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Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...Monthly notices of the Royal Astronomical Society, 2013-04, Vol.430 (4), p.2513-2533
- Holland, W. S.
- Bintley, D.
- Chapin, E. L.
- Chrysostomou, A.
- Davis, G. R.
- Dempsey, J. T.
- Duncan, W. D.
- Fich, M.
- Friberg, P.
- Halpern, M.
- Irwin, K. D.
- Jenness, T.
- Kelly, B. D.
- MacIntosh, M. J.
- Robson, E. I.
- Scott, D.
- Ade, P. A. R.
- Atad-Ettedgui, E.
- Berry, D. S.
- Craig, S. C.
- Gao, X.
- Gibb, A. G.
- Hilton, G. C.
- Hollister, M. I.
- Kycia, J. B.
- Lunney, D. W.
- McGregor, H.
- Montgomery, D.
- Parkes, W.
- Tilanus, R. P. J.
- Ullom, J. N.
- Walther, C. A.
- Walton, A. J.
- Woodcraft, A. L.
- Amiri, M.
- Atkinson, D.
- Burger, B.
- Chuter, T.
- Coulson, I. M.
- Doriese, W. B.
- Dunare, C.
- Economou, F.
- Niemack, M. D.
- Parsons, H. A. L.
- Reintsema, C. D.
- Sibthorpe, B.
- Smail, I.
- Sudiwala, R.
- Thomas, H. S.
2013
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Journal of applied physics, 2022-11, Vol.132 (20)
2022
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Journal of micromechanics and microengineering, 2017-01, Vol.27 (1), p.15020
2017
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IEEE transactions on semiconductor manufacturing, 2020-05, Vol.33 (2), p.224-231
2020
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Microelectronic engineering, 2008-05, Vol.85 (5-6), p.1059-1061
2008
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Journal of micromechanics and microengineering, 2007-07, Vol.17 (7), p.1334-1342
2007
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Measurement science & technology, 2006-06, Vol.17 (6), p.1337-1342
2006
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-03, Vol.520 (1-3), p.479-482
- Audley, M.D
- Holland, W.S
- Duncan, W.D
- Atkinson, D
- Cliffe, M
- Ellis, M
- Gao, X
- Gostick, D.C
- Hodson, T
- Kelly, D
- MacIntosh, M.J
- McGregor, H
- Peacocke, T
- Robson, I
- Smith, I
- Irwin, K.D
- Hilton, G.C
- Ullom, J.N
- Walton, A
- Dunare, C
- Parkes, W
- Ade, P.A.R
- Bintley, D
- Gannaway, F
- Griffin, M
- Pisano, G
- Sudiwala, R.V
- Walker, I
- Woodcraft, A
- Fich, M
- Halpern, M
- Mitchell, G
- Naylor, D
- Bastien, P
2004
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Journal of physics. Conference series, 2009-09, Vol.186 (1), p.012067
2009
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IEEE transactions on semiconductor manufacturing, 2008-05, Vol.21 (2), p.140-147
2008
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CAS 2010 Proceedings (International Semiconductor Conference), 2010, Vol.1, p.155-158
2010
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2006-04, Vol.559 (2), p.513-515
- Hilton, G.C.
- Beall, J.A.
- Doriese, W.B.
- Duncan, W.D.
- Ferreira, L.S.
- Irwin, K.D.
- Reintsema, C.D.
- Ullom, J.N.
- Vale, L.R.
- Xu, Y.
- Zink, B.L.
- Parkes, W.
- Bunting, A.S.
- Dunare, C.C.
- Gundlach, A.M.
- Stevenson, J.T.M.
- Walton, A.J.
- Schulte, E.
- Corrales, E.
- Sienicki, J.P.
- Bintley, Dan
- Ade, P.A.R.
- Sudiwala, Rashmi V.
- Woodcraft, Adam L.
- Halpern, Mark
- Holland, W.
- Audley, M.D.
- MacIntosh, M.
2006
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Review of scientific instruments, 2007-02, Vol.78 (2), p.024502-024502-7
- Woodcraft, Adam L.
- Ade, Peter A. R.
- Bintley, Dan
- House, Julian S.
- Hunt, Cynthia L.
- Sudiwala, Rashmi V.
- Doriese, William B.
- Duncan, William D.
- Hilton, Gene C.
- Irwin, Kent D.
- Reintsema, Carl D.
- Ullom, Joel N.
- Audley, Michael D.
- Ellis, Maureen A.
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- MacIntosh, Mike
- Dunare, Camelia C.
- Parkes, William
- Walton, Anthony J.
- Kycia, Jan B.
- Halpern, Mark
- Schulte, Eric
2007
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2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), 2019, p.58-63
2019
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Journal of physics. Conference series, 2005-01, Vol.15 (1), p.226-231
2005
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2017 International Conference of Microelectronic Test Structures (ICMTS), 2017, p.1-6
2017
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2018 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2018, p.179-184
2018
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-03, Vol.520 (1-3), p.427-430
- Duncan, W
- Audley, D
- Holland, W
- Atkinson, D
- Baillie, T
- Cliffe, M
- Ellis, M
- Gao, X
- Gostick, D
- Hodson, T
- Kelly, D
- MacIntosh, M
- McGregor, H
- Peacocke, T
- Smith, I
- Robson, I
- Walton, A
- Parkes, W
- Dunare, C
- Smith, S
- Terry, J
- Stevenson, T
- Gundlach, A
- Ruthven, A
- Ade, P
- Tucker, C
- Gannaway, F
- Walker, I
- Sudiwala, R
- Woodcraft, A
- Griffin, M
- Bintley, D
- Schulte, E
- Fich, M
- Kycia, J
- Halpern, M
- Molnar, J
- Burger, B
- Naylor, D
- Bastien, P
- Mitchell, G
- Irwin, K
- Hilton, G
- Ullom, J
- Reintsema, C
- Vale, L
- Ferreira, L
- Doriese, W
2004
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2017 International Conference of Microelectronic Test Structures (ICMTS), 2017, p.1-5
2017
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Proceedings of the Institution of Mechanical Engineers. Part N, Journal of nanoengineering and nanosystems, 2005-03, Vol.219 (1), p.11-21
2005
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2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013, p.37-42
2013
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2008 IEEE International Conference on Microelectronic Test Structures, 2008, p.123-127
2008
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-03, Vol.520 (1-3), p.483-486
2004
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2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748), 2004, Vol.2, p.307-310 vol.2
2004
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1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351), 1998, Vol.2, p.337-340 vol.2
1998
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