of the International Measurement Confederation, 2016-02, Vol.80, p.288-293

2016

Volltextzugriff (PDF)

Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope with uncertainty Evaluation

International journal of precision engineering and manufacturing, 2008-04, Vol.9 (2), p.18-22

2008

Volltextzugriff (PDF)

Development of an Angle Calibration System with a Combined Silicon Polygon and Angle Interferometer

Japanese Journal of Applied Physics, 2006-06, Vol.45 (6R), p.5293

2006

Volltextzugriff (PDF)

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry

Optics express, 2014-03, Vol.22 (6), p.6486-6494

2014

Volltextzugriff (PDF)

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Measurement : journal of the International Measurement Confederation, 2018-03, Vol.118, p.113-119

2018

Volltextzugriff (PDF)

Optical diffractometer using area cameras for detection of diffraction beam positions and alignment of grating standards

Journal of physics. Conference series, 2018-08, Vol.1065 (14), p.142003

2018

Volltextzugriff (PDF)

Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating

Review of scientific instruments, 2013-05, Vol.84 (5), p.056102-056102

2013

Volltextzugriff (PDF)

Thickness and refractive index measurement of a wafer based on the optical comb

CLEO/QELS: 2010 Laser Science to Photonic Applications, 2010, p.1-2

2010

Volltextzugriff (PDF)

A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer

Measurement science & technology, 2008-07, Vol.19 (7), p.075302-075302 (6)

2008

Volltextzugriff (PDF)

An optical straightness measurement sensor for the KRISS watt balance

Measurement : journal of the International Measurement Confederation, 2015-02, Vol.61, p.257-262

2015

Volltextzugriff (PDF)

An interferometric calibration system for various linear artefacts using active compensation of angular motion errors

Measurement science & technology, 2011-07, Vol.22 (7), p.075304

2011

Volltextzugriff (PDF)

A digital signal processing module for real-time compensation of nonlinearity in a homodyne interferometer using a field-programmable gate array

Measurement science & technology, 2009-01, Vol.20 (1), p.017003-017003 (5)

2009

Volltextzugriff (PDF)

An interferometric Abbe-type comparator for the calibration of internal and external diameter standards

Measurement science & technology, 2010-07, Vol.21 (7), p.075109-075109

2010

Volltextzugriff (PDF)

The dynamic compensation of nonlinearity in a homodyne laser interferometer

Measurement science & technology, 2001-10, Vol.12 (10), p.1734-1738

2001

Volltextzugriff (PDF)

Calibration of angle artifacts and instruments using a high precision angle generator

International journal of precision engineering and manufacturing, 2013-03, Vol.14 (3), p.367-371

2013

Volltextzugriff (PDF)

Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope

Measurement science & technology, 2006-07, Vol.17 (7), p.1792-1800

2006

Volltextzugriff (PDF)

High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels

International journal of precision engineering and manufacturing, 2015-08, Vol.16 (9), p.1955-1961

2015

Volltextzugriff (PDF)

A simple method for the compensation of the nonlinearity in the heterodyne interferometer

Measurement science & technology, 2002-02, Vol.13 (2), p.222-225

2002

Volltextzugriff (PDF)

High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity

Optics express, 2009-02, Vol.17 (3), p.1442-1446

2009

Volltextzugriff (PDF)

Metrological atomic force microscope using a large range scanning dual stage

International journal of precision engineering and manufacturing, 2009-12, Vol.10 (5), p.11-17

2009

Volltextzugriff (PDF)

1 – 25 von 81

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(69)
Mit Volltextzugriff
(75)

Publikationsform

Artikel
(72)
Tagungsberichte
(9)

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(56)
Technology
(29)
Engineering
(20)
Physical Sciences
(20)
Instruments & Instrumentation
(17)
Life Sciences & Biomedicine
(16)
Physics
(12)
Engineering, Multidisciplinary
(11)
Optics
(11)
Physics, Applied
(8)
Lasers
(7)
Biotechnology
(6)
Biotechnology & Applied Microbiology
(6)
Exact Sciences And Technology
(6)
Materials Science
(6)
기계공학
(6)
Animals
(5)
Chemistry
(5)
Escherichia Coli
(5)
Laser Interferometer
(5)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Thickness and refractive index measurement of a silicon wafer based on an optical comb

Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

An optical absolute position measurement method using a phase-encoded single track binary code

Note: High precision angle generator using multiple ultrasonic motors and a self-calibratable encoder

Frequency scanning laser for high speed phase shifting interferometry

Absolute angle measurement using a phase-encoded binary graduated disk

Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope with uncertainty Evaluation

Development of an Angle Calibration System with a Combined Silicon Polygon and Angle Interferometer

Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Optical diffractometer using area cameras for detection of diffraction beam positions and alignment of grating standards

Note: Nonlinearity error compensated absolute planar position measurement using a two-dimensional phase-encoded binary grating

Thickness and refractive index measurement of a wafer based on the optical comb

A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer

An optical straightness measurement sensor for the KRISS watt balance

An interferometric calibration system for various linear artefacts using active compensation of angular motion errors

A digital signal processing module for real-time compensation of nonlinearity in a homodyne interferometer using a field-programmable gate array

An interferometric Abbe-type comparator for the calibration of internal and external diameter standards

The dynamic compensation of nonlinearity in a homodyne laser interferometer

Calibration of angle artifacts and instruments using a high precision angle generator

Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope

High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels

A simple method for the compensation of the nonlinearity in the heterodyne interferometer

High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity

Metrological atomic force microscope using a large range scanning dual stage

Suchergebnisse filtern