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1986
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Bundesarbeitsblatt, 1984-01 (1), p.9-11
1984
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Sensors and actuators. B, Chemical, 2014-04, Vol.194, p.220-228
2014
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Solid-state electronics, 2008-04, Vol.52 (4), p.519-525
2008
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Solid-state electronics, 2009-07, Vol.53 (7), p.746-752
2009
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Materials science & engineering. B, Solid-state materials for advanced technology, 2008-12, Vol.154, p.256-259
2008
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Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2008-11, Vol.26 (6), p.2583-2586
2008
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Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012046
2010
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Journal of applied physics, 2007-11, Vol.102 (10)
2007
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2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009, Vol.1173, p.290-293
2009
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Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2008-01, Vol.26 (1), p.342-346
2008
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2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC), 2013, p.65-68
2013
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Solid-state electronics, 2008, Vol.52 (4), p.519-525
2008
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2009 International Semiconductor Conference, 2009, Vol.1, p.259-262
2009
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Stacked Nanowires ΦFET with Independent Gates: A Novel Device for Ultra-dense Low-Power Applications
2007
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ESSDERC 2008 - 38th European Solid-State Device Research Conference, 2008, p.230-233
2008
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2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial, 2008, p.265-268
2008
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2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013, p.665-668
2013
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2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers, 2006, p.134-135
- Deleonibus, S.
- Mazure, C.
- Gaud, P.
- Grampeix, H.
- Colonna, J.P.
- Previtali, B.
- Dansas, H.
- Lafond, D.
- Jahan, C.
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- Denorme, S.
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- Tosti, L.
- Faynot, O.
- Rochette, F.
- Dupre, C.
- Andrieu, F.
2006
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2006 IEEE international SOI Conferencee Proceedings, 2006, p.77-78
2006
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Journal of applied physics, 2007-11, Vol.102 (10), p.104505-104505-8
2007
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2014 IEEE International Electron Devices Meeting, 2014, p.22.1.1-22.1.4
2014
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2008 IEEE International Electron Devices Meeting, 2008, p.1-4
2008
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2005 IEEE International SOI Conference Proceedings, 2005, p.223-225
2005
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- Solid-State Electronics
- Journal Of Applied Physics
- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
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- 16th International Conference On Microscopy Of Semiconducting Materials
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