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Don't forget to lock your SIB: hiding instruments using P1687

2013 IEEE International Test Conference (ITC), 2013, p.1-10

2013

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Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks

2020 IEEE International Test Conference (ITC), 2020, p.1-10

2020

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IJTAG Integrity Checking with Chained Hashing

2018 IEEE International Test Conference (ITC), 2018, p.1-10

2018

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A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard

2015 IEEE 33rd VLSI Test Symposium (VTS), 2015, p.1-4

2015

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Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

Journal of electronic testing, 2023-04, Vol.39 (2), p.227-243

2023

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Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG

2018 IEEE 36th VLSI Test Symposium (VTS), 2018, p.1-6

2018

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A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

Journal of electronic testing, 2013-06, Vol.29 (3), p.275-288

2013

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A Novel Graph Coloring Based Solution for Low-Power Scan Shift

2019 IEEE 37th VLSI Test Symposium (VTS), 2019, p.1-6

2019

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Increasing IJTAG bandwidth and managing security through parallel locking-SIBs

2017 IEEE International Test Conference (ITC), 2017, p.1-10

2017

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Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits

2021 IEEE International Test Conference (ITC), 2021, p.319-323

2021

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Repairing a 3-D Die-Stack Using Available Programmable Logic

IEEE transactions on computer-aided design of integrated circuits and systems, 2015-05, Vol.34 (5), p.849-861

2015

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Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack

Journal of electronic testing, 2019-12, Vol.35 (6), p.887-900

2019

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Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment

2018 IEEE 36th VLSI Test Symposium (VTS), 2018, p.1-6

2018

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A Cost Effective Approach for Online Error Detection Using Invariant Relationships

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-05, Vol.29 (5), p.788-801

2010

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Making it harder to unlock an LSIB: honeytraps and misdirection in a P1687 network

Proceedings of the conference on Design, Automation & Test in Europe, 2014, p.1-6

2014

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Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015, p.119-122

2015

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Board security enhancement using new locking SIB-based architectures

2014 International Test Conference, 2014, p.1-10

2014

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Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture

2016 IEEE International Test Conference (ITC), 2016, p.1-10

2016

Volltextzugriff (PDF)

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices

2019 IEEE 37th VLSI Test Symposium (VTS), 2019, p.1-1

2019

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Dual Use Circuitry for Early Failure Warning and Test

2024 25th International Symposium on Quality Electronic Design (ISQED), 2024, p.1-8

2024

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Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network

2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-6

2014

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NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test

IEEE transactions on computer-aided design of integrated circuits and systems, 2012-05, Vol.31 (5), p.809-813

2012

Volltextzugriff (PDF)

An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting

25th IEEE VLSI Test Symposium (VTS'07), 2007, p.205-210

Dworak, J.

2007

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Using implications to choose tests through suspect fault identification

ACM transactions on design automation of electronic systems, 2013-01, Vol.18 (1), p.1-19

2013

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On Reducing Scan Shift Activity at RTL

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-07, Vol.29 (7), p.1110-1120

2010

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Don't forget to lock your SIB: hiding instruments using P1687

Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks

IJTAG Integrity Checking with Chained Hashing

A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

A Novel Graph Coloring Based Solution for Low-Power Scan Shift

Increasing IJTAG bandwidth and managing security through parallel locking-SIBs

Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits

Repairing a 3-D Die-Stack Using Available Programmable Logic

Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack

Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment

A Cost Effective Approach for Online Error Detection Using Invariant Relationships

Making it harder to unlock an LSIB: honeytraps and misdirection in a P1687 network

Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

Board security enhancement using new locking SIB-based architectures

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices

Dual Use Circuitry for Early Failure Warning and Test

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test

An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting

Using implications to choose tests through suspect fault identification

On Reducing Scan Shift Activity at RTL

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