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Physical review. B, 2017-03, Vol.95 (10), p.104111, Article 104111
2017
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Journal of materials science. Materials in electronics, 2011, Vol.22 (10), p.1542-1552
2011
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Journal of materials science. Materials in electronics, 2011-10, Vol.22 (10), p.1542-1552
2011
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002-11, Vol.20 (6), p.3067-3070
2002
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Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270), 1998, p.740-747
1998
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Physical review. B, Condensed matter, 1994-07, Vol.50 (1), p.627-630
1994
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Surface science, 1994-03, Vol.305 (1), p.536-540
1994
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Physica. B, Condensed matter, 1994-02, Vol.194, p.1111-1112
1994
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Physica. B, Condensed matter, 1993-06, Vol.189 (1), p.210-217
1993
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1993
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The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003, 2003, Vol.2, p.660-661 vol.2
2003
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The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003, 2003, Vol.2, p.664-665 vol.2
2003
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Zeitschrift / Serie
- Journal Of Materials Science. Materials In Electronics
- Physica. B, Condensed Matter
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures
- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
- Journal Of Vacuum Science & Technology. B, Microelectronics Processing And Phenomena
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