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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-09, Vol.650 (1), p.150-157
- Micelli, A.
- Helle, K.
- Sandaker, H.
- Stugu, B.
- Barbero, M.
- Hügging, F.
- Karagounis, M.
- Kostyukhin, V.
- Krüger, H.
- Tsung, J.-W.
- Wermes, N.
- Capua, M.
- Fazio, S.
- Mastroberardino, A.
- Susinno, G.
- Gallrapp, C.
- Di Girolamo, B.
- Dobos, D.
- La Rosa, A.
- Pernegger, H.
- Roe, S.
- Slavicek, T.
- Pospisil, S.
- Jakobs, K.
- Köhler, M.
- Parzefall, U.
- Darbo, G.
- Gariano, G.
- Gemme, C.
- Rovani, A.
- Ruscino, E.
- Butter, C.
- Bates, R.
- Oshea, V.
- Parker, S.
- Cavalli-Sforza, M.
- Grinstein, S.
- Korokolov, I.
- Pradilla, C.
- Einsweiler, K.
- Garcia-Sciveres, M.
- Borri, M.
- Da Vià, C.
- Freestone, J.
- Kolya, S.
- Lai, C.H.
- Nellist, C.
- Pater, J.
- Thompson, R.
- Watts, S.J.
- Hoeferkamp, M.
- Seidel, S.
- Bolle, E.
- Gjersdal, H.
- Sjoebaek, K.-N.
- Stapnes, S.
- Rohne, O.
- Su, D.
- Young, C.
- Hansson, P.
- Grenier, P.
- Hasi, J.
- Kenney, C.
- Kocian, M.
- Jackson, P.
- Silverstein, D.
- Davetak, H.
- DeWilde, B.
- Tsybychev, D.
- Dalla Betta, G.-F.
- Gabos, P.
- Povoli, M.
- Cobal, M.
- Giordani, M.-P.
- Selmi, L.
- Cristofoli, A.
- Esseni, D.
- Palestri, P.
- Fleta, C.
- Lozano, M.
- Pellegrini, G.
- Boscardin, M.
- Bagolini, A.
- Piemonte, C.
- Ronchin, S.
- Zorzi, N.
- Hansen, T.-E.
- Hansen, T.
- Kok, A.
- Lietaer, N.
- Kalliopuska, J.
- Oja, A.
2011
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2022 International Electron Devices Meeting (IEDM), 2022, p.28.2.1-28.2.4
2022
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2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2019, p.1-4
2019
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2008 9th International Conference on Ultimate Integration of Silicon, 2008, p.179-182
2008
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IEEE transactions on electron devices, 2013-06, Vol.60 (6), p.1884-1891
2013
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IEEE transactions on electron devices, 2007-01, Vol.54 (1), p.115-123
2007
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2008 9th International Conference on Ultimate Integration of Silicon, 2008, p.207-210
2008
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IEEE transactions on electron devices, 2012-03, Vol.59 (3), p.639-646
2012
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2006 European Solid-State Device Research Conference, 2006, p.166-169
2006
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Journal d'agriculture traditionnelle et de botanique appliquée, 1978, Vol.25
1978
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2008 9th International Conference on Ultimate Integration of Silicon, 2008, p.125-128
2008
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IEEE transactions on electron devices, 2001-08, Vol.48 (8), p.1737-1740
2001
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2009 10th International Conference on Ultimate Integration of Silicon, 2009, p.113-116
2009
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IEEE transactions on electron devices, 2018-09, Vol.65 (9), p.3646-3653
2018
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Solid-state electronics, 2017-02, Vol.128, p.37-42
2017
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2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2016, p.139-142
2016
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IEEE transactions on electron devices, 1999-02, Vol.46 (2), p.369-375
1999
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IEEE transactions on electron devices, 1999-02, Vol.46 (2), p.376-382
1999
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IEEE transactions on electron devices, 1999-02, Vol.46 (2), p.369-375
1999
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IEEE transactions on electron devices, 1999, Vol.46 (2), p.376-382
1999
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IEEE transactions on electron devices, 1999-02, Vol.46 (2), p.369-375
1999
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2009 Proceedings of the European Solid State Device Research Conference, 2009, p.480-483
2009
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International Electron Devices Meeting. I E D M Technical Digest. pp. 307-310. 1994, 1994, p.307-310
1994
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Microelectronic engineering, 2001-11, Vol.59 (1), p.231-236
2001
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2023 35th International Conference on Microelectronic Test Structure (ICMTS), 2023, p.1-6
2023
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