UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 135

Sortiert nach

System efficient ESD design

Microelectronics and reliability, 2015-12, Vol.55 (12), p.2607-2613

2015

Link zum Volltext

Verfügbarkeit prüfen

Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2171-2182

2002

Link zum Volltext
IEEE_Xplore

Characterization and Optimization of Sub-32-nm FinFET Devices for ESD Applications

IEEE transactions on electron devices, 2008-12, Vol.55 (12), p.3507-3516

2008

Link zum Volltext
IEEE_Xplore

Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies

Microelectronics and reliability, 2005-09, Vol.45 (9), p.1406-1414

2005

Link zum Volltext

Verfügbarkeit prüfen

Design methodology and optimization of gate-driven NMOS ESD protection circuits in submicron CMOS processes

IEEE transactions on electron devices, 1998-12, Vol.45 (12), p.2448-2456

1998

Link zum Volltext
IEEE_Xplore

Latch-up in 65nm CMOS technology: a scaling perspective

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual, 2005, p.137-144

2005

Link zum Volltext
IEEE_Xplore

Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2183-2192

2002

Link zum Volltext
IEEE_Xplore

ESD: a pervasive reliability concern for IC technologies

Proceedings of the IEEE, 1993-05, Vol.81 (5), p.690-702

1993

Link zum Volltext
IEEE_Xplore

Paradigm shift in ESD qualification

2008 IEEE International Reliability Physics Symposium, 2008, p.1-2

Duvvury, C.

2008

Link zum Volltext
IEEE_Xplore

An Insight Into the ESD Behavior of the Nanometer-Scale Drain-Extended NMOS Device-Part I: Turn-On Behavior of the Parasitic Bipolar

IEEE transactions on electron devices, 2011-02, Vol.58 (2), p.309-317

2011

Link zum Volltext
IEEE_Xplore

An Insight Into ESD Behavior of Nanometer-Scale Drain Extended NMOS (DeNMOS) Devices: Part II (Two-Dimensional Study-Biasing & Comparison With NMOS)

IEEE transactions on electron devices, 2011-02, Vol.58 (2), p.318-326

2011

Link zum Volltext
IEEE_Xplore

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

Microelectronics and reliability, 2001-03, Vol.41 (3), p.335-348

2001

Link zum Volltext

Verfügbarkeit prüfen

Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices

IEEE transactions on computer-aided design of integrated circuits and systems, 1994, Vol.13 (4), p.482-493

1994

Link zum Volltext
IEEE_Xplore

Impact of scaling on the high current behavior of RF CMOS technology

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.229-234

2003

Link zum Volltext
IEEE_Xplore

A new I/O signal latchup phenomenon in voltage tolerant ESD protection circuits

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.85-91

2003

Link zum Volltext
IEEE_Xplore

Non-uniform bipolar conduction in single finger NMOS transistors and implications for deep submicron ESD design

2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167), 2001, p.226-234

2001

Link zum Volltext
IEEE_Xplore

Internal chip ESD phenomena beyond the protection circuit

IEEE transactions on electron devices, 1988-12, Vol.35 (12), p.2133-2139

1988

Link zum Volltext
IEEE_Xplore

ESD protection device issues for IC designs

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169), 2001, p.41-48

Duvvury, C.

2001

Link zum Volltext
IEEE_Xplore

Modeling the 3D self ballasting behavior and filamentation under high current stressing in DeNMOS

2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs, 2011, p.164-167

2011

Link zum Volltext
IEEE_Xplore

Drain Extended NMOS High Current Behavior and ESD Protection Strategy for HV Applications in Sub-100nm CMOS Technologies

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.342-347

2007

Link zum Volltext
IEEE_Xplore

A PMOSFET ESD failure caused by localized charge injection

2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.405-411

2004

Link zum Volltext
IEEE_Xplore

Modeling of temperature dependent contact resistance for analysis of ESD reliability

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual, 2003, p.249-255

2003

Link zum Volltext
IEEE_Xplore

Robust high current ESD performance of nano-meter scale DeNMOS by source ballasting

2010 IEEE International Reliability Physics Symposium, 2010, p.853-856

2010

Link zum Volltext
IEEE_Xplore

Investigation of gate to contact spacing effect on ESD robustness of salicided deep submicron single finger NMOS transistors

2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320), 2002, p.148-155

2002

Link zum Volltext
IEEE_Xplore

Electrical overstress and electrostatic discharge

IEEE transactions on reliability, 1995-03, Vol.44 (1), p.2-5

1995

Link zum Volltext
IEEE_Xplore

1 – 25 von 135

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(47)
Mit Volltextzugriff
(113)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Electrostatic Discharge
(84)
Science & Technology
(75)
Engineering
(72)
Engineering, Electrical & Electronic
(72)
Technology
(72)
Protection
(53)
Cmos Technology
(40)
Physical Sciences
(36)
Mos Devices
(35)
Physics
(35)
Stress
(33)
Physics, Applied
(28)
Voltage
(28)
Applied Sciences
(26)
Electronics
(26)
Exact Sciences And Technology
(26)
Mosfets
(25)
Degradation
(22)
Instruments
(20)
Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
(20)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

System efficient ESD design

Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

Characterization and Optimization of Sub-32-nm FinFET Devices for ESD Applications

Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies

Design methodology and optimization of gate-driven NMOS ESD protection circuits in submicron CMOS processes

Latch-up in 65nm CMOS technology: a scaling perspective

Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

ESD: a pervasive reliability concern for IC technologies

Paradigm shift in ESD qualification

An Insight Into the ESD Behavior of the Nanometer-Scale Drain-Extended NMOS Device-Part I: Turn-On Behavior of the Parasitic Bipolar

An Insight Into ESD Behavior of Nanometer-Scale Drain Extended NMOS (DeNMOS) Devices: Part II (Two-Dimensional Study-Biasing & Comparison With NMOS)

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices

Impact of scaling on the high current behavior of RF CMOS technology

A new I/O signal latchup phenomenon in voltage tolerant ESD protection circuits

Non-uniform bipolar conduction in single finger NMOS transistors and implications for deep submicron ESD design

Internal chip ESD phenomena beyond the protection circuit

ESD protection device issues for IC designs

Modeling the 3D self ballasting behavior and filamentation under high current stressing in DeNMOS

Drain Extended NMOS High Current Behavior and ESD Protection Strategy for HV Applications in Sub-100nm CMOS Technologies

A PMOSFET ESD failure caused by localized charge injection

Modeling of temperature dependent contact resistance for analysis of ESD reliability

Robust high current ESD performance of nano-meter scale DeNMOS by source ballasting

Investigation of gate to contact spacing effect on ESD robustness of salicided deep submicron single finger NMOS transistors

Electrical overstress and electrostatic discharge

Suchergebnisse filtern