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Drift characteristics of mobile ions in SiNx films and solar cells

Solar energy materials and solar cells, 2015-11, Vol.142, p.102-106

2015

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Drift characteristics of mobile ions in SiN sub(x) films and solar cells

Solar energy materials and solar cells, 2015-11, Vol.142, p.102-106

2015

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Improved QSS-μPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime

Solar energy materials and solar cells, 2012-11, Vol.106, p.66-70

2012

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Ferroelectric HfO 2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology

Physica status solidi. A, Applications and materials science, 2017-07, Vol.214 (7)

2017

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Ferroelectric HfO 2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology (Phys. Status Solidi A 7∕2017)

Physica status solidi. A, Applications and materials science, 2017-07, Vol.214 (7)

2017

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Ferroelectric HfO2 thin film testing and whole wafer mapping with non-contact corona-Kelvin metrology

Physica status solidi. A, Applications and materials science, 2017-07, Vol.214 (7)

2017

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Foreword

Journal of electronic materials, 2010-06, Vol.39 (6), p.619-619

2010

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Foreword

Journal of electronic materials, 2010-06, Vol.39 (6), p.619

2010

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Foreword

Journal of electronic materials, 2010, Vol.39 (6), p.619-619

2010

Volltextzugriff (PDF)

Ferroelectric HfO2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology

Physica status solidi. A, Applications and materials science, 2017-07, Vol.214 (7), p.n/a

2017

Volltextzugriff (PDF)

Improved QSS-AmPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime

Solar energy materials and solar cells, 2012-11, Vol.106, p.66-70

2012

Volltextzugriff (PDF)

2009 International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP)

Journal of electronic materials, 2010, Vol.39 (6)

EDELMAN, Piotr

2010

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Spatially resolved characterization of ARC films on multicrystalline silicon with a non-contact surface voltage technique

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 2016, p.1590-1593

2016

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Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC

Materials science forum, 2016-05, Vol.858, p.353-356

2016

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Surface Voltage and [mu]PCD Mapping of Defect in Epitaxial SiC

Materials Science Forum, 2016-05, Vol.858, p.353-356

2016

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Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

Journal of electronic materials, 2010-06, Vol.39 (6), p.642-647

2010

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Unified Lifetime Metrology and Photoluminescence Imaging of Passivation Defects for Silicon PV

Energy procedia, 2013, Vol.38, p.209-215

2013

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Non-contact, no wafer preparation deep level transient spectroscopy based on surface photovoltage

Japanese Journal of Applied Physics, 1992, Vol.31 (8B), p.L1185-L1187

1992

Volltextzugriff (PDF)

Band offset diagnostics of advanced dielectrics

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.73-78

2008

Volltextzugriff (PDF)

Unified Lifetime measurement for silicon PV

2012 38th IEEE Photovoltaic Specialists Conference, 2012, p.001860-001863

2012

Volltextzugriff (PDF)

Kelvin Force Microscopy and corona charging for semiconductor material and device characterization

Superlattices and microstructures, 2016-11, Vol.99, p.13-23

2016

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Non-contact charge-voltage method for dielectric characterization on small test areas of IC product wafers

Materials science in semiconductor processing, 2006-02, Vol.9 (1), p.252-256

2006

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Full wafer non-contact mapping of electrical properties of ultra-thin advanced dielectrics on Si

Materials science & engineering. B, Solid-state materials for advanced technology, 2002-04, Vol.91, p.211-215

2002

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Non-Contact Mapping of Fe Contamination in Oxidized Si Wafers with Sensitivity in Part-Per-Trillion Range

MRS proceedings, 1996, Vol.428, Article 449

1996

Volltextzugriff (PDF)

Formation of thermal donors in SIMOX method

Journal of electronic materials, 1992-01, Vol.21 (5), p.519-522

1992

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Drift characteristics of mobile ions in SiNx films and solar cells

Drift characteristics of mobile ions in SiN sub(x) films and solar cells

Improved QSS-μPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime

Ferroelectric HfO 2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology

Ferroelectric HfO 2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology (Phys. Status Solidi A 7∕2017)

Ferroelectric HfO2 thin film testing and whole wafer mapping with non-contact corona-Kelvin metrology

Foreword

Foreword

Foreword

Ferroelectric HfO2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology

Improved QSS-AmPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime

2009 International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP)

Spatially resolved characterization of ARC films on multicrystalline silicon with a non-contact surface voltage technique

Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC

Surface Voltage and [mu]PCD Mapping of Defect in Epitaxial SiC

Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells

Unified Lifetime Metrology and Photoluminescence Imaging of Passivation Defects for Silicon PV

Non-contact, no wafer preparation deep level transient spectroscopy based on surface photovoltage

Band offset diagnostics of advanced dielectrics

Unified Lifetime measurement for silicon PV

Kelvin Force Microscopy and corona charging for semiconductor material and device characterization

Non-contact charge-voltage method for dielectric characterization on small test areas of IC product wafers

Full wafer non-contact mapping of electrical properties of ultra-thin advanced dielectrics on Si

Non-Contact Mapping of Fe Contamination in Oxidized Si Wafers with Sensitivity in Part-Per-Trillion Range

Formation of thermal donors in SIMOX method

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