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Fully-depleted SOI devices with TaSiN gate, HfO2 gate dielectric, and elevated source/drain extensions

IEEE electron device letters, 2003-05, Vol.24 (5), p.342-344

2003

Volltextzugriff (PDF)

50-nm fully depleted SOI CMOS technology with HfO2 gate dielectric and TiN gate

IEEE transactions on nanotechnology, 2003-10, Vol.2 (4), p.324-328

2003

Volltextzugriff (PDF)

Fully-depleted SOI devices with TaSiN gate, HfO(2) gate dielectric, and elevated source/drain extensions

IEEE electron device letters, 2003-05, Vol.24 (5), p.342-344

2003

Volltextzugriff (PDF)

Fully-depleted SOI devices with TaSiN gate, HfO 2 gate dielectric, and elevated source/drain extensions

IEEE electron device letters, 2003-05, Vol.24 (5), p.342-344

2003

Volltextzugriff (PDF)

Fully-depleted SOI devices with TaSiN gate, HfO sub(2) gate dielectric, and elevated source/drain extensions

IEEE electron device letters, 2003-01, Vol.24 (5)

2003

Volltextzugriff (PDF)

Performance and reliability of sub-100nm TaSiN metal gate fully-depleted SOI devices with high-k (HfO/sub 2/) gate dielectric

Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004, 2004, p.106-107

2004

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50-nm fully depleted SOI CMOS technology with HfO(2) gate dielectric and TiN gate

IEEE transactions on nanotechnology, 2003-12, Vol.2 (4), p.324-328

2003

Volltextzugriff (PDF)

50-nm fully depleted SOI CMOS technology with HfO/sub 2/ gate dielectric and TiN gate

IEEE transactions on nanotechnology, 2003-12, Vol.2 (4), p.324-328

2003

Volltextzugriff (PDF)

50-nm fully depleted SOI CMOS technology with HfO sub(2) gate dielectric and TiN gate

IEEE transactions on nanotechnology, 2003-01, Vol.2 (4)

2003

Volltextzugriff (PDF)

Temperature dependent hysteretic propagation delay in FB SOI inverter chain

1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345), 1999, p.82-83

1999

Volltextzugriff (PDF)

Scaling assessment of fully-depleted SOI technology at the 30 nm gate length generation

2002 IEEE International SOI Conference, 2002, p.25-27

2002

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Scaling assessment of fully-depleted SOI technology at the 30nm gate length generation

2002

Volltextzugriff (PDF)

Ultra-thin body fully-depleted SOI devices with metal gate (TaSiN) gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions

2002 IEEE International SOI Conference, 2002, p.205-206

2002

Volltextzugriff (PDF)

Mixed-signal performance of sub-100nm fully-depleted SOI devices with metal gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions

IEEE International Electron Devices Meeting 2003, 2003, p.11.5.1-11.5.3

2003

Volltextzugriff (PDF)

Invitational Leadership: Does It Make a Difference?

Journal of invitational theory and practice, 2022-02, Vol.9, p.57-70

Egley, Robert

2022

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Characterization and biodistribution of under-employed gene therapy vector AAV7

Journal of virology, 2023-11, Vol.97 (11), p.e0116323-e0116323

2023

Volltextzugriff (PDF)

Can Accountability Be Inviting?: An Assessment of Administrators’ Professionally and Personally Inviting Behaviors

Journal of invitational theory and practice, 2022-02, Vol.11, p.71-85

2022

Volltextzugriff (PDF)

Rural Elementary Administrators’ Views of High-Stakes Testing

The Rural educator (Fort Collins, Colo.), 2018-12, Vol.26 (1)

2018

Volltextzugriff (PDF)

Fanner Honey Bee: Behavioral Variability and Environmental Cues in Workers Performing a Specialized Task

Journal of insect behavior, 2013-03, Vol.26 (2), p.238-245

2013

Volltextzugriff (PDF)

Voices from the Frontlines:Teachers' Perceptions of High-Stakes Testing

Education policy analysis archives, 2004-08, Vol.12 (39), p.39

2004

Volltextzugriff (PDF)

Programmable Logic Implemented Using Quantum-Dot Cellular Automata

IEEE transactions on nanotechnology, 2012-07, Vol.11 (4), p.739-745

2012

Volltextzugriff (PDF)

Teacher-Principal Relationships: Exploring Linkages between Empowerment and Interpersonal Trust

Journal of educational administration, 2005-01, Vol.43 (3), p.260-277

2005

Volltextzugriff (PDF)

Comparing One-Partner and Couple Data on Sensitive Marital Behaviors: The Case of Marital Violence

Journal of marriage and family, 1995-11, Vol.57 (4), p.995-1010

1995

Volltextzugriff (PDF)

Sand mining impacts on long-term dune erosion in southern Monterey Bay

Marine geology, 2006-05, Vol.229 (1), p.45-58

2006

Volltextzugriff (PDF)

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Fully-depleted SOI devices with TaSiN gate, HfO2 gate dielectric, and elevated source/drain extensions

50-nm fully depleted SOI CMOS technology with HfO2 gate dielectric and TiN gate

Fully-depleted SOI devices with TaSiN gate, HfO(2) gate dielectric, and elevated source/drain extensions

Fully-depleted SOI devices with TaSiN gate, HfO 2 gate dielectric, and elevated source/drain extensions

Fully-depleted SOI devices with TaSiN gate, HfO sub(2) gate dielectric, and elevated source/drain extensions

Performance and reliability of sub-100nm TaSiN metal gate fully-depleted SOI devices with high-k (HfO/sub 2/) gate dielectric

50-nm fully depleted SOI CMOS technology with HfO(2) gate dielectric and TiN gate

50-nm fully depleted SOI CMOS technology with HfO/sub 2/ gate dielectric and TiN gate

50-nm fully depleted SOI CMOS technology with HfO sub(2) gate dielectric and TiN gate

Temperature dependent hysteretic propagation delay in FB SOI inverter chain

Scaling assessment of fully-depleted SOI technology at the 30 nm gate length generation

Scaling assessment of fully-depleted SOI technology at the 30nm gate length generation

Ultra-thin body fully-depleted SOI devices with metal gate (TaSiN) gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions

Performance and reliability of sub-100nm TaSiN metal gate fully-depleted SOI devices with high-K (HfO2) gate dielectric

Mixed-signal performance of sub-100nm fully-depleted SOI devices with metal gate, high K (HfO/sub 2/) dielectric and elevated source/drain extensions

Invitational Leadership: Does It Make a Difference?

Characterization and biodistribution of under-employed gene therapy vector AAV7

Can Accountability Be Inviting?: An Assessment of Administrators’ Professionally and Personally Inviting Behaviors

Rural Elementary Administrators’ Views of High-Stakes Testing

Fanner Honey Bee: Behavioral Variability and Environmental Cues in Workers Performing a Specialized Task

Voices from the Frontlines:Teachers' Perceptions of High-Stakes Testing

Programmable Logic Implemented Using Quantum-Dot Cellular Automata

Teacher-Principal Relationships: Exploring Linkages between Empowerment and Interpersonal Trust

Comparing One-Partner and Couple Data on Sensitive Marital Behaviors: The Case of Marital Violence

Sand mining impacts on long-term dune erosion in southern Monterey Bay

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