UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Influence of the CMAS on the aging of titanium alloy β21s

Surface & coatings technology, 2013-04, Vol.220, p.36-39

2013

Volltextzugriff (PDF)

Effects of post-deposition annealing in O2 on the electrical characteristics of LaAlO3 films on Si

Applied physics letters, 2005-07, Vol.87 (2)

2005

Volltextzugriff (PDF)

Production of hydroxyl radicals and removal of acetaldehyde in a photo-triggered discharge in N2/O2/CH3CHO mixtures

Journal of physics. D, Applied physics, 2005-09, Vol.38 (18), p.3446-3450

2005

Volltextzugriff (PDF)

Structural and electrical properties of the interfacial layer in sputter deposited LaAlO3/Si thin films

Thin solid films, 2007-07, Vol.515 (20-21), p.7782-7789

2007

Volltextzugriff (PDF)

Effects of sputter deposition parameters and post-deposition annealing on the electrical characteristics of LaAlO3 dielectric films on Si

Applied physics. A, Materials science & processing, 2006-05, Vol.83 (2), p.289-293

2006

Volltextzugriff (PDF)

Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy

Thin solid films, 2008-09, Vol.516 (22), p.7974-7978

2008

Volltextzugriff (PDF)

Magnetic properties of FeCoC thin films prepared by various sputtering methods

Journal of physics. Conference series, 2011-07, Vol.303 (1), p.012094-7

2011

Volltextzugriff (PDF)

Structural, electrical and piezoelectric properties of LiNbO 3 thin films for surface acoustic wave resonators applications

Applied surface science, 2009-12, Vol.256 (5), p.1455-1460

2009

Volltextzugriff (PDF)

Structural, electrical and piezoelectric properties of LiNbO3 thin films for surface acoustic wave resonators applications

Applied surface science, 2009-12, Vol.256 (5), p.1455-1460

2009

Volltextzugriff (PDF)

41lanthanum-based dielectric films analyzed by spectroscopic ellipsometry, X-ray reflectometry and X-ray photoelectron spectroscopy

Physica status solidi. C, 2008-05, Vol.5 (5), p.1206-1209

2008

Volltextzugriff (PDF)

Structural, electrical and piezoelectric properties of LiNbO3 thin films for surface acoustic wave resonators applications

Applied surface science, 2010, Vol.256 (5), p.1455-1460

2010

Volltextzugriff (PDF)

Effects of C addition in Fe65Co35 and Fe9.5Co90.5 soft magnetic films

Journal of applied physics, 2010-05, Vol.107 (9)

2010

Volltextzugriff (PDF)

EFFECTS OF NITROGEN INCORPORATION IN LANTHANUM-BASED DIELECTRIC FILMS

Integrated ferroelectrics, 2008-01, Vol.97 (1), p.129-142

2008

Volltextzugriff (PDF)

Effects of C addition in Fe 65 Co 35 and Fe 9.5 Co 90.5 soft magnetic films

Journal of applied physics, 2010-04, Vol.107 (9), p.09A321-09A321-3

2010

Volltextzugriff (PDF)

Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks

Applied physics letters, 2007-03, Vol.90 (12)

2007

Volltextzugriff (PDF)

Structural and electrical properties of the interfacial layer in sputter deposited LaAlO 3/Si thin films

Thin solid films, 2007, Vol.515 (20), p.7782-7789

2007

Volltextzugriff (PDF)

Electrical characteristics and interface structure of Hf Al O ∕ Si O N ∕ Si ( 001 ) stacks

Applied physics letters, 2007-03, Vol.90 (12), p.122905-122905-3

2007

Volltextzugriff (PDF)

Electrical Properties and Interfacial Characteristics of RuO[sub 2]∕HfAlO[sub x]∕SiON∕Si and RuO[sub 2]∕LaAlO[sub 3]∕SiON∕Si Capacitors

Journal of the Electrochemical Society, 2008, Vol.155 (9), p.H661

2008

Volltextzugriff (PDF)

Production of hydroxyl radicals and removal of acetaldehyde in a photo-triggered discharge in N 2 /O 2 /CH 3 CHO mixtures

Journal of physics. D, Applied physics, 2005-09, Vol.38 (18), p.3446-3450

2005

Volltextzugriff (PDF)

Effects of post-deposition annealing in O 2 on the electrical characteristics of LaAlO 3 films on Si

Applied physics letters, 2005-07, Vol.87 (2), p.022901-022901-3

2005

Volltextzugriff (PDF)

Composition, stability and oxygen transport in lanthanum and hafnium aluminates thin films on Si

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2006-08, Vol.249 (1-2), p.366-369

2006

Volltextzugriff (PDF)

Lanthanum-based dielectric films analyzed by spectroscopic ellipsometry, X-ray reflectometry and X-ray photoelectron spectroscopy

Physica status solidi. C, 2008, Vol.5 (5)

2008

Volltextzugriff (PDF)

Effects of post-deposition annealing in O{sub 2} on the electrical characteristics of LaAlO{sub 3} films on Si

Applied physics letters, 2005-07, Vol.87 (2)

2005

Volltextzugriff (PDF)

Thermally Induced Atomic Transport in Nanometric LaAlON Films on Si

Electrochemical and solid-state letters, 2007, Vol.10 (10), p.G69

2007

Volltextzugriff (PDF)

Atomic Transport in LaAlO[sub 3] Films on Si Induced by Thermal Annealing

Electrochemical and solid-state letters, 2006, Vol.9 (6), p.F49

2006

Volltextzugriff (PDF)

1 – 25 von 28

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(26)
Mit Volltextzugriff
(25)

Publikationsform

Artikel
(28)

Sprache

Englisch
(25)

Erscheinungsjahr

n.n

Menü

Weitere Dienste

Einstellungen

Influence of the CMAS on the aging of titanium alloy β21s

Effects of post-deposition annealing in O2 on the electrical characteristics of LaAlO3 films on Si

Production of hydroxyl radicals and removal of acetaldehyde in a photo-triggered discharge in N2/O2/CH3CHO mixtures

Structural and electrical properties of the interfacial layer in sputter deposited LaAlO3/Si thin films

Effects of sputter deposition parameters and post-deposition annealing on the electrical characteristics of LaAlO3 dielectric films on Si

Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy

Magnetic properties of FeCoC thin films prepared by various sputtering methods

Structural, electrical and piezoelectric properties of LiNbO 3 thin films for surface acoustic wave resonators applications

Structural, electrical and piezoelectric properties of LiNbO3 thin films for surface acoustic wave resonators applications

41lanthanum-based dielectric films analyzed by spectroscopic ellipsometry, X-ray reflectometry and X-ray photoelectron spectroscopy

Structural, electrical and piezoelectric properties of LiNbO3 thin films for surface acoustic wave resonators applications

Effects of C addition in Fe65Co35 and Fe9.5Co90.5 soft magnetic films

EFFECTS OF NITROGEN INCORPORATION IN LANTHANUM-BASED DIELECTRIC FILMS

Effects of C addition in Fe 65 Co 35 and Fe 9.5 Co 90.5 soft magnetic films

Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks

Structural and electrical properties of the interfacial layer in sputter deposited LaAlO 3/Si thin films

Electrical characteristics and interface structure of Hf Al O ∕ Si O N ∕ Si ( 001 ) stacks

Electrical Properties and Interfacial Characteristics of RuO[sub 2]∕HfAlO[sub x]∕SiON∕Si and RuO[sub 2]∕LaAlO[sub 3]∕SiON∕Si Capacitors

Production of hydroxyl radicals and removal of acetaldehyde in a photo-triggered discharge in N 2 /O 2 /CH 3 CHO mixtures

Effects of post-deposition annealing in O 2 on the electrical characteristics of LaAlO 3 films on Si

Composition, stability and oxygen transport in lanthanum and hafnium aluminates thin films on Si

Lanthanum-based dielectric films analyzed by spectroscopic ellipsometry, X-ray reflectometry and X-ray photoelectron spectroscopy

Effects of post-deposition annealing in O{sub 2} on the electrical characteristics of LaAlO{sub 3} films on Si

Thermally Induced Atomic Transport in Nanometric LaAlON Films on Si

Atomic Transport in LaAlO[sub 3] Films on Si Induced by Thermal Annealing

Suchergebnisse filtern