Sortiert nach
IEEE transactions on computer-aided design of integrated circuits and systems, 2024-03, Vol.43 (3), p.1-1
2024
- Link zum Volltext
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection
2020
- Link zum Volltext
Microelectronics and reliability, 2024-04, Vol.155, Article 115370
2024
Link zum Volltext
Microprocessors and microsystems, 2023-11, Vol.103, p.104968, Article 104968
2023
Link zum Volltext
Microelectronics and reliability, 2021-06, Vol.121, p.114133, Article 114133
2021
Link zum Volltext
Journal of cryptographic engineering, 2023-10
2023
Link zum Volltext
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, 2022, p.299-304
2022
- Link zum Volltext
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023, p.1-6
2023
- Link zum Volltext
Journal of cryptographic engineering, 2022, Vol.12 (3), p.245-254
2022
Link zum Volltext
Secure IT Systems, p.221-237
Link zum Volltext
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023, p.1-2
2023
- Link zum Volltext
Smart Card Research and Advanced Application, p.182-193
Link zum Volltext
2021 IEEE 30th Asian Test Symposium (ATS), 2021, p.91-96
2021
- Link zum Volltext
Computer Security. ESORICS 2023 International Workshops, p.644-664
Link zum Volltext
Constructive Side-Channel Analysis and Secure Design, p.42-61
Link zum Volltext
Smart Card Research and Advanced Applications, p.109-125
Link zum Volltext
Constructive Side-Channel Analysis and Secure Design, p.3-30
Link zum Volltext
Computer Safety, Reliability, and Security, p.259-272
Link zum Volltext
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013, p.89-98
2013
Link zum Volltext
ACM journal on emerging technologies in computing systems, 2016-12, Vol.13 (1), p.1-15
2016
Link zum Volltext
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013, p.110-115
2013
- Link zum Volltext
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014, p.1-6
2014
- Link zum Volltext
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023, p.1-7
2023
Link zum Volltext
2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.5B.5.1-5B.5.9
2013
- Link zum Volltext
2011 IEEE International Solid-State Circuits Conference, 2011, p.274-276
2011
- Link zum Volltext
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Erscheinungsjahr
n.n
n.n
Thema
- Science & Technology
- Technology
- Engineering Sciences
- Engineering
- Engineering, Electrical & Electronic
- Micro And Nanotechnologies
- Microelectronics
- Computer Science
- Circuit Faults
- Computer Science, Hardware & Architecture
- Semiconductor Lasers
- Computer Science, Theory & Methods
- Laser Fault Injection
- Laser Beams
- Laser Modes
- Lasers
- Transistors
- Transient Analysis
- Computer Science, Information Systems
- Integrated Circuits
Kollektion
Zeitschrift / Serie
- Microelectronics And Reliability
- Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
- Journal Of Cryptographic Engineering
- Acm Journal On Emerging Technologies In Computing Systems
- Ieee Transactions On Device And Materials Reliability
- Ieee Transactions On Nuclear Science
- Journal Of Hardware And Systems Security
- Microelectronics Reliability
- Microprocessors And Microsystems
Neu hinzugefügt