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High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope

Applied physics letters, 1997-09, Vol.71 (13), p.1872-1874

1997

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Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips

Applied physics letters, 2000-02, Vol.76 (6), p.769-771

2000

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Quantitative microwave evanescent microscopy

Applied physics letters, 1999-11, Vol.75 (19), p.3005-3007

1999

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X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source

Zeitschrift für Kristallographie. Crystalline materials, 2007-11, Vol.222 (11), p.650-655

2007

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Tip–sample distance feedback control in a scanning evanescent microwave microscope

Applied physics letters, 1999-05, Vol.74 (18), p.2696-2698

1999

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Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes

Applied Optics, 2008-05, Vol.47 (13), p.2376

2008

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Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

Applied physics letters, 1998-08, Vol.73 (8), p.1146-1148

1998

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Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films

Applied physics letters, 1997-10, Vol.71 (14), p.2026-2028

1997

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Mammographic quantitative image analysis and biologic image composition for breast lesion characterization and classification

Medical physics (Lancaster), 2014-03, Vol.41 (3), p.031915-n/a

2014

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Optimizing X-Ray Inspection for Advanced Packaging Applications

International Symposium on Microelectronics, 2020-10, Vol.2020 (1), p.165-168

2020

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Room-temperature electronic phase transitions in the continuous phase diagrams of perovskite manganites

Nature (London), 2000-08, Vol.406 (6797), p.704-708

2000

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Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

Science (American Association for the Advancement of Science), 1997-06, Vol.276 (5321), p.2004-2006

1997

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Optimizing X-Ray Inspection for Advanaced Packaging Applications

2020 International Wafer Level Packaging Conference (IWLPC), 2020, p.1-6

2020

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A Calibration Approach for Single-Energy X-ray Absorptiometry Method to Provide Absolute Breast Tissue Composition Accuracy for the Long Term

Breast Imaging, p.769-774

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Compositional Three-Component Breast Imaging of Fibroadenoma and Invasive Cancer Lesions: Pilot Study

Breast Imaging, p.109-114

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Continuous mapping of structure–property relations in Fe1−xNix metallic alloys fabricated by combinatorial synthesis

Intermetallics, 2001-07, Vol.9 (7), p.541-545

2001

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Erratum: “Quantitative microwave evanescent microscopy” [Appl. Phys. Lett. 75 , 3005 (1999)]

Applied physics letters, 2000-01, Vol.76 (5), p.656-656

2000

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Quantitative microwave evanescent microscopy

Applied physics letters, 1999-05, Vol.75 (19)

1999

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Tip–sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging

Review of scientific instruments, 2000-06, Vol.71 (6), p.2414-2417

2000

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3-D X-ray Microscopy using a Laboratory Source

Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1036-1037

2004

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Improvements and Performance of Diagnostic Compositional Imaging Using a Novel Dual-Energy X-ray Technique

Breast Imaging, p.569-574

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Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba{sub 1-x}Sr{sub x}TiO{sub 3} materials chips

Applied physics letters, 2000-02, Vol.76 (6)

2000

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Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba(1-x)Sr(x)TiO(3) materials chips

Applied physics letters, 1999-12, Vol.76 (6)

1999

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Continuous mapping of structure–property relations in Fe 1− xNi x metallic alloys fabricated by combinatorial synthesis

Intermetallics, 2001, Vol.9 (7), p.541-545

2001

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Strong correlation between high-temperature electronic and low-temperature magnetic ordering in La{sub 1{minus}x}Ca{sub x}MnO{sub 3} continuous phase diagram

Physical review. B, Condensed matter, 2001-06, Vol.63 (22)

2001

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Breast Cancer
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High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope

Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips

Quantitative microwave evanescent microscopy

X-ray computed tomography in Zernike phase contrast mode at 8 keV with 50-nm resolution using Cu rotating anode X-ray source

Tip–sample distance feedback control in a scanning evanescent microwave microscope

Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes

Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains

Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films

Mammographic quantitative image analysis and biologic image composition for breast lesion characterization and classification

Optimizing X-Ray Inspection for Advanced Packaging Applications

Room-temperature electronic phase transitions in the continuous phase diagrams of perovskite manganites

Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

Optimizing X-Ray Inspection for Advanaced Packaging Applications

A Calibration Approach for Single-Energy X-ray Absorptiometry Method to Provide Absolute Breast Tissue Composition Accuracy for the Long Term

Compositional Three-Component Breast Imaging of Fibroadenoma and Invasive Cancer Lesions: Pilot Study

Continuous mapping of structure–property relations in Fe1−xNix metallic alloys fabricated by combinatorial synthesis

Erratum: “Quantitative microwave evanescent microscopy” [Appl. Phys. Lett. 75 , 3005 (1999)]

Quantitative microwave evanescent microscopy

Tip–sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging

3-D X-ray Microscopy using a Laboratory Source

Improvements and Performance of Diagnostic Compositional Imaging Using a Novel Dual-Energy X-ray Technique

Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba{sub 1-x}Sr{sub x}TiO{sub 3} materials chips

Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba(1-x)Sr(x)TiO(3) materials chips

Continuous mapping of structure–property relations in Fe 1− xNi x metallic alloys fabricated by combinatorial synthesis

Strong correlation between high-temperature electronic and low-temperature magnetic ordering in La{sub 1{minus}x}Ca{sub x}MnO{sub 3} continuous phase diagram

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