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Experiences in improving introductory physics labs

Physics today, 2018-07, Vol.71 (7), p.12-13

Eades, Alwyn

2018

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Further clarity

Physics world, 2017-01, Vol.30 (1), p.23-23

2017

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A significant bias

Physics world, 2013-09, Vol.26 (9), p.21-22

Eades, Alwyn

2013

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Electron Crystallography: Electron Microscopy and Electron Diffraction, X. Zou, S. Hovmöller, and P Oleynikov. Oxford University Press (IUCr Texts on Crystallography16), 2011, 335 pages. ISBN 978-0-19-958020-0(Hardcover)

Microscopy and microanalysis, 2012-06, Vol.18 (3), p.645-646

Eades, Alwyn

2012

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Energy-filtered electron backscatter diffraction

Ultramicroscopy, 2008, Vol.108 (2), p.116-125

2008

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Experiences in improving introductory physics labs

Physics today, 2018-07, Vol.71 (7), p.12-12

2018

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Obtaining TEM images with a uniform deviation parameter

Ultramicroscopy, 2006-03, Vol.106 (4), p.432-438

Eades, Alwyn

2006

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Electron Crystallography: Electron Microscopy and Electron Diffraction

Microscopy and microanalysis, 2012-06, Vol.18 (3), p.645

2012

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Energy-filtered electron backscatter diffraction: A correction

Ultramicroscopy, 2008-06, Vol.108 (7), p.706-706

2008

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Electron Microscopy in Latin America

Infocus magazine, 2006-12, p.14-23

Eades, Alwyn

2006

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Microscopy Society of America

Microscopy and microanalysis, 2003-08, Vol.9 (I1), p.42-44

Eades, Alwyn

2003

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Errors, Artifacts, and Improvements in EBSD Processing and Mapping

Microscopy and microanalysis, 2005-02, Vol.11 (1), p.79-87

2005

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Monte Carlo Simulation for Electron Backscattering Diffraction

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.940-941

2004

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Measurement and Mapping of Small Changes of Crystal Orientation by Electron Backscattering Diffraction

Microscopy and microanalysis, 2005-08, Vol.11 (4), p.341-353

2005

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Alternatives to Image Quality (IQ) Mapping in EBSD

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.692-693

2002

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EBSD geometry in the SEM: simulation and representation

Surface and interface analysis, 2005-11, Vol.37 (11), p.1017-1020

2005

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Artifacts Introduced Through the Hough Transform in EBSD

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.724-725

2003

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Choosing an Electron Backscattering Pattern (EBSP) System

Microscopy and microanalysis, 1999-08, Vol.5 (S2), p.250-251

Eades, Alwyn

1999

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Another Way to Implement Diffraction Contrast in SEM

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.690-691

2002

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Convergent-Beam Electron Diffraction: Symmetry & Large-Aangle Patterns

Transmission Electron Microscopy, 2016, p.103-144

2016

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ABET Revisited

ASEE prism, 2002-02, Vol.11 (6), p.9-9

Eades, Alwyn

2002

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Anomalies in the Hough Transform of Kikuchi Bands in EBSD

Microscopy and microanalysis, 2001-08, Vol.7 (S2), p.364-365

2001

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A Routine to Determine the Shift of Kikuchi Bands in EBSD to Sub-pixel Resolution

Microscopy and microanalysis, 2001-08, Vol.7 (S2), p.366-367

2001

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An Energy Filter for Electron Backscattering Diffraction

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.938-939

2004

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Foreword

Microscopy and microanalysis, 2003-08, Vol.9 (S02), p.43-43

2003

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Experiences in improving introductory physics labs

Further clarity

A significant bias

Electron Crystallography: Electron Microscopy and Electron Diffraction, X. Zou, S. Hovmöller, and P Oleynikov. Oxford University Press (IUCr Texts on Crystallography16), 2011, 335 pages. ISBN 978-0-19-958020-0(Hardcover)

Energy-filtered electron backscatter diffraction

Experiences in improving introductory physics labs

Obtaining TEM images with a uniform deviation parameter

Electron Crystallography: Electron Microscopy and Electron Diffraction

Energy-filtered electron backscatter diffraction: A correction

Electron Microscopy in Latin America

Microscopy Society of America

Errors, Artifacts, and Improvements in EBSD Processing and Mapping

Monte Carlo Simulation for Electron Backscattering Diffraction

Measurement and Mapping of Small Changes of Crystal Orientation by Electron Backscattering Diffraction

Alternatives to Image Quality (IQ) Mapping in EBSD

EBSD geometry in the SEM: simulation and representation

Artifacts Introduced Through the Hough Transform in EBSD

Choosing an Electron Backscattering Pattern (EBSP) System

Another Way to Implement Diffraction Contrast in SEM

Convergent-Beam Electron Diffraction: Symmetry & Large-Aangle Patterns

ABET Revisited

Anomalies in the Hough Transform of Kikuchi Bands in EBSD

A Routine to Determine the Shift of Kikuchi Bands in EBSD to Sub-pixel Resolution

An Energy Filter for Electron Backscattering Diffraction

Foreword

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