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Performance enhancement of dual‐polarised dipole antenna using parasitic elements

IET microwaves, antennas & propagation, 2022-10, Vol.16 (12), p.743-751

2022

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Research on temperature characteristic of parasitic capacitance in MEMS capacitive accelerometer

Sensors and actuators. A. Physical., 2019-01, Vol.285, p.581-587

2019

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Noncontact RF Voltage Sensing of a Printed Trace via a Capacitive-Coupled Probe

IEEE sensors journal, 2018-11, Vol.18 (21), p.8873-8882

2018

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IEEE_Xplore

Quantum confinement modulation on the performance of nanometer thin body GaSb/InAs tunnel field-effect transistors

Journal of applied physics, 2017-06, Vol.121 (22)

2017

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Movable Noncontact RF Current Measurement on a PCB Trace

IEEE transactions on instrumentation and measurement, 2017-09, Vol.66 (9), p.2464-2473

2017

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IEEE_Xplore

The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface

Microelectronics and reliability, 2018-12, Vol.91, p.52-66

2018

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Electromagnetic Pattern Extraction and Grouping for Near-Field Scanning of Integrated Circuits by PCA and K-Means Approaches

IEEE transactions on electromagnetic compatibility, 2019-12, Vol.61 (6), p.1811-1822

2019

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IEEE_Xplore

New Circular-Slot Circularly Polarized Antenna with Modified Characteristic

International journal of antennas and propagation, 2022-04, Vol.2022, p.1-8

2022

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Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

IEEE electron device letters, 2014-05, Vol.35 (5), p.503-505

2014

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IEEE_Xplore

Symmetrical double‐loop H‐field probe with floating shield for improving sensitivity and electric field suppression

IET microwaves, antennas & propagation, 2021-04, Vol.15 (5), p.464-473

2021

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Microstructure and Grain Orientation Evolution in SnPb/SnAgCu Interconnects Under Electrical Current Stressing at Cryogenic Temperature

Materials, 2019-05, Vol.12 (10), p.1593

2019

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Method of Measuring the Mismatch of Parasitic Capacitance in MEMS Accelerometer Based on Regulating Electrostatic Stiffness

Micromachines (Basel), 2018-03, Vol.9 (3), p.128

2018

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Contrast Experiments of Pig Positive and Negative Hydrogen Ion Sources for Neutron Tubes

Instruments and experimental techniques (New York), 2020-10, Vol.63 (4), p.595-599

2020

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Mechanism of high-fluence proton induced electrical degradation in AlGaN/GaN high-electron-mobility transistors

Japanese Journal of Applied Physics, 2018-07, Vol.57 (7), p.74101

2018

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Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET

IEEE access, 2020, Vol.8, p.99037-99046

2020

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Investigation of abrupt degradation of drain current caused by under-gate crack in AlGaN/GaN high electron mobility transistors during high temperature operation stress

Journal of applied physics, 2015-09, Vol.118 (12)

2015

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Orientation Effect of Field-to-Line Coupling in a TEM Cell

IEEE transactions on electromagnetic compatibility, 2017-06, Vol.59 (3), p.970-979

2017

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IEEE_Xplore

Using Termination Effect to Characterize Electric and Magnetic Field Coupling Between TEM Cell and Microstrip Line

IEEE transactions on electromagnetic compatibility, 2015-12, Vol.57 (6), p.1338-1344

2015

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IEEE_Xplore

A Comparative Study of AC Positive Bias Temperature Instability of Germanium nMOSFETs With GeO₂/Ge and Si-cap/Ge Gate Stack

IEEE journal of the Electron Devices Society, 2021, Vol.9, p.539-544

2021

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An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning

IEEE transactions on circuits and systems. II, Express briefs, 2022-11, Vol.69 (11), p.4323-4328

2022

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IEEE_Xplore

A Broadband Magnetic Probe with Multi-Components Measurement Characteristics

IEEE antennas and wireless propagation letters, 2024, p.1-5

2024

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IEEE_Xplore

A Broadband Multicomponent Magnetic Probe With Improved Electric-Field Suppression Performance

IEEE sensors journal, 2023-03, Vol.23 (6), p.5920-5926

2023

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IEEE_Xplore

A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT

IEEE journal of the Electron Devices Society, 2020-01, Vol.8, p.1-1

2020

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Performance Enhancement of Broadband Circularly Polarized Slot-Microstrip Antenna Using Parasitic Elements

IEEE antennas and wireless propagation letters, 2021-12, Vol.20 (12), p.2255-2259

2021

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IEEE_Xplore

Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bulk Technologies

IEEE transactions on nuclear science, 2014-06, Vol.61 (3), p.1459-1467

2014

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IEEE_Xplore

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Performance enhancement of dual‐polarised dipole antenna using parasitic elements

Research on temperature characteristic of parasitic capacitance in MEMS capacitive accelerometer

Noncontact RF Voltage Sensing of a Printed Trace via a Capacitive-Coupled Probe

Quantum confinement modulation on the performance of nanometer thin body GaSb/InAs tunnel field-effect transistors

Movable Noncontact RF Current Measurement on a PCB Trace

The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface

Electromagnetic Pattern Extraction and Grouping for Near-Field Scanning of Integrated Circuits by PCA and K-Means Approaches

New Circular-Slot Circularly Polarized Antenna with Modified Characteristic

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Symmetrical double‐loop H‐field probe with floating shield for improving sensitivity and electric field suppression

Microstructure and Grain Orientation Evolution in SnPb/SnAgCu Interconnects Under Electrical Current Stressing at Cryogenic Temperature

Method of Measuring the Mismatch of Parasitic Capacitance in MEMS Accelerometer Based on Regulating Electrostatic Stiffness

Contrast Experiments of Pig Positive and Negative Hydrogen Ion Sources for Neutron Tubes

Mechanism of high-fluence proton induced electrical degradation in AlGaN/GaN high-electron-mobility transistors

Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET

Investigation of abrupt degradation of drain current caused by under-gate crack in AlGaN/GaN high electron mobility transistors during high temperature operation stress

Orientation Effect of Field-to-Line Coupling in a TEM Cell

Using Termination Effect to Characterize Electric and Magnetic Field Coupling Between TEM Cell and Microstrip Line

A Comparative Study of AC Positive Bias Temperature Instability of Germanium nMOSFETs With GeO₂/Ge and Si-cap/Ge Gate Stack

An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning

A Broadband Magnetic Probe with Multi-Components Measurement Characteristics

A Broadband Multicomponent Magnetic Probe With Improved Electric-Field Suppression Performance

A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT

Performance Enhancement of Broadband Circularly Polarized Slot-Microstrip Antenna Using Parasitic Elements

Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bulk Technologies

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