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Model dispersive media in finite-difference time-domain method with complex-conjugate pole-residue pairs

IEEE microwave and wireless components letters, 2006-03, Vol.16 (3), p.119-121

2006

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Impact of Scaling on Analog Performance and Associated Modeling Needs

IEEE transactions on electron devices, 2006-09, Vol.53 (9), p.2160-2167

2006

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Minimum achievable phase noise of RC oscillators

IEEE journal of solid-state circuits, 2005-03, Vol.40 (3), p.630-637

2005

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Impact of gate direct tunneling current on circuit performance: a simulation study

IEEE transactions on electron devices, 2001-12, Vol.48 (12), p.2823-2829

2001

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Electrostatic micromechanical actuator with extended range of travel

Journal of microelectromechanical systems, 2000-09, Vol.9 (3), p.321-328

2000

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Linearity Analysis of Lateral Channel Doping in RF Power MOSFETs

IEEE transactions on microwave theory and techniques, 2009-12, Vol.57 (12), p.3389-3394

2009

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A noise optimization technique for integrated low-noise amplifiers

IEEE journal of solid-state circuits, 2002-08, Vol.37 (8), p.994-1002

2002

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High-frequency characterization of on-chip digital interconnects

IEEE journal of solid-state circuits, 2002-06, Vol.37 (6), p.716-725

2002

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Impact of lateral source/drain abruptness on device performance

IEEE transactions on electron devices, 2002-11, Vol.49 (11), p.1882-1890

2002

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Optimal doping profiles via geometric programming

IEEE transactions on electron devices, 2005-12, Vol.52 (12), p.2660-2675

2005

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Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2171-2182

2002

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Synthesized Compact Models and Experimental Verifications for Substrate Noise Coupling in Mixed-Signal ICs

IEEE journal of solid-state circuits, 2006-08, Vol.41 (8), p.1817-1829

2006

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Analysis and design of distributed ESD protection circuits for high-speed mixed-signal and RF ICs

IEEE transactions on electron devices, 2002-08, Vol.49 (8), p.1444-1454

2002

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Investigation of compact models for RF noise in SiGe HBTs by hydrodynamic device simulation

IEEE transactions on electron devices, 2004-06, Vol.51 (6), p.956-961

2004

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An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

IEEE transactions on electron devices, 2000-12, Vol.47 (12), p.2410-2419

2000

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Design Methodology and Protection Strategy for ESD-CDM Robust Digital System Design in 90-nm and 130-nm Technologies

IEEE transactions on electron devices, 2009-02, Vol.56 (2), p.275-283

2009

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Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS

IEEE transactions on electron devices, 2000-10, Vol.47 (10), p.1843-1850

2000

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Density-gradient analysis of MOS tunneling

IEEE transactions on electron devices, 2000-12, Vol.47 (12), p.2310-2319

2000

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Impact of poly-gate depletion on MOS RF linearity

IEEE electron device letters, 2003-05, Vol.24 (5), p.330-332

2003

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Thermal Modeling and Device Noise Properties of Three-Dimensional-SOI Technology

IEEE transactions on electron devices, 2009-04, Vol.56 (4), p.656-664

2009

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A Built-in Technique for Measuring Substrate and Power-Supply Digital Switching Noise Using PMOS-Based Differential Sensors and a Waveform Sampler in System-on-Chip Applications

IEEE transactions on instrumentation and measurement, 2007-12, Vol.56 (6), p.2330-2337

2007

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Gate length dependent polysilicon depletion effects

IEEE electron device letters, 2002-04, Vol.23 (4), p.224-226

2002

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Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2183-2192

2002

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Physical origin of the excess thermal noise in short channel MOSFETs

IEEE electron device letters, 2001-02, Vol.22 (2), p.101-103

2001

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Electrothermal characteristics of strained-Si MOSFETs in high-current operation

IEEE transactions on electron devices, 2004-11, Vol.51 (11), p.1928-1931

2004

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Model dispersive media in finite-difference time-domain method with complex-conjugate pole-residue pairs

Impact of Scaling on Analog Performance and Associated Modeling Needs

Minimum achievable phase noise of RC oscillators

Impact of gate direct tunneling current on circuit performance: a simulation study

Electrostatic micromechanical actuator with extended range of travel

Linearity Analysis of Lateral Channel Doping in RF Power MOSFETs

A noise optimization technique for integrated low-noise amplifiers

High-frequency characterization of on-chip digital interconnects

Impact of lateral source/drain abruptness on device performance

Optimal doping profiles via geometric programming

Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

Synthesized Compact Models and Experimental Verifications for Substrate Noise Coupling in Mixed-Signal ICs

Analysis and design of distributed ESD protection circuits for high-speed mixed-signal and RF ICs

Investigation of compact models for RF noise in SiGe HBTs by hydrodynamic device simulation

An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

Design Methodology and Protection Strategy for ESD-CDM Robust Digital System Design in 90-nm and 130-nm Technologies

Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS

Density-gradient analysis of MOS tunneling

Impact of poly-gate depletion on MOS RF linearity

Thermal Modeling and Device Noise Properties of Three-Dimensional-SOI Technology

A Built-in Technique for Measuring Substrate and Power-Supply Digital Switching Noise Using PMOS-Based Differential Sensors and a Waveform Sampler in System-on-Chip Applications

Gate length dependent polysilicon depletion effects

Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

Physical origin of the excess thermal noise in short channel MOSFETs

Electrothermal characteristics of strained-Si MOSFETs in high-current operation

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